Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Bals, S.; Van Aert, S.; Van Tendeloo, G. |
High resolution electron tomography |
2013 |
Current opinion in solid state and materials science |
17 |
24 |
UA library record; WoS full record; WoS citing articles |
Van Aert, S.; de Backer, A.; Martinez, G.T.; Goris, B.; Bals, S.; Van Tendeloo, G.; Rosenauer, A. |
Procedure to count atoms with trustworthy single-atom sensitivity |
2013 |
Physical review : B : condensed matter and materials physics |
87 |
106 |
UA library record; WoS full record; WoS citing articles |
Goris, B.; de Backer, A.; Van Aert, S.; Gómez-Graña, S.; Liz-Marzán, L.M.; Van Tendeloo, G.; Bals, S. |
Three-dimensional elemental mapping at the atomic scale in bimetallic nanocrystals |
2013 |
Nano letters |
13 |
90 |
UA library record; WoS full record; WoS citing articles |
Akamine, H.; Van den Bos, K.H.W.; Gauquelin, N.; Farjami, S.; Van Aert, S.; Schryvers, D.; Nishida, M. |
Determination of the atomic width of an APB in ordered CoPt using quantified HAADF-STEM |
2015 |
Journal of alloys and compounds |
644 |
12 |
UA library record; WoS full record; WoS citing articles |
Martinez, G.T.; de Backer, A.; Rosenauer, A.; Verbeeck, J.; Van Aert, S. |
The effect of probe inaccuracies on the quantitative model-based analysis of high angle annular dark field scanning transmission electron microscopy images |
2014 |
Micron |
63 |
25 |
UA library record; WoS full record; WoS citing articles |
Gonnissen, J.; de Backer, A.; den Dekker, A.J.; Martinez, G.T.; Rosenauer, A.; Sijbers, J.; Van Aert, S. |
Optimal experimental design for the detection of light atoms from high-resolution scanning transmission electron microscopy images |
2014 |
Applied physics letters |
105 |
12 |
UA library record; WoS full record; WoS citing articles |
van den Broek, W.; Rosenauer, A.; Goris, B.; Martinez, G.T.; Bals, S.; Van Aert, S.; van Dyck, D. |
Correction of non-linear thickness effects in HAADF STEM electron tomography |
2012 |
Ultramicroscopy |
116 |
67 |
UA library record; WoS full record; WoS citing articles |
Van Aert, S.; Turner, S.; Delville, R.; Schryvers, D.; Van Tendeloo, G.; Salje, E.K.H. |
Direct observation of ferrielectricity at ferroelastic domain boundaries in CaTiO3 by electron microscopy |
2012 |
Advanced materials |
24 |
150 |
UA library record; WoS full record; WoS citing articles |
Wang, A.; Chen, F.R.; Van Aert, S.; van Dyck, D. |
Direct structure inversion from exit waves: part 1: theory and simulations |
2010 |
Ultramicroscopy |
110 |
25 |
UA library record; WoS full record; WoS citing articles |
Wang, A.; Chen, F.R.; Van Aert, S.; van Dyck, D. |
Direct structure inversion from exit waves : part 2 : a practical example |
2012 |
Ultramicroscopy |
116 |
8 |
UA library record; WoS full record; WoS citing articles |
Huijben, M.; Rijnders, G.; Blank, D.H.A.; Bals, S.; Van Aert, S.; Verbeeck, J.; Van Tendeloo, G.; Brinkman, A.; Hilgenkamp, H. |
Electronically coupled complementary interfaces between perovskite band insulators |
2006 |
Nature materials |
5 |
315 |
UA library record; WoS full record; WoS citing articles |
van den Broek, W.; Van Aert, S.; van Dyck, D. |
Fully automated measurement of the modulation transfer function of charge-coupled devices above the Nyquist frequency |
2012 |
Microscopy and microanalysis |
18 |
15 |
UA library record; WoS full record; WoS citing articles |
de Backer, A.; Van Aert, S.; van Dyck, D. |
High precision measurements of atom column positions using model-based exit wave reconstruction |
2011 |
Ultramicroscopy |
111 |
8 |
UA library record; WoS full record; WoS citing articles |
Lu, J.; Martinez, G.T.; Van Aert, S.; Schryvers, D. |
Lattice deformations in quasi-dynamic strain glass visualised and quantified by aberration corrected electron microscopy |
2014 |
Physica status solidi: B: basic research |
251 |
2 |
UA library record; WoS full record; WoS citing articles |
Van Aert, S.; Chen, J.H.; van Dyck, D. |
Linear versus non-linear structural information limit in high-resolution transmission electron microscopy |
2010 |
Ultramicroscopy |
110 |
6 |
UA library record; WoS full record; WoS citing articles |
Wang, A.; Chen, F.R.; Van Aert, S.; van Dyck, D. |
A method to determine the local surface profile from reconstructed exit waves |
2011 |
Ultramicroscopy |
111 |
3 |
UA library record; WoS full record; WoS citing articles |
Van Aert, S.; van den Broek, W.; Goos, P.; van Dyck, D. |
Model-based electron microscopy : from images toward precise numbers for unknown structure parameters |
2012 |
Micron |
43 |
7 |
UA library record; WoS full record; WoS citing articles |
van den Broek, W.; Van Aert, S.; van Dyck, D. |
A model based reconstruction technique for depth sectioning with scanning transmission electron microscopy |
2010 |
Ultramicroscopy |
110 |
16 |
UA library record; WoS full record; WoS citing articles |
Schryvers, D.; Shi, H.; Martinez, G.T.; Van Aert, S.; Frenzel, J.; Van Humbeeck, J. |
Nano- and microcrystal investigations of precipitates, interfaces and strain fields in Ni-Ti-Nb by various TEM techniques |
2013 |
Materials science forum
T2 – 9th European Symposium on Martensitic Transformations (ESOMAT 2012), SEP 09-16, 2012, St Petersburg, RUSSIA |
738/739 |
2 |
UA library record; WoS full record; WoS citing articles |
Wang, A.; Van Aert, S.; Goos, P.; van Dyck, D. |
Precision of three-dimensional atomic scale measurements from HRTEM images : what are the limits? |
2012 |
Ultramicroscopy |
114 |
5 |
UA library record; WoS full record; WoS citing articles |
Van Aert, S.; van Dyck, D.; den Dekker, A.J. |
Resolution of coherent and incoherent imaging systems reconsidered: classical criteria and a statistical alternative |
2006 |
Optics express |
14 |
45 |
UA library record; WoS full record; WoS citing articles |
Guzzinati, G.; Altantzis, T.; Batuk, M.; De Backer, A.; Lumbeeck, G.; Samaee, V.; Batuk, D.; Idrissi, H.; Hadermann, J.; Van Aert, S.; Schryvers, D.; Verbeeck, J.; Bals, S. |
Recent Advances in Transmission Electron Microscopy for Materials Science at the EMAT Lab of the University of Antwerp |
2018 |
Materials |
11 |
15 |
UA library record; WoS full record; WoS citing articles |
Pullini, D.; Sgroi, M.; Mahmoud, A.; Gauquelin, N.; Maschio, L.; Lorenzo-Ferrari, A.M.; Groenen, R.; Damen, C.; Rijnders, G.; van den Bos, K.H.W.; Van Aert, S.; Verbeeck, J. |
One step toward a new generation of C-MOS compatible oxide p-n junctions: Structure of the LSMO/ZnO interface elucidated by an experimental and theoretical synergic work |
2017 |
ACS applied materials and interfaces |
9 |
4 |
UA library record; WoS full record; WoS citing articles |
Delfino, C.L.; Hao, Y.; Martin, C.; Minoia, A.; Gopi, E.; Mali, K.S.; Van der Auweraer, M.; Geerts, Y.H.; Van Aert, S.; Lazzaroni, R.; De Feyter, S. |
Conformation-Dependent Monolayer and Bilayer Structures of an Alkylated TTF Derivative Revealed using STM and Molecular Modeling |
2023 |
The Journal of Physical Chemistry C |
127 |
|
UA library record; WoS full record |
Nerl, H.C.; Pokle, A.; Jones, L.; Müller‐Caspary, K.; Bos, K.H.W.; Downing, C.; McCarthy, E.K.; Gauquelin, N.; Ramasse, Q.M.; Lobato, I.; Daly, D.; Idrobo, J.C.; Van Aert, S.; Van Tendeloo, G.; Sanvito, S.; Coleman, J.N.; Cucinotta, C.S.; Nicolosi, V. |
Self‐Assembly of Atomically Thin Chiral Copper Heterostructures Templated by Black Phosphorus |
2019 |
Advanced functional materials |
29 |
1 |
UA library record; WoS full record; WoS citing articles |
Zhang, Z.; Lobato, I.; De Backer, A.; Van Aert, S.; Nellist, P. |
Fast generation of calculated ADF-EDX scattering cross-sections under channelling conditions |
2023 |
Ultramicroscopy |
246 |
|
UA library record; WoS full record; WoS citing articles |
Imran, M.; Ramade, J.; Di Stasio, F.; De Franco, M.; Buha, J.; Van Aert, S.; Goldoni, L.; Lauciello, S.; Prato, M.; Infante, I.; Bals, S.; Manna, L. |
Alloy CsCdxPb1–xBr3Perovskite Nanocrystals: The Role of Surface Passivation in Preserving Composition and Blue Emission |
2020 |
Chemistry Of Materials |
32 |
44 |
UA library record; WoS full record; WoS citing articles |
Bals, S.; Casavola, M.; van Huis, M.A.; Van Aert, S.; Batenburg, K.J.; Van Tendeloo, G.; Vanmaekelbergh, D. |
Three-dimensional atomic imaging of colloidal core-shell nanocrystals |
2011 |
Nano letters |
11 |
121 |
UA library record; WoS full record; WoS citing articles |
Van Aert, S.; Batenburg, K.J.; Rossell, M.D.; Erni, R.; Van Tendeloo, G. |
Three-dimensional atomic imaging of crystalline nanoparticles |
2011 |
Nature |
470 |
341 |
UA library record; WoS full record; WoS citing articles |
Fatermans, J.; de Backer, A.; den Dekker, A.J.; Van Aert, S. |
Atom column detection |
2021 |
Advances in imaging and electron physics
T2 – Advances in imaging and electron physics |
|
|
UA library record |