Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Ye, M.; Schroeder, J.; Mehbod, M.; Deltour, R.; Naessens, G.; Duvigneaud, P.H.; Verbist, K.; Van Tendeloo, G. |
Structural properties of Zn-substituted epitaxial YBa2Cu3O7-\delta thin films |
1996 |
Superconductor science and technology |
9 |
7 |
UA library record; WoS full record; WoS citing articles |
Margueritat, J.; Gonzalo, J.; Afonso, C.N.; Hörmann, U.; Van Tendeloo, G.; Mlayah, A.; Murray, D.B.; Saviot, L.; Zhou, Y.; Hong, M.H.; Luk'yanchuk, B.S. |
Surface enhanced Raman scattering of silver sensitized cobalt nanoparticles in metaldielectric nanocomposites |
2008 |
Nanotechnology |
19 |
11 |
UA library record; WoS full record; WoS citing articles |
Mordvinova, N.; Emelin, P.; Vinokurov, A.; Dorofeev, S.; Abakumov, A.; Kuznetsova, T. |
Surface processes during purification of InP quantum dots |
2014 |
Beilstein journal of nanotechnology |
5 |
5 |
UA library record; WoS full record; WoS citing articles |
Malesevic, A.; Vitchev, R.; Schouteden, K.; Volodin, A.; Zhang, L.; Van Tendeloo, G.; Vanhulsel, A.; van Haesendonck, C. |
Synthesis of few-layer graphene via microwave plasma-enhanced chemical vapour deposition |
2008 |
Nanotechnology |
19 |
309 |
UA library record; WoS full record; WoS citing articles |
Schryvers, D.; Yandouzi, M.; Toth, L. |
TEM study of B2 + L12 decomposition in a nanoscale Ni-rich Ni-Al film |
1998 |
Thin solid films : an international journal on the science and technology of thin and thick films |
326 |
1 |
UA library record; WoS full record; WoS citing articles |
van Renterghem, W.; Schryvers, D.; van Landuyt, J.; Bollen, D.; van Roost, C.; de Keyzer, R. |
A TEM study of non-parallel twins inducing thickness growth in silver chloride {111} tabular crystals |
2001 |
The journal of imaging science and technology |
45 |
|
UA library record; WoS full record; WoS citing articles |
Tafuri, F.; Carillo, F.; Lombardi, F.; Granozio, F.M.; dii Uccio, U.S.; Testa, G.; Sarnelli, E.; Verbist, K.; Van Tendeloo, G. |
YBa2Cu3O7-x Josephson junctions and dc SQUIDs based on 45\text{\textdegree} a-axis tilt and twist grain boundaries : atomically clean interfaces for applications |
1999 |
Superconductor science and technology
T2 – International Superconductive Electronics Conference, JUN 21-25, 1999, BERKELEY, CALIFORNIA |
12 |
3 |
UA library record; WoS full record; WoS citing articles |
Amelinckx, S.; Van Tendeloo, G.; van Landuyt, J. |
The study of high Tc-superconducting materials by electron microscopy and electron diffraction |
1991 |
Superconductor science and technology
T2 – SATELLITE CONF TO THE 19TH INTERNATIONAL CONF ON LOW TEMPERATURE PHYSICS : HIGH TEMPERATURE SUPERCONDUCTIVITY, AUG 13-15, 1990, QUEENS COLL, CAMBRIDGE, ENGLAND |
4 |
2 |
UA library record; WoS full record; WoS citing articles |
Bittencourt, C.; Krüger, P.; Lagos, M.J.; Ke, X.; Van Tendeloo, G.; Ewels, C.; Umek, P.; Guttmann, P. |
Towards atomic resolution in sodium titanate nanotubes using near-edge X-ray-absorption fine-structure spectromicroscopy combined with multichannel multiple-scattering calculations |
2012 |
Beilstein journal of nanotechnology |
3 |
13 |
UA library record; WoS full record; WoS citing articles |
Badalyan, S.M.; Peeters, F.M. |
Transport of magnetic edge states in a quantum wire exposed to a non-homogeneous magnetic field |
2001 |
Nanotechnology |
12 |
5 |
UA library record; WoS full record; WoS citing articles |
Talgorn, E.; Gao, Y.; Aerts, M.; Kunneman, L.T.; Schins, J.M.; Savenije, T.J.; van Huis, M.A.; van der Zant, H.S.J.; Houtepen, A.J.; Siebbeles, L.D.A. |
Unity quantum yield of photogenerated charges and band-like transport in quantum-dot solids |
2011 |
Nature nanotechnology |
6 |
129 |
UA library record; WoS full record; WoS citing articles |
Charlier, E.; van Doorselaer, M.; Gijbels, R.; de Keyzer, R.; Geuens, I. |
Unveiling the composition of sulphur sensitization specks by their interactions with TAI |
2000 |
Journal Of Imaging Science And Technology |
44 |
16 |
UA library record; WoS full record; WoS citing articles |
Abakumov, M.A.; Nukolova, N.V.; Sokolsky-Papkov, M.; Shein, S.A.; Sandalova, T.O.; Vishwasrao, H.M.; Grinenko, N.F.; Gubsky, I.L.; Abakumov, A.M.; Kabanov, A.V.; Chekhonin, V.P.; |
VEGF-targeted magnetic nanoparticles for MRI visualization of brain tumor |
2015 |
Nanomedicine: nanotechnology, biology and medicine |
11 |
62 |
UA library record; WoS full record; WoS citing articles |
Xu, W.; Peeters, F.M.; Devreese, J.T. |
Warm-electron transport in a two-dimensional semiconductor |
1992 |
Semiconductor science and technology |
7 |
3 |
UA library record; WoS full record; WoS citing articles |
Bittencourt, C.; Hitchock, A.P.; Ke, X.; Van Tendeloo, G.; Ewels, C.P.; Guttmann, P. |
X-ray absorption spectroscopy by full-field X-ray microscopy of a thin graphite flake: Imaging and electronic structure via the carbon K-edge |
2012 |
Beilstein journal of nanotechnology |
3 |
15 |
UA library record; WoS full record; WoS citing articles |
Conard, T.; de Witte, H.; Loo, R.; Verheyen, P.; Vandervorst, W.; Caymax, M.; Gijbels, R. |
XPS and TOFSIMS studies of shallow Si/Si1-xGex/Si layers |
1999 |
Thin solid films : an international journal on the science and technology of thin and thick films |
343/344 |
1 |
UA library record; WoS full record; WoS citing articles |
Forsh, E.A.; Abakumov, A.M.; Zaytsev, V.B.; Konstantinova, E.A.; Forsh, P.A.; Rumyantseva, M.N.; Gaskov, A.M.; Kashkarov, P.K. |
Optical and photoelectrical properties of nanocrystalline indium oxide with small grains |
2015 |
Thin solid films : an international journal on the science and technology of thin and thick films |
595 |
18 |
UA library record; WoS full record; WoS citing articles |
Van Havenbergh, K.; Turner, S.; Marx, N.; Van Tendeloo, G. |
The mechanical behavior during (de)lithiation of coated silicon nanoparticles as anode material for lithium-ion batteries studied by InSitu transmission electron microscopy |
2016 |
Energy technology |
4 |
6 |
UA library record; WoS full record; WoS citing articles |
Heyne, M.H.; de Marneffe, J.-F.; Delabie, A.; Caymax, M.; Neyts, E.C.; Radu, I.; Huyghebaert, C.; De Gendt, S. |
Two-dimensional WS2 nanoribbon deposition by conversion of pre-patterned amorphous silicon |
2017 |
Nanotechnology |
28 |
13 |
UA library record; WoS full record; WoS citing articles |
Van Aert, S.; den Dekker, A.J.; van den Bos, A.; Van Dyck, D. |
High resolution electron microscopy from imaging towards measuring |
2001 |
... IEEE International Instrumentation and Measurement Technology Conference
T2 – Rediscovering measurement in the age of informatics : proceedings of the 18th IEEE Instrumentation and Measurement Technology Conference (IMTC), 2001: vol 3 |
|
|
UA library record |
Bergwerf, I.; de Vocht, N.; Tambuyzer, B.; Verschueren, J.; Reekmans, K.; Daans, J.; Ibrahimi, A.; Van Tendeloo, V.; Chatterjee, S.; Goossens, H.; Jorens, P.G.; Baekelandt, V.; Ysebaert, D.; Van Marck, E.; Berneman, Z.N.; Van Der Linden, A.; Ponsaerts, P. |
Reporter gene-expressing bone marrow-derived stromal cells are immune-tolerated following implantation in the central nervous system of syngeneic immunocompetent mice |
2009 |
BMC biotechnology |
|
33 |
UA library record; WoS full record; WoS citing articles |
Woo, S.Y.; Gauquelin, N.; Nguyen, H.P.T.; Mi, Z.; Botton, G.A. |
Interplay of strain and indium incorporation in InGaN/GaN dot-in-a-wire nanostructures by scanning transmission electron microscopy |
2015 |
Nanotechnology |
26 |
19 |
UA library record; WoS full record; WoS citing articles |
Denneulin, T.; Rouvière, J.L.; Béché, A.; Py, M.; Barnes, J.P.; Rochat, N.; Hartmann, J.M.; Cooper, D. |
The reduction of the substitutional C content in annealed Si/SiGeC superlattices studied by dark-field electron holography |
2011 |
Semiconductor science and technology |
26 |
|
UA library record; WoS full record; WoS citing articles |
Loo, R.; Arimura, H.; Cott, D.; Witters, L.; Pourtois, G.; Schulze, A.; Douhard, B.; Vanherle, W.; Eneman, G.; Richard, O.; Favia, P.; Mitard, J.; Mocuta, D.; Langer, R.; Collaert, N. |
Epitaxial CVD Growth of Ultra-Thin Si Passivation Layers on Strained Ge Fin Structures |
2018 |
ECS journal of solid state science and technology |
7 |
5 |
UA library record; WoS full record; WoS citing articles |
Heyne, M.H.; de Marneffe, J.-F.; Radu, I.; Neyts, E.C.; De Gendt, S. |
Thermal recrystallization of short-range ordered WS2 films |
2018 |
Journal of vacuum science and technology: A: vacuum surfaces and films |
36 |
2 |
UA library record; WoS full record; WoS citing articles |
Dhayalan, S.K.; Kujala, J.; Slotte, J.; Pourtois, G.; Simoen, E.; Rosseel, E.; Hikavyy, A.; Shimura, Y.; Loo, R.; Vandervorst, W. |
On the evolution of strain and electrical properties in as-grown and annealed Si:P epitaxial films for source-drain stressor applications |
2018 |
ECS journal of solid state science and technology |
7 |
4 |
UA library record; WoS full record; WoS citing articles |
Wang, L.; Wen, D.-Q.; Zhang, Q.-Z.; Song, Y.-H.; Zhang, Y.-R.; Wang, Y.-N. |
Disruption of self-organized striated structure induced by secondary electron emission in capacitive oxygen discharges |
2019 |
Plasma sources science and technology |
28 |
2 |
UA library record; WoS full record; WoS citing articles |
Dhayalan, S.K.; Nuytten, T.; Pourtois, G.; Simoen, E.; Pezzoli, F.; Cinquanta, E.; Bonera, E.; Loo, R.; Rosseel, E.; Hikavyy, A.; Shimura, Y.; Vandervorst, W. |
Insights into the C Distribution in Si:C/Si:C:P and the Annealing Behavior of Si:C Layers |
2019 |
ECS journal of solid state science and technology |
8 |
|
UA library record; WoS full record |
Terzano, R.; Spagnuolo, M.; Vekemans, B.; de Nolf, W.; Janssens, K.; Falkenberg, G.; Ruggiero, P. |
Assessing the origin and fate of CR, Ni, Cu, Zn, Ph, and V in industrial polluted soil by combined microspectroscopic techniques and bulk extraction methods |
2007 |
Environmental science & technology |
41 |
61 |
UA library record; WoS full record; WoS citing articles |
Denecke, M.A.; Janssens, K.; Proost, K.; Rothe, J.; Noseck, U. |
Confocal micrometer-scale X-ray fluorescence and X-ray absorption fine structure studies of uranium speciation in a tertiary sediment from a waste disposal natural analogue site |
2005 |
Environmental science and technology |
39 |
47 |
UA library record; WoS full record; WoS citing articles |