| Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
| Susi, T.; Madsen, J.; Ludacka, U.; Mortensen, J.J.; Pennycook, T.J.; Lee, Z.; Kotakoski, J.; Kaiser, U.; Meyer, J.C. |
Efficient first principles simulation of electron scattering factors for transmission electron microscopy |
2019 |
Ultramicroscopy |
197 |
3 |
UA library record; WoS full record; WoS citing articles |
| Pennycook, T.J.; Martinez, G.T.; Nellist, P.D.; Meyer, J.C. |
High dose efficiency atomic resolution imaging via electron ptychography |
2019 |
Ultramicroscopy |
196 |
1 |
UA library record; WoS full record; WoS citing articles |
| Leuthner, G.T.; Hummel, S.; Mangler, C.; Pennycook, T.J.; Susi, T.; Meyer, J.C.; Kotakoski, J. |
Scanning transmission electron microscopy under controlled low-pressure atmospheres |
2019 |
Ultramicroscopy |
203 |
4 |
UA library record; WoS full record; WoS citing articles |
| Madsen, J.; Pennycook, T.J.; Susi, T. |
ab initio description of bonding for transmission electron microscopy |
2021 |
Ultramicroscopy |
231 |
|
UA library record; WoS full record; WoS citing articles |
| Gorji, S.; Kashiwar, A.; Mantha, L.S.; Kruk, R.; Witte, R.; Marek, P.; Hahn, H.; Kübel, C.; Scherer, T. |
Nanowire facilitated transfer of sensitive TEM samples in a FIB |
2020 |
Ultramicroscopy |
219 |
|
UA library record |
| Gao, C.; Hofer, C.; Pennycook, T.J. |
On central focusing for contrast optimization in direct electron ptychography of thick samples |
2024 |
Ultramicroscopy |
256 |
|
UA library record; WoS full record; WoS citing articles |
| Bertoni, G.; Verbeeck, J. |
Accuracy and precision in model based EELS quantification |
2008 |
Ultramicroscopy |
108 |
44 |
UA library record; WoS full record; WoS citing articles |
| van den Broek, W.; Verbeeck, J.; de Backer, S.; Scheunders, P.; Schryvers, D. |
Acquisition of the EELS data cube by tomographic reconstruction |
2006 |
Ultramicroscopy |
106 |
6 |
UA library record; WoS full record; WoS citing articles |
| Radtke, G.; Botton, G.A.; Verbeeck, J. |
Electron inelastic, scattering and anisotropy: the two-dimensional point of view |
2006 |
Ultramicroscopy |
106 |
5 |
UA library record; WoS full record; WoS citing articles |
| Potapov, P.; Lichte, H.; Verbeeck, J.; van Dyck, D. |
Experiments on inelastic electron holography |
2006 |
Ultramicroscopy |
106 |
28 |
UA library record; WoS full record; WoS citing articles |
| Bals, S.; Kilaas, R.; Kisielowski, C. |
Nonlinear imaging using annular dark field TEM |
2005 |
Ultramicroscopy |
104 |
15 |
UA library record; WoS full record; WoS citing articles |
| Lobato, I.; Van Dyck, D. |
MULTEM : a new multislice program to perform accurate and fast electron diffraction and imaging simulations using graphics processing units with CUDA |
2015 |
Ultramicroscopy |
156 |
32 |
UA library record; WoS full record; WoS citing articles |
| Schattschneider, P.; Ennen, I.; Stoger-Pollach, M.; Verbeeck, J.; Mauchamp, V.; Jaouen, M. |
Real space maps of magnetic moments on the atomic scale: theory and feasibility |
2010 |
Ultramicroscopy |
110 |
10 |
UA library record; WoS full record; WoS citing articles |
| Egoavil, R.; Gauquelin, N.; Martinez, G.T.; Van Aert, S.; Van Tendeloo, G.; Verbeeck, J. |
Atomic resolution mapping of phonon excitations in STEM-EELS experiments |
2014 |
Ultramicroscopy |
147 |
22 |
UA library record; WoS full record; WoS citing articles |
| Martinez, G.T.; Jones, L.; de Backer, A.; Béché, A.; Verbeeck, J.; Van Aert, S.; Nellist, P.D. |
Quantitative STEM normalisation : the importance of the electron flux |
2015 |
Ultramicroscopy |
159 |
27 |
UA library record; WoS full record; WoS citing articles |
| Guzzinati, G.; Clark, L.; Béché, A.; Juchtmans, R.; Van Boxem, R.; Mazilu, M.; Verbeeck, J. |
Prospects for versatile phase manipulation in the TEM : beyond aberration correction |
2015 |
Ultramicroscopy |
151 |
19 |
UA library record; WoS full record; WoS citing articles |
| de Backer, A.; Martinez, G.T.; MacArthur, K.E.; Jones, L.; Béché, A.; Nellist, P.D.; Van Aert, S. |
Dose limited reliability of quantitative annular dark field scanning transmission electron microscopy for nano-particle atom-counting |
2015 |
Ultramicroscopy |
151 |
29 |
UA library record; WoS full record; WoS citing articles |
| Krause, F.F.; Ahl, J.P.; Tytko, D.; Choi, P.P.; Egoavil, R.; Schowalter, M.; Mehrtens, T.; Müller-Caspary, K.; Verbeeck, J.; Raabe, D.; Hertkorn, J.; Engl, K.; Rosenauer, A. |
Homogeneity and composition of AlInGaN : a multiprobe nanostructure study |
2015 |
Ultramicroscopy |
156 |
11 |
UA library record; WoS full record; WoS citing articles |
| de Backer, A.; De wael, A.; Gonnissen, J.; Van Aert, S. |
Optimal experimental design for nano-particle atom-counting from high-resolution STEM images |
2015 |
Ultramicroscopy |
151 |
24 |
UA library record; WoS full record; WoS citing articles |
| Bladt, E.; Pelt, D.M.; Bals, S.; Batenburg, K.J. |
Electron tomography based on highly limited data using a neural network reconstruction technique |
2015 |
Ultramicroscopy |
158 |
25 |
UA library record; WoS full record; WoS citing articles |
| Korneychuk, S.; Partoens, B.; Guzzinati, G.; Ramaneti, R.; Derluyn, J.; Haenen, K.; Verbeeck, J. |
Exploring possibilities of band gap measurement with off-axis EELS in TEM |
2018 |
Ultramicroscopy |
189 |
7 |
UA library record; WoS full record; WoS citing articles |
| Stefan Löffler; Matthieu Bugnet; Nicolas Gauquelin; Sorin Lazar; Elias Assmann; Karsten Held; Gianluigi A. Botton; Peter Schattschneider |
Real-space mapping of electronic orbitals |
2017 |
Ultramicroscopy |
177 |
|
UA library record |
| Zanaga, D.; Altantzis, T.; Sanctorum, J.; Freitag, B.; Bals, S. |
An alternative approach for \zeta-factor measurement using pure element nanoparticles |
2016 |
Ultramicroscopy |
164 |
19 |
UA library record; WoS full record; WoS citing articles |
| Alania, M.; Lobato Hoyos, I.P.; Van Aert, S. |
Frozen lattice and absorptive model for high angle annular dark field scanning transmission electron microscopy : a comparison study in terms of integrated intensity and atomic column position measurement |
2018 |
Ultramicroscopy |
184 |
|
UA library record; WoS full record; WoS citing articles |
| Vatanparast, M.; Egoavil, R.; Reenaas, T.W.; Verbeeck, J.; Holmestad, R.; Vullum, P.E. |
Bandgap measurement of high refractive index materials by off-axis EELS |
2017 |
Ultramicroscopy |
182 |
3 |
UA library record; WoS full record; WoS citing articles |
| Müller-Caspary, K.; Krause, F.F.; Winkler, F.; Béché, A.; Verbeeck, J.; Van Aert, S.; Rosenauer, A. |
Comparison of first moment STEM with conventional differential phase contrast and the dependence on electron dose |
2019 |
Ultramicroscopy |
203 |
25 |
UA library record; WoS full record; WoS citing articles |
| Zhong, Z.; Aveyard, R.; Rieger, B.; Bals, S.; Palenstijn, W.J.; Batenburg, K.J. |
Automatic correction of nonlinear damping effects in HAADF-STEM tomography for nanomaterials of discrete compositions |
2018 |
Ultramicroscopy |
184 |
8 |
UA library record; WoS full record; WoS citing articles |
| Grieb, T.; Krause, F.F.; Mahr, C.; Zillmann, D.; Müller-Caspary, K.; Schowalter, M.; Rosenauer, A. |
Optimization of NBED simulations for disc-detection measurements |
2017 |
Ultramicroscopy |
181 |
6 |
UA library record; WoS full record; WoS citing articles |
| Grieb, T.; Tewes, M.; Schowalter, M.; Müller-Caspary, K.; Krause, F.F.; Mehrtens, T.; Hartmann, J.-M.; Rosenauer, A. |
Quantitative HAADF STEM of SiGe in presence of amorphous surface layers from FIB preparation |
2018 |
Ultramicroscopy |
184 |
7 |
UA library record; WoS full record; WoS citing articles |
| Grieb, T.; Krause, F.F.; Schowalter, M.; Zillmann, D.; Sellin, R.; Müller-Caspary, K.; Mahr, C.; Mehrtens, T.; Bimberg, D.; Rosenauer, A. |
Strain analysis from nano-beam electron diffraction : influence of specimen tilt and beam convergence |
2018 |
Ultramicroscopy |
190 |
1 |
UA library record; WoS full record; WoS citing articles |
