Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Yan, L.; Niu, H.J.; Duong, G.V.; Suchomel, M.R.; Bacsa, J.; Chalker, P.R.; Hadermann, J.; Van Tendeloo, G.; Rosseinsky, M.J. |
Cation ordering within the perovskite block of a six-layer Ruddlesden-Popper oxide from layer-by-layer growth artificial interfaces in complex unit cells |
2011 |
Chemical science |
2 |
16 |
UA library record; WoS full record; WoS citing articles |
Robin, I.-C.; Aichele, T.; Bougerol, C.; André, R.; Tatarenko, S.; Bellet-Amalric, E.; van Daele, B.; Van Tendeloo, G. |
CdSe quantum dot formation: alternative paths to relaxation of a strained CdSe layer and influence of the capping conditions |
2007 |
Nanotechnology |
18 |
8 |
UA library record; WoS full record; WoS citing articles |
Aichele, T.; Robin, I.-C.; Bougerol, C.; André, R.; Tatarenko, S.; Van Tendeloo, G. |
CdSe quantum dot formation induced by amorphous Se |
2007 |
Surface science : a journal devoted to the physics and chemistry of interfaces
T2 – International Conference on NANO-Structures Self Assembling, JUL 02-06, 2006, Aix en Provence, FRANCE |
601 |
|
UA library record; WoS full record |
Neyts, E.C.; van Duin, A.C.T.; Bogaerts, A. |
Changing chirality during single-walled carbon nanotube growth : a reactive molecular dynamics/Monte Carlo study |
2011 |
Journal of the American Chemical Society |
133 |
116 |
UA library record; WoS full record; WoS citing articles |
Blank, D.H.A.; Rijnders, A.J.H.M.; Verhoeven, M.A.J.; Bergs, R.M.H.; Rogalla, H.; Verbist, K.; Lebedev, O.; Van Tendeloo, G. |
Characterisation of multilayer ramp-type REBa2Cu3O7-\delta structures by scanning probe microscopy and high-resolution electron microscopy |
1997 |
Journal of alloys and compounds
T2 – Symposium on High Temperature Superconductor Thin Films, Growth, Mechanisms, Interfaces, Multilayers, at the 1996 Spring Meeting of the European-Materials-Society, June 04-07, 1996, Strasbourg, France |
251 |
|
UA library record; WoS full record |
Stuer, C.; Steegen, A.; van Landuyt, J.; Bender, H.; Maex, K. |
Characterisation of the local stress induced by shallow trench isolation and CoSi2 silicidation |
2001 |
Institute of physics conference series |
|
|
UA library record; WoS full record; |
Bultinck, E.; Bogaerts, A. |
Characterization of an Ar/O2 magnetron plasma by a multi-species Monte Carlo model |
2011 |
Plasma sources science and technology |
20 |
7 |
UA library record; WoS full record; WoS citing articles |
Oleshko, V.; Gijbels, R.; Jacob, W.; Alfimov, M. |
Characterization of complex silver halide photographic systems by means of analytical electron microscopy |
1995 |
Microbeam analysis |
4 |
9 |
UA library record; WoS full record; WoS citing articles |
Oleshko, V.; Gijbels, R.; Jacob, W.; Alfimov, M. |
Characterization of complex silver halide photographic systems by means of analytical electron microscopy |
1994 |
Microbeam analysis |
3 |
|
UA library record |
Goessens, C.; Schryvers, D.; van Landuyt, J.; Amelinckx, S.; Verbeeck, A.; de Keyzer, R. |
Characterization of crystal defects in mixed tabular silver halide grains by conventional transmission electron microscopy and X-ray diffractometry |
1991 |
Journal of crystal growth |
110 |
40 |
UA library record; WoS full record; WoS citing articles |
Oleshko, V.; Gijbels, R.; Jacob, W.; Lakiere, F.; van Daele, A.; Silaev, E.; Kaplun, L. |
Characterization of double structure tabular microcrystals of silver halide emulsions by means of electron energy-loss spectroscopy, zero-loss electron spectroscopic imaging and energy dispersive X-ray microanalysis |
1995 |
Microscopy, microanalysis, microstructures |
6 |
7 |
UA library record; WoS full record; WoS citing articles |
Volkov, V.V.; van Landuyt, J.; Marushkin, K.M.; Gijbels, R.; Férauge, C.; Vasilyev, M.G.; Shelyakin, A.A.; Sokolovsky, A.A. |
Characterization of LPE grown InGaAsP/InP heterostructures: IR-LED at 1.66 μm used for the remote monitoring of methane gas |
1997 |
Journal of crystal growth |
173 |
4 |
UA library record; WoS full record; WoS citing articles |
Tirumalasetty, G.K.; van Huis, M.A.; Fang, C.M.; Xu, Q.; Tichelaar, F.D.; Hanlon, D.N.; Sietsma, J.; Zandbergen, H.W. |
Characterization of NbC and (Nb, Ti)N nanoprecipitates in TRIP assisted multiphase steels |
2011 |
Acta materialia |
59 |
58 |
UA library record; WoS full record; WoS citing articles |
Verleysen, E.; Bender, H.; Richard, O.; Schryvers, D.; Vandervorst, W. |
Characterization of nickel silicides using EELS-based methods |
2010 |
Journal of microscopy |
240 |
11 |
UA library record; WoS full record; WoS citing articles |
van Cleempoel, A.; Gijbels, R.; Claeys, M.; van den Heuvel, H. |
Characterization of ozonated C60 and C70 by high performance liquid chromatography and low- and high-energy collision-induced dissociation tandem mass spectrometry |
1996 |
Rapid communications in mass spectrometry |
10 |
10 |
UA library record; WoS full record; WoS citing articles |
Colomer, J.-F.; Benoit, J.-M.; Stephan, C.; Lefrant, S.; Van Tendeloo, G.; Nagy, J.B. |
Characterization of single-wall carbon nanotubes produced by CCVD method |
2001 |
Chemical physics letters |
345 |
45 |
UA library record; WoS full record; WoS citing articles |
de Vyt, A.; Gijbels, R.; Davock, H.; van Roost, C.; Geuens, I. |
Characterization of AgxAuy nano particles by TEM and STEM |
1999 |
Journal of analytical atomic spectrometry |
14 |
2 |
UA library record; WoS full record; WoS citing articles |
Hervieu, M.; Martin, C.; Maignan, A.; Van Tendeloo, G.; Raveau, B. |
Charge ordering-disordering in Th-doped CaMnO3 |
1999 |
European physical journal : B : condensed matter and complex systems |
10 |
6 |
UA library record; WoS full record; WoS citing articles |
Nikolaev, A.V.; Prassides, K.; Michel, K.H. |
Charge transfer and polymer phases in AC60 (A=K, Rb, Cs) fullerides |
1998 |
The journal of chemical physics |
108 |
14 |
UA library record; WoS full record; WoS citing articles |
Riva, C.; Escorcia, R.A.; Govorov, A.O.; Peeters, F.M. |
Charged donors in quantum dots: finite difference and fractional dimensions results |
2004 |
Physical review : B : condensed matter and materials physics |
69 |
23 |
UA library record; WoS full record; WoS citing articles |
Hens, S.; van Landuyt, J.; Bender, H.; Boullart, W.; Vanhaelemeersch, S. |
Chemical and structural analysis of etching residue layers in semiconductor devices with energy filtering transmission electron microscopy |
2001 |
Materials science in semiconductor processing |
4 |
|
UA library record; WoS full record |
de Gryse, O.; Clauws, P.; Lebedev, O.; van Landuyt, J.; Vanhellemont, J.; Claeys, C.; Simoen, E. |
Chemical and structural characterization of oxygen precipitates in silicon by infrared spectroscopy and TEM |
2001 |
Physica: B : condensed matter
T2 – 21st International Conference on Defects in Semiconductors, JUL 16-20, 2001, GIESSEN, GERMANY |
308 |
3 |
UA library record; WoS full record; WoS citing articles |
Struyf, H.; van Vaeck, L.; Kennis, P.; Gijbels, R.; van Grieken, R. |
Chemical characterization of neo-ceramic powders by time-of-flight and Fourier transform laser microprobe mass spectrometry |
1996 |
Rapid communications in mass spectrometry |
10 |
11 |
UA library record; WoS full record; WoS citing articles |
Verlinden, G.; Gijbels, R.; Geuens, I. |
Chemical microcharacterization of ultrathin iodide conversion layers and adsorbed thiocyanate surface layers on silver halide microcrystals with time-of-flight SIMS |
2002 |
Microscopy and microanalysis |
8 |
1 |
UA library record; WoS full record; WoS citing articles |
Obradors, X.; Puig, T.; Pomar, A.; Sandiumenge, F.; Piñol, S.; Mestres, N.; Castaño, O.; Coll, M.; Cavallaro, A.; Palau, A.; Gázquez, J.; González, J.C.; Gutiérrez, J.; Romá, N.; Ricart, S.; Moretó, J.M.; Rossell, M.D.; Van Tendeloo, G. |
Chemical solution deposition: a path towards low cost coated conductors |
2004 |
Superconductor science and technology |
17 |
107 |
UA library record; WoS full record; WoS citing articles |
Vernochet, C.; Vannier, R.-N.; Huvé, M.; Pirovano, C.; Nowogrocki, G.; Mairesse, G.; Van Tendeloo, G. |
Chemical, structural and electrical characterizations in the BIZNVOX family |
2000 |
Journal of materials chemistry |
10 |
13 |
UA library record; WoS full record; WoS citing articles |
Abakumov, A.M.; Hadermann, J.; Van Tendeloo, G.; Antipov, E.V. |
Chemistry and structure of anion-deficient perovskites with translational interfaces |
2008 |
Journal of the American Ceramic Society |
91 |
39 |
UA library record; WoS full record; WoS citing articles |
Li, Y.; Yang, X.-Y.; Tian, G.; Vantomme, A.; Yu, J.; Van Tendeloo, G.; Su, B.-L. |
Chemistry of trimethyl aluminum: a spontaneous route to thermally stable 3D crystalline macroporous alumina foams with a hierarchy of pore sizes |
2010 |
Chemistry of materials |
22 |
38 |
UA library record; WoS full record; WoS citing articles |
Bernaerts, D.; op de Beeck, M.; Amelinckx, S.; van Landuyt, J.; Van Tendeloo, G. |
The chirality of carbon nanotubules determined by dark-field electron microscopy |
1996 |
Philosophical magazine: A: physics of condensed matter: defects and mechanical properties |
74 |
20 |
UA library record; WoS full record; WoS citing articles |
Liu, Y.; Brelet, Y.; He, Z.; Yu, L.; Mitryukovskiy, S.; Houard, A.; Forestier, B.; Couairon, A.; Mysyrowicz, A. |
Ciliary white light : optical aspect of ultrashort laser ablation on transparent dielectrics |
2013 |
Physical review letters |
110 |
10 |
UA library record; WoS full record; WoS citing articles |