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Author | Van Aert, S.; van den Broek, W.; Goos, P.; van Dyck, D. | ||||
Title | Model-based electron microscopy : from images toward precise numbers for unknown structure parameters | Type | A1 Journal article | ||
Year | 2012 | Publication | Micron | Abbreviated Journal | Micron |
Volume | 43 | Issue | 4 | Pages | 509-515 |
Keywords | A1 Journal article; Engineering Management (ENM); Electron microscopy for materials research (EMAT); Vision lab | ||||
Abstract | Statistical parameter estimation theory is proposed as a method to quantify electron microscopy images. It aims at obtaining precise and accurate values for the unknown structure parameters including, for example, atomic column positions and types. In this theory, observations are purely considered as data planes, from which structure parameters have to be determined using a parametric model describing the images. The method enables us to measure positions of atomic columns with a precision of the order of a few picometers even though the resolution of the electron microscope is one or two orders of magnitude larger. Moreover, small differences in averaged atomic number, which cannot be distinguished visually, can be quantified using high-angle annular dark field scanning transmission electron microscopy images. Finally, it is shown how to optimize the experimental design so as to attain the highest precision. As an example, the optimization of the probe size for nanoparticle radius measurements is considered. It is also shown how to quantitatively balance signal-to-noise ratio and resolution by adjusting the probe size. | ||||
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Publisher | Place of Publication | Oxford | Editor | ||
Language | Wos | 000301702400003 | Publication Date | 2011-11-03 | |
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | 0968-4328; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
Impact Factor | 1.98 | Times cited | 7 | Open Access | |
Notes | Fwo | Approved | Most recent IF: 1.98; 2012 IF: 1.876 | ||
Call Number | UA @ lucian @ c:irua:94114 | Serial | 2099 | ||
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Author | van den Broek, W.; Van Aert, S.; van Dyck, D. | ||||
Title | A model based reconstruction technique for depth sectioning with scanning transmission electron microscopy | Type | A1 Journal article | ||
Year | 2010 | Publication | Ultramicroscopy | Abbreviated Journal | Ultramicroscopy |
Volume | 110 | Issue | 5 | Pages | 548-554 |
Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab | ||||
Abstract | Depth sectioning in high angular annular dark field scanning transmission electron microscopy is considered a candidate for three-dimensional characterization on the atomic scale. However at present the depth resolution is still far from the atomic level, due to strong limitations in the opening angle of the beam. In this paper we introduce a new, parameter based tomographic reconstruction algorithm that allows to make maximal use of the prior knowledge about the constituent atom types and the microscope settings, so as to retrieve the atomic positions and push the resolution to the atomic level in all three dimensions. | ||||
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Corporate Author | Thesis | ||||
Publisher | Place of Publication | Amsterdam | Editor | ||
Language | Wos | 000279065700022 | Publication Date | 2009-09-21 | |
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | 0304-3991; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
Impact Factor | 2.843 | Times cited | 16 | Open Access | |
Notes | Fwo | Approved | Most recent IF: 2.843; 2010 IF: 2.063 | ||
Call Number | UA @ lucian @ c:irua:83690 | Serial | 2104 | ||
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Author | Verbeeck, J.; van Dyck, D.; Lichte, H.; Potapov, P.; Schattschneider, P. | ||||
Title | Plasmon holographic experiments: theoretical framework | Type | A1 Journal article | ||
Year | 2005 | Publication | Ultramicroscopy | Abbreviated Journal | Ultramicroscopy |
Volume | 102 | Issue | 3 | Pages | 239-255 |
Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab | ||||
Abstract | A theoretical framework is described to understand the results of plasmon holography experiments leading to insight in the meaning of the experimental results and pointing out directions for future experiments. The framework is based on the formalism of mutual intensity to describe how coherence is transferred through an optical system. For the inelastic interaction with the object, an expression for the volume. plasmon excitations in a free electron gas is used as a model for the behaviour of aluminium. The formalism leads to a clear graphical intuitive tool for under-standing the experiments. It becomes evident that the measured coherence is solely related to the angular distribution of the plasmon scattering in the case of bulk plasmons. After describing the framework, the special case of coherence outside a spherical particle is treated and the seemingly controversial idea of a plasmon with a limited coherence length obtained front experiments is clarified. (C) 2004 Elsevier B.V. All rights reserved. | ||||
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Corporate Author | Thesis | ||||
Publisher | Place of Publication | Amsterdam | Editor | ||
Language | Wos | 000226436600010 | Publication Date | 2004-11-05 | |
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | 0304-3991; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
Impact Factor | 2.843 | Times cited | 43 | Open Access | |
Notes | Fwo | Approved | Most recent IF: 2.843; 2005 IF: 2.490 | ||
Call Number | UA @ lucian @ c:irua:57133UA @ admin @ c:irua:57133 | Serial | 2643 | ||
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Author | Wang, A.; Van Aert, S.; Goos, P.; van Dyck, D. | ||||
Title | Precision of three-dimensional atomic scale measurements from HRTEM images : what are the limits? | Type | A1 Journal article | ||
Year | 2012 | Publication | Ultramicroscopy | Abbreviated Journal | Ultramicroscopy |
Volume | 114 | Issue | Pages | 20-30 | |
Keywords | A1 Journal article; Engineering Management (ENM); Electron microscopy for materials research (EMAT); Vision lab | ||||
Abstract | In this paper, we investigate to what extent high resolution transmission electron microscopy images can be used to measure the mass, in terms of thickness, and surface profile, corresponding to the defocus offset, of an object at the atomic scale. Therefore, we derive an expression for the statistical precision with which these object parameters can be estimated in a quantitative analysis. Evaluating this expression as a function of the microscope settings allows us to derive the optimal microscope design. Acquiring three-dimensional structure information in terms of thickness turns out to be much more difficult than obtaining two-dimensional information on the projected atom column positions. The attainable precision is found to be more strongly affected by processes influencing the image contrast, such as phonon scattering, than by the specific choice of microscope settings. For a realistic incident electron dose, it is expected that atom columns can be distinguished with single atom sensitivity up to a thickness of the order of the extinction distance. A comparable thickness limit is determined to measure surface steps of one atom. An increase of the electron dose shifts the limiting thickness upward due to an increase in the signal-to-noise ratio. | ||||
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Publisher | Place of Publication | Amsterdam | Editor | ||
Language | Wos | 000301954300003 | Publication Date | 2012-01-06 | |
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | 0304-3991; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
Impact Factor | 2.843 | Times cited | 5 | Open Access | |
Notes | Fwo | Approved | Most recent IF: 2.843; 2012 IF: 2.470 | ||
Call Number | UA @ lucian @ c:irua:94116 | Serial | 2692 | ||
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Author | Van Aert, S.; van Dyck, D.; den Dekker, A.J. | ||||
Title | Resolution of coherent and incoherent imaging systems reconsidered: classical criteria and a statistical alternative | Type | A1 Journal article | ||
Year | 2006 | Publication | Optics express | Abbreviated Journal | Opt Express |
Volume | 14 | Issue | 9 | Pages | 3830-3839 |
Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab | ||||
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Publisher | Place of Publication | Editor | |||
Language | Wos | 000237296200013 | Publication Date | 2006-05-04 | |
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | 1094-4087; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
Impact Factor | 3.307 | Times cited | 45 | Open Access | |
Notes | Fwo | Approved | Most recent IF: 3.307; 2006 IF: 4.009 | ||
Call Number | UA @ lucian @ c:irua:58262 | Serial | 2883 | ||
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Author | van Dyck, D.; Croitoru, M.D. | ||||
Title | Statistical method for thickness measurement of amorphous objects | Type | A1 Journal article | ||
Year | 2007 | Publication | Applied physics letters | Abbreviated Journal | Appl Phys Lett |
Volume | 90 | Issue | 24 | Pages | 241911-241913 |
Keywords | A1 Journal article; Condensed Matter Theory (CMT); Electron microscopy for materials research (EMAT); Vision lab | ||||
Abstract | The authors propose a nondestructive method for the determination of the thickness of an amorphous sample. This method is based on the statistics of the phase of the electron exit wave function, which depend on the number of atoms traversed by the incident electron which itself is a function of the thickness of the object. The accuracy of this method has been checked numerically by the multislice method and compared with that based on the mean inner potential. (c) 2007 American Institute of Physics. | ||||
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Publisher | American Institute of Physics | Place of Publication | New York, N.Y. | Editor | |
Language | Wos | 000247305400033 | Publication Date | 2007-06-14 | |
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | 0003-6951; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
Impact Factor | 3.411 | Times cited | 4 | Open Access | |
Notes | Fwo | Approved | Most recent IF: 3.411; 2007 IF: 3.596 | ||
Call Number | UA @ lucian @ c:irua:102671 | Serial | 3158 | ||
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Author | Potapov, P.L.; Verbeeck, J.; Schattschneider, P.; Lichte, H.; van Dyck, D. | ||||
Title | Inelastic electron holography as a variant of the Feynman thought experiment | Type | A1 Journal article | ||
Year | 2007 | Publication | Ultramicroscopy | Abbreviated Journal | Ultramicroscopy |
Volume | 107 | Issue | 8 | Pages | 559-567 |
Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab | ||||
Abstract | Using a combination of electron holography and energy filtering, interference fringes produced after inelastic interaction of electrons with hydrogen molecules are examined. Surprisingly, the coherence of inelastic scattering increases when moving from the surface of a hydrogen-containing bubble to the vacuum. This phenomenon can be understood in terms of the Feynman two-slit thought experiment with a variable ambiguity of the which-way registration. (C) 2006 Elsevier B.V. All rights reserved. | ||||
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Corporate Author | Thesis | ||||
Publisher | Place of Publication | Amsterdam | Editor | ||
Language | Wos | 000246937000001 | Publication Date | 2006-12-16 | |
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | 0304-3991; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
Impact Factor | 2.843 | Times cited | 13 | Open Access | |
Notes | Fwo G.0147.06 | Approved | Most recent IF: 2.843; 2007 IF: 1.996 | ||
Call Number | UA @ lucian @ c:irua:103588UA @ admin @ c:irua:103588 | Serial | 1605 | ||
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Author | Van Aert, S.; Verbeeck, J.; Erni, R.; Bals, S.; Luysberg, M.; van Dyck, D.; Van Tendeloo, G. | ||||
Title | Quantitative atomic resolution mapping using high-angle annular dark field scanning transmission electron microscopy | Type | A1 Journal article | ||
Year | 2009 | Publication | Ultramicroscopy | Abbreviated Journal | Ultramicroscopy |
Volume | 109 | Issue | 10 | Pages | 1236-1244 |
Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab | ||||
Abstract | A model-based method is proposed to relatively quantify the chemical composition of atomic columns using high angle annular dark field (HAADF) scanning transmission electron microscopy (STEM) images. The method is based on a quantification of the total intensity of the scattered electrons for the individual atomic columns using statistical parameter estimation theory. In order to apply this theory, a model is required describing the image contrast of the HAADF STEM images. Therefore, a simple, effective incoherent model has been assumed which takes the probe intensity profile into account. The scattered intensities can then be estimated by fitting this model to an experimental HAADF STEM image. These estimates are used as a performance measure to distinguish between different atomic column types and to identify the nature of unknown columns with good accuracy and precision using statistical hypothesis testing. The reliability of the method is supported by means of simulated HAADF STEM images as well as a combination of experimental images and electron energy-loss spectra. It is experimentally shown that statistically meaningful information on the composition of individual columns can be obtained even if the difference in averaged atomic number Z is only 3. Using this method, quantitative mapping at atomic resolution using HAADF STEM images only has become possible without the need of simultaneously recorded electron energy loss spectra. | ||||
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Corporate Author | Thesis | ||||
Publisher | Place of Publication | Amsterdam | Editor | ||
Language | Wos | 000270015200004 | Publication Date | 2009-05-28 | |
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | 0304-3991; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
Impact Factor | 2.843 | Times cited | 166 | Open Access | |
Notes | Fwo; Esteem 026019 | Approved | Most recent IF: 2.843; 2009 IF: 2.067 | ||
Call Number | UA @ lucian @ c:irua:78585UA @ admin @ c:irua:78585 | Serial | 2748 | ||
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Author | Croitoru, M.D.; van Dyck, D.; Van Aert, S.; Bals, S.; Verbeeck, J. | ||||
Title | An efficient way of including thermal diffuse scattering in simulation of scanning transmission electron microscopic images | Type | A1 Journal article | ||
Year | 2006 | Publication | Ultramicroscopy | Abbreviated Journal | Ultramicroscopy |
Volume | 106 | Issue | 10 | Pages | 933-940 |
Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Condensed Matter Theory (CMT); Vision lab | ||||
Abstract | We propose an improved image simulation procedure for atomic-resolution annular dark-field scanning transmission electron microscopy (STEM) based on the multislice formulation, which takes thermal diffuse scattering fully into account. The improvement with regard to the classical frozen phonon approach is realized by separating the lattice configuration statistics from the dynamical scattering so as to avoid repetitive calculations. As an example, the influence of phonon scattering on the image contrast is calculated and investigated. STEM image simulation of crystals can be applied with reasonable computing times to problems involving a large number of atoms and thick or large supercells. | ||||
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Corporate Author | Thesis | ||||
Publisher | Place of Publication | Amsterdam | Editor | ||
Language | Wos | 000240397200006 | Publication Date | 2006-05-10 | |
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | 0304-3991; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
Impact Factor | 2.843 | Times cited | 18 | Open Access | |
Notes | Fwo; Fwo-V | Approved | Most recent IF: 2.843; 2006 IF: 1.706 | ||
Call Number | UA @ lucian @ c:irua:87604UA @ admin @ c:irua:87604 | Serial | 876 | ||
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Author | Wang, A.; Turner, S.; Van Aert, S.; van Dyck, D. | ||||
Title | An alternative approach to determine attainable resolution directly from HREM images | Type | A1 Journal article | ||
Year | 2013 | Publication | Ultramicroscopy | Abbreviated Journal | Ultramicroscopy |
Volume | 133 | Issue | Pages | 50-61 | |
Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab | ||||
Abstract | The concept of resolution in high-resolution electron microscopy (HREM) is the power to resolve neighboring atoms. Since the resolution is related to the width of the point spread function of the microscope, it could in principle be determined from the image of a point object. However, in electron microscopy there are no ideal point objects. The smallest object is an individual atom. If the width of an atom is much smaller than the resolution of the microscope, this atom can still be considered as a point object. As the resolution of the microscope enters the sub-Å regime, information about the microscope is strongly entangled with the information about the atoms in HREM images. Therefore, we need to find an alternative method to determine the resolution in an object-independent way. In this work we propose to use the image wave of a crystalline object in zone axis orientation. Under this condition, the atoms of a column act as small lenses so that the electron beam channels through the atom column periodically. Because of this focusing, the image wave of the column can be much more peaked than the constituting atoms and can thus be a much more sensitive probe to measure the resolution. Our approach is to use the peakiness of the image wave of the atom column to determine the resolution. We will show that the resolution can be directly linked to the total curvature of the atom column wave. Moreover, we can then directly obtain the resolution of the microscope given that the contribution from the object is known, which is related to the bounding energy of the atom. The method is applied on an experimental CaTiO3 image wave. | ||||
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Corporate Author | Thesis | ||||
Publisher | Place of Publication | Amsterdam | Editor | ||
Language | Wos | 000324471800007 | Publication Date | 2013-05-23 | |
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | 0304-3991; | ISBN | Additional Links | UA library record; WoS full record | |
Impact Factor | 2.843 | Times cited | Open Access | ||
Notes | FWO; Hercules; Esteem2; esteem2_jra2 | Approved | Most recent IF: 2.843; 2013 IF: 2.745 | ||
Call Number | UA @ lucian @ c:irua:109919 | Serial | 90 | ||
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Author | Schalm, O.; van der Linden, V.; Frederickx, P.; Luyten, S.; van der Snickt, G.; Caen, J.; Schryvers, D.; Janssens, K.; Cornelis, E.; van Dyck, D.; Schreiner, M. | ||||
Title | Enamels in stained glass windows: preparation, chemical composition, microstructure and causes of deterioration | Type | A1 Journal article | ||
Year | 2009 | Publication | Spectrochimica acta: part B : atomic spectroscopy | Abbreviated Journal | Spectrochim Acta B |
Volume | 64 | Issue | 8 | Pages | 812-820 |
Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation); Vision lab | ||||
Abstract | Stained glass windows incorporating dark blue and purple enamel paint layers are in some cases subject to severe degradation while others from the same period survived the ravages of time. A series of dark blue, greenblue and purple enamel glass paints from the same region (Northwestern Europe) and from the same period (16early 20th centuries) has been studied by means of a combination of microscopic X-ray fluorescence analysis, electron probe micro analysis and transmission electron microscopy with the aim of better understanding the causes of the degradation. The chemical composition of the enamels diverges from the average chemical composition of window glass. Some of the compositions appear to be unstable, for example those with a high concentration of K2O and a low content of CaO and PbO. In other cases, the deterioration of the paint layers was caused by the less than optimal vitrification of the enamel during the firing process. Recipes and chemical compositions indicate that glassmakers of the 1617th century had full control over the color of the enamel glass paints they made. They mainly used three types of coloring agents, based on Co (dark blue), Mn (purple) and Cu (light-blue or greenblue) as coloring elements. Bluepurple enamel paints were obtained by mixing two different coloring agents. The coloring agent for redpurple enamel, introduced during the 19th century, was colloidal gold embedded in grains of lead glass. | ||||
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Publisher | Place of Publication | Oxford | Editor | ||
Language | Wos | 000269995300018 | Publication Date | 2009-06-19 | |
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | 0584-8547; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
Impact Factor | 3.241 | Times cited | 28 | Open Access | |
Notes | Iuap Vi/6; Fwo; Goa | Approved | Most recent IF: 3.241; 2009 IF: 2.719 | ||
Call Number | UA @ lucian @ c:irua:79647 | Serial | 1035 | ||
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Author | Sentosun, K.; Lobato, I.; Bladt, E.; Zhang, Y.; Palenstijn, W.J.; Batenburg, K.J.; Van Dyck, D.; Bals, S. | ||||
Title | Artifact Reduction Based on Sinogram Interpolation for the 3D Reconstruction of Nanoparticles Using Electron Tomography | Type | A1 Journal article | ||
Year | 2017 | Publication | Particle and particle systems characterization | Abbreviated Journal | Part. Part. Syst. Charact. |
Volume | 34 | Issue | 34 | Pages | 1700287 |
Keywords | A1 Journal article; Engineering sciences. Technology; Electron microscopy for materials research (EMAT); Vision lab | ||||
Abstract | Electron tomography is a well-known technique providing a 3D characterization of the morphology and chemical composition of nanoparticles. However, several reasons hamper the acquisition of tilt series with a large number of projection images, which deteriorate the quality of the 3D reconstruction. Here, an inpainting method that is based on sinogram interpolation is proposed, which enables one to reduce artifacts in the reconstruction related to a limited tilt series of projection images. The advantages of the approach will be demonstrated for the 3D characterization of nanoparticles using phantoms and several case studies. | ||||
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Publisher | Place of Publication | Editor | |||
Language | Wos | 000418416100005 | Publication Date | 2017-10-27 | |
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Series Volume | Series Issue | Edition | |||
ISSN | 1521-4117 | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
Impact Factor | Times cited | 2 | Open Access | OpenAccess | |
Notes | K.S. and S.B. acknowledge support from the Fund for Scientific ResearchFlanders (FWO) (G019014N and G021814N). S.B. acknowledges financial support from European Research Council (ERC Starting Grant #335078-COLOURATOM). Y.Z. acknowledges financial support from the European Union’s Horizon 2020 research and innovation programme under the Marie Skłodowska-Curie Grant Agreement No. 665501 through a FWO [PEGASUS]2 Marie Skłodowska-Curie fellowship (12U4917N). The authors would like to thank Prof. Luis Liz-Marzán for provision of the samples. (ROMEO:yellow; preprint:; postprint:restricted ; pdfversion:cannot); saraecas; ECAS_Sara; | Approved | Most recent IF: NA | ||
Call Number | EMAT @ emat @c:irua:147857UA @ admin @ c:irua:147857 | Serial | 4798 | ||
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Author | Van den Broek, W.; Rosenauer, A.; Van Aert, S.; Sijbers, J.; van Dyck, D. | ||||
Title | A memory efficient method for fully three-dimensional object reconstruction with HAADF STEM | Type | A1 Journal article | ||
Year | 2014 | Publication | Ultramicroscopy | Abbreviated Journal | Ultramicroscopy |
Volume | 141 | Issue | Pages | 22-31 | |
Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab | ||||
Abstract | The conventional approach to object reconstruction through electron tomography is to reduce the three-dimensional problem to a series of independent two-dimensional slice-by-slice reconstructions. However, at atomic resolution the image of a single atom extends over many such slices and incorporating this image as prior knowledge in tomography or depth sectioning therefore requires a fully three-dimensional treatment. Unfortunately, the size of the three-dimensional projection operator scales highly unfavorably with object size and readily exceeds the available computer memory. In this paper, it is shown that for incoherent image formation the memory requirement can be reduced to the fundamental lower limit of the object size, both for tomography and depth sectioning. Furthermore, it is shown through multislice calculations that high angle annular dark field scanning transmission electron microscopy can be sufficiently incoherent for the reconstruction of single element nanocrystals, but that dynamical diffraction effects can cause classification problems if more than one element is present. (C) 2014 Elsevier B.V. All rights reserved. | ||||
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Publisher | Place of Publication | Amsterdam | Editor | ||
Language | Wos | 000335766600004 | Publication Date | 2014-03-22 | |
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Series Volume | Series Issue | Edition | |||
ISSN | 0304-3991; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
Impact Factor | 2.843 | Times cited | 6 | Open Access | |
Notes | ResearchFoundationFlanders(FWO;G.0393.11; G.0064.10;andG.0374.13); European Union Seventh Frame- workProgramme [FP7/2007-2013]under Grant agreement no. 312483 (ESTEEM2).; esteem2jra2; esteem2jra4 | Approved | Most recent IF: 2.843; 2014 IF: 2.436 | ||
Call Number | UA @ lucian @ c:irua:117650 | Serial | 1992 | ||
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Author | Alania, M.; De Backer, A.; Lobato, I.; Krause, F.F.; Van Dyck, D.; Rosenauer, A.; Van Aert, S. | ||||
Title | How precise can atoms of a nanocluster be located in 3D using a tilt series of scanning transmission electron microscopy images? | Type | A1 Journal article | ||
Year | 2017 | Publication | Ultramicroscopy | Abbreviated Journal | Ultramicroscopy |
Volume | 181 | Issue | 181 | Pages | 134-143 |
Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab | ||||
Abstract | In this paper, we investigate how precise atoms of a small nanocluster can ultimately be located in three dimensions (3D) from a tilt series of images acquired using annular dark field (ADF) scanning transmission electron microscopy (STEM). Therefore, we derive an expression for the statistical precision with which the 3D atomic position coordinates can be estimated in a quantitative analysis. Evaluating this statistical precision as a function of the microscope settings also allows us to derive the optimal experimental design. In this manner, the optimal angular tilt range, required electron dose, optimal detector angles, and number of projection images can be determined. | ||||
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Language | Wos | 000411170800016 | Publication Date | 2016-12-15 | |
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | 0304-3991 | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
Impact Factor | 2.843 | Times cited | 3 | Open Access | OpenAccess |
Notes | The authors acknowledge financial support from the European Union under the Seventh Framework Program under a contract for an Integrated Infrastructure Initiative. Reference No. 312483-ESTEEM2. The authors acknowledge financial support from the Research Foundation Flanders (FWO, Belgium) through project fundings (G.0374.13N, G.0369.15N, G.0368.15N, and WO.010.16N) and a post-doctoral grant to A. De Backer, and from the DFG under contract No. RO-2057/4-2. | Approved | Most recent IF: 2.843 | ||
Call Number | EMAT @ emat @ c:irua:144432 | Serial | 4618 | ||
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Author | Van Aert, S.; De Backer, A.; Martinez, G.T.; den Dekker, A.J.; Van Dyck, D.; Bals, S.; Van Tendeloo, G. | ||||
Title | Advanced electron crystallography through model-based imaging | Type | A1 Journal article | ||
Year | 2016 | Publication | IUCrJ | Abbreviated Journal | Iucrj |
Volume | 3 | Issue | 3 | Pages | 71-83 |
Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab; Engineering Management (ENM) | ||||
Abstract | The increasing need for precise determination of the atomic arrangement of non-periodic structures in materials design and the control of nanostructures explains the growing interest in quantitative transmission electron microscopy. The aim is to extract precise and accurate numbers for unknown structure parameters including atomic positions, chemical concentrations and atomic numbers. For this purpose, statistical parameter estimation theory has been shown to provide reliable results. In this theory, observations are considered purely as data planes, from which structure parameters have to be determined using a parametric model describing the images. As such, the positions of atom columns can be measured with a precision of the order of a few picometres, even though the resolution of the electron microscope is still one or two orders of magnitude larger. Moreover, small differences in average atomic number, which cannot be distinguished visually, can be quantified using high-angle annular dark-field scanning transmission electron microscopy images. In addition, this theory allows one to measure compositional changes at interfaces, to count atoms with single-atom sensitivity, and to reconstruct atomic structures in three dimensions. This feature article brings the reader up to date, summarizing the underlying theory and highlighting some of the recent applications of quantitative model-based transmisson electron microscopy. | ||||
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Language | Wos | 000368590900010 | Publication Date | 2015-11-13 | |
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Series Volume | Series Issue | Edition | |||
ISSN | 2052-2525; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
Impact Factor | 5.793 | Times cited | 30 | Open Access | OpenAccess |
Notes | The authors gratefully acknowledge the Research Foundation Flanders (FWO, Belgium) for funding and for a PhD grant to ADB. The research leading to these results has received funding from the European Union 7th Framework Program (FP7/20072013) under grant agreement No. 312483 (ESTEEM2). SB and GVT acknowledge the European Research Council under the 7th Framework Program (FP7), ERC grant No. 335078 – COLOURATOMS and ERC grant No. 246791 – COUNTATOMS.; esteem2jra2; ECASSara; (ROMEO:green; preprint:; postprint:can ; pdfversion:can); | Approved | Most recent IF: 5.793 | ||
Call Number | c:irua:129589 c:irua:129589 | Serial | 3965 | ||
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Author | Pourbabak, S.; Wang, X.; Van Dyck, D.; Verlinden, B.; Schryvers, D. | ||||
Title | Ni cluster formation in low temperature annealed Ni50.6Ti49.4 | Type | A1 Journal article | ||
Year | 2017 | Publication | Functional materials letters | Abbreviated Journal | Funct Mater Lett |
Volume | 10 | Issue | 10 | Pages | 1740005 |
Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab | ||||
Abstract | Various low temperature treatments of Ni50.6Ti49.4 have shown an unexpected effect on the martensitic start temperature. Periodic diffuse intensity distributions in reciprocal space indicate the formation of short pure Ni strings along the <111> directions in the B2 ordered lattice, precursing the formation of Ni4Ti3 precipitates formed at higher annealing temperatures. | ||||
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Language | Wos | 000395164100006 | Publication Date | 2017-01-10 | |
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ISSN | 1793-6047 | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
Impact Factor | 1.234 | Times cited | 4 | Open Access | Not_Open_Access |
Notes | The authors like to thank the Flemish Science Foundation FWO for financial support under project G.0366.15N “Influence of nano- and microstructural features and defects in fine-grained Ni-Ti on the thermal and mechanical reversibility of the martensitic transformation and the shape memory and superelastic behavior”. We are also very grateful to Prof. Dr. Jan Van Humbeeck for initiating this work, for his continuous support and inspiring discussions. | Approved | Most recent IF: 1.234 | ||
Call Number | EMAT @ emat @ c:irua:142545 | Serial | 4619 | ||
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Author | Van Tendeloo, G.; Bals, S.; Van Aert, S.; Verbeeck, J.; van Dyck, D. | ||||
Title | Advanced electron microscopy for advanced materials | Type | A1 Journal article | ||
Year | 2012 | Publication | Advanced materials | Abbreviated Journal | Adv Mater |
Volume | 24 | Issue | 42 | Pages | 5655-5675 |
Keywords | A1 Journal article; Engineering sciences. Technology; Electron microscopy for materials research (EMAT); Vision lab | ||||
Abstract | The idea of this Review is to introduce newly developed possibilities of advanced electron microscopy to the materials science community. Over the last decade, electron microscopy has evolved into a full analytical tool, able to provide atomic scale information on the position, nature, and even the valency atoms. This information is classically obtained in two dimensions (2D), but can now also be obtained in 3D. We show examples of applications in the field of nanoparticles and interfaces. | ||||
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Publisher | Place of Publication | Weinheim | Editor | ||
Language | Wos | 000310602200001 | Publication Date | 2012-08-21 | |
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ISSN | 0935-9648; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
Impact Factor | 19.791 | Times cited | 107 | Open Access | |
Notes | This work was supported by funding from the European Research Council under the 7th Framework Program (FP7), ERC grant No 246791 – COUNTATOMS. J.V. Acknowledges funding from the European Research Council under the 7th Framework Program (FP7), ERC Starting Grant 278510 VORTEX. The authors gratefully acknowledge funding from the Research Foundation Flanders (FWO, Belgium). The Qu-Ant-EM microscope was partly funded by the Hercules Fund from the Flemish Government. We thank Rafal Dunin-Borkowski for providing Figure 5d. The authors would like to thank the colleagues who have contributed to this work over the years, including K.J. Batenburg, R. Erni, B. Goris, F. Leroux, H. Lichte, A. Lubk, B. Partoens, M. D. Rossell, P. Schattschneider, B. Schoeters, D. Schryvers, H. Tan, H. Tian, S. Turner, M. van Huis. ECASJO_; | Approved | Most recent IF: 19.791; 2012 IF: 14.829 | ||
Call Number | UA @ lucian @ c:irua:100470UA @ admin @ c:irua:100470 | Serial | 70 | ||
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Author | Robert, Hl.; Lobato, I.; Lyu, Fj.; Chen, Q.; Van Aert, S.; Van Dyck, D.; Müller-Caspary, K. | ||||
Title | Dynamical diffraction of high-energy electrons investigated by focal series momentum-resolved scanning transmission electron microscopy at atomic resolution | Type | A1 Journal article | ||
Year | 2022 | Publication | Ultramicroscopy | Abbreviated Journal | Ultramicroscopy |
Volume | 233 | Issue | Pages | 113425 | |
Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab | ||||
Abstract | We report a study of scattering dynamics in crystals employing momentum-resolved scanning transmission electron microscopy under varying illumination conditions. As we perform successive changes of the probe focus, multiple real-space signals are obtained in dependence of the shape of the incident electron wave. With support from extensive simulations, each signal is shown to be characterised by an optimum focus for which the contrast is maximum and which differs among different signals. For instance, a systematic focus mismatch is found between images formed by high-angle scattering, being sensitive to thickness and chemical composition, and the first moment in diffraction space, being sensitive to electric fields. It follows that a single recording at one specific probe focus is usually insufficient to characterise materials comprehensively. Most importantly, we demonstrate in experiment and simulation that the second moment ( |
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Language | Wos | 000734396800009 | Publication Date | 2021-11-13 | |
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ISSN | 0304-3991 | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
Impact Factor | 2.2 | Times cited | Open Access | OpenAccess | |
Notes | We thank Dr. Florian Winkler for valuable discussions and experimental work at the early stages of this study. This work was supported by the Initiative and Network Fund of the Helmholtz Association (Germany) under contracts VH-NG-1317 and ZT-I-0025. This project furthermore received funding from the European Research Council (ERC) under the European Union’s Horizon 2020 research and innovation program (grant agreement No. 770887). | Approved | Most recent IF: 2.2 | ||
Call Number | EMAT @ emat @c:irua:184833 | Serial | 6898 | ||
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