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Author
Title
Year
Publication
Volume
Times cited
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Bichlmeier, S.
;
Janssens, K.
;
Heckel, J.
;
Hoffmann, P.
;
Ortner, H.M.
Comparative material characterization of historical and industrial samples by using a compact micro-XRF spectrometer
2002
X-ray spectrometry
31
12
UA library record
;
WoS full record
;
WoS citing articles
Bichlmeier, S.
;
Janssens, K.
;
Heckel, J.
;
Gibson, D.
;
Hoffmann, P.
;
Ortner, H.M.
Component selection for a compact micro-XRF spectrometer
2001
X-ray spectrometry
30
33
UA library record
;
WoS full record
;
WoS citing articles