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Author Title Year Publication Volume Times cited Additional Links
Biró, L.P.; Khanh, N.Q.; Horváth, Z.E.; Vértesy, Z.; Kocsonya, A.; Konya, Z.; Osváth, Z.; Koós, A.; Guylai, J.; Zhang, X.B.; Van Tendeloo, G.; Fonseca, A.; Nagy, J.B. Catalyst traces after chemical purification in CVD grown carbon nanotubes 2001 UA library record; WoS full record; WoS citing articles
Biró, L.P.; Khanh, N.Q.; Vértesy, Z.; Horváth, Z.E.; Osváth, Z.; Koós, A.; Gyulai, J.; Kocsonya, A.; Kónya, Z.; Zhang, X.B.; Van Tendeloo, G.; Fonseca, A.; Nagy, J.B.; Catalyst traces and other impurities in chemically purified carbon nanotubes grown by CVD 2002 Materials science and engineering: part C: biomimetic materials T2 – EMRS Spring Meeting, JUN 05-08, 2001, STRASBOURG, FRANCE 19 36 UA library record; WoS full record; WoS citing articles
Villani, K.; Kirschhock, C.E.A.; Liang, D.; Van Tendeloo, G.; Martens, J.A. Catalytic carbon oxidation over ruthenium-based catalysts 2006 Angewandte Chemie: international edition in English 45 36 UA library record; WoS full record; WoS citing articles
Marikutsa, A.; Krivetskiy, V.; Yashina, L.; Rumyantseva, M.; Konstantinova, E.; Ponzoni, A.; Comini, E.; Abakumov, A.; Gaskov, A. Catalytic impact of RuOx clusters to high ammonia sensitivity of tin dioxide 2012 Sensors and actuators : B : chemical T2 – 25th Eurosensors Conference, SEP 04-07, 2011, Athens, GREECE 175 20 UA library record; WoS full record; WoS citing articles
Neyts, E.C.; Shibuta, Y.; van Duin, A.C.T.; Bogaerts, A. Catalyzed growth of carbon nanotube with definable chirality by hybrid molecular dynamics-force biased Monte Carlo simulations 2010 ACS nano 4 129 UA library record; WoS full record; WoS citing articles
Marezio, M.; Alexandre, E.T.; Bordet, P.; Capponi, J.-J.; Chaillout, C.; Kopnin, E.M.; Loureiro, S.M.; Radaelli, P.G.; Van Tendeloo, G. Cation and anion disorder in HbBa2Can-1CunO2n+2+\delta 1995 Journal of superconductivity 8 4 UA library record; WoS full record; WoS citing articles
Van Tendeloo, G.; De Meulenaere, P.; Hervieu, M.; Letouze, F.; Martin, C. Cation ordering in Tl- and Hg-based superconducting materials 1996 UA library record
Van Tendeloo, G.; De Meulenaere, P.; Letouzé, F.; Martin, C.; Hervieu, M.; Raveau, B. Cation ordering in [(Tl, M)O] layers of “1202”-based cuprates : similarity to ordering in fcc-based alloys 1997 Journal of solid state chemistry 132 2 UA library record; WoS full record; WoS citing articles
Yan, L.; Niu, H.J.; Duong, G.V.; Suchomel, M.R.; Bacsa, J.; Chalker, P.R.; Hadermann, J.; Van Tendeloo, G.; Rosseinsky, M.J. Cation ordering within the perovskite block of a six-layer Ruddlesden-Popper oxide from layer-by-layer growth artificial interfaces in complex unit cells 2011 Chemical science 2 16 UA library record; WoS full record; WoS citing articles
Robin, I.-C.; Aichele, T.; Bougerol, C.; André, R.; Tatarenko, S.; Bellet-Amalric, E.; van Daele, B.; Van Tendeloo, G. CdSe quantum dot formation: alternative paths to relaxation of a strained CdSe layer and influence of the capping conditions 2007 Nanotechnology 18 8 UA library record; WoS full record; WoS citing articles
Aichele, T.; Robin, I.-C.; Bougerol, C.; André, R.; Tatarenko, S.; Van Tendeloo, G. CdSe quantum dot formation induced by amorphous Se 2007 Surface science : a journal devoted to the physics and chemistry of interfaces T2 – International Conference on NANO-Structures Self Assembling, JUL 02-06, 2006, Aix en Provence, FRANCE 601 UA library record; WoS full record
Neyts, E.C.; van Duin, A.C.T.; Bogaerts, A. Changing chirality during single-walled carbon nanotube growth : a reactive molecular dynamics/Monte Carlo study 2011 Journal of the American Chemical Society 133 116 UA library record; WoS full record; WoS citing articles
Blank, D.H.A.; Rijnders, A.J.H.M.; Verhoeven, M.A.J.; Bergs, R.M.H.; Rogalla, H.; Verbist, K.; Lebedev, O.; Van Tendeloo, G. Characterisation of multilayer ramp-type REBa2Cu3O7-\delta structures by scanning probe microscopy and high-resolution electron microscopy 1997 Journal of alloys and compounds T2 – Symposium on High Temperature Superconductor Thin Films, Growth, Mechanisms, Interfaces, Multilayers, at the 1996 Spring Meeting of the European-Materials-Society, June 04-07, 1996, Strasbourg, France 251 UA library record; WoS full record
Stuer, C.; Steegen, A.; van Landuyt, J.; Bender, H.; Maex, K. Characterisation of the local stress induced by shallow trench isolation and CoSi2 silicidation 2001 Institute of physics conference series UA library record; WoS full record;
Komendová, L. Characteristic length scales and vortex interactions in two-component superconducting systems 2013 UA library record
Yasuda, K.; Hisatsune, K.; Udoh, K.; Tanaka, Y.; Van Tendeloo, G.; van Landuyt, J. Characteristic mosaic texture related to orderingin AuCu-9at.%Ag pseudobinary alloy 1992 Dentistry in Japan 29 UA library record
Bultinck, E.; Bogaerts, A. Characterization of an Ar/O2 magnetron plasma by a multi-species Monte Carlo model 2011 Plasma sources science and technology 20 7 UA library record; WoS full record; WoS citing articles
d' Hondt, H. Characterization of anion deficient perovskites 2011 UA library record
Oleshko, V.; Gijbels, R.; Jacob, W.; Alfimov, M. Characterization of complex silver halide photographic systems by means of analytical electron microscopy 1995 Microbeam analysis 4 9 UA library record; WoS full record; WoS citing articles
Oleshko, V.; Gijbels, R.; Jacob, W.; Alfimov, M. Characterization of complex silver halide photographic systems by means of analytical electron microscopy 1994 Microbeam analysis 3 UA library record
Goessens, C.; Schryvers, D.; van Landuyt, J.; Amelinckx, S.; Geuens, I.; Gijbels, R.; Jacob, W.; Verbeeck, A.; de Keyzer, R. Characterization of crystal defects and analysis of iodide distribution in mixed tabular silver halide grains by conventional transmission electron microscopy, X-ray diffractometry and back-scattered electron imaging 1991 UA library record
Goessens, C.; Schryvers, D.; van Landuyt, J.; Amelinckx, S.; Verbeeck, A.; de Keyzer, R. Characterization of crystal defects in mixed tabular silver halide grains by conventional transmission electron microscopy and X-ray diffractometry 1991 Journal of crystal growth 110 40 UA library record; WoS full record; WoS citing articles
Oleshko, V.; Gijbels, R.; Jacob, W.; Lakiere, F.; van Daele, A.; Silaev, E.; Kaplun, L. Characterization of double structure tabular microcrystals of silver halide emulsions by means of electron energy-loss spectroscopy, zero-loss electron spectroscopic imaging and energy dispersive X-ray microanalysis 1995 Microscopy, microanalysis, microstructures 6 7 UA library record; WoS full record; WoS citing articles
Kirilenko, D. Characterization of graphene by electron diffraction 2012 UA library record
Volkov, V.V.; van Landuyt, J.; Marushkin, K.M.; Gijbels, R.; Férauge, C.; Vasilyev, M.G.; Shelyakin, A.A.; Sokolovsky, A.A. Characterization of LPE grown InGaAsP/InP heterostructures: IR-LED at 1.66 μm used for the remote monitoring of methane gas 1997 Journal of crystal growth 173 4 UA library record; WoS full record; WoS citing articles
Wiktor, C. Characterization of metal-organic frameworks and other porous materials via advanced transmission electron microscopy 2014 UA library record
Ahonen, P.P.; Kauppinen, E.I.; Tapper, U.; Nenonen, P.; Joubert, J.C.; Deschanvres, J.L.; Van Tendeloo, G. Characterization of MO derived nanostructured titania powders 1998 Electron microscopy: vol. 2 UA library record; WoS full record;
Mortet, V.; Zhang, L.; Echert, M.; Soltani, A.; d' Haen, J.; Douheret, O.; Moreau, M.; Osswald, S.; Neyts, E.; Troadec, D.; Wagner, P.; Bogaerts, A.; Van Tendeloo, G.; Haenen, K. Characterization of nano-crystalline diamond films grown under continuous DC bias during plasma enhanced chemical vapor deposition 2009 Materials Research Society symposium proceedings UA library record
Tirumalasetty, G.K.; van Huis, M.A.; Fang, C.M.; Xu, Q.; Tichelaar, F.D.; Hanlon, D.N.; Sietsma, J.; Zandbergen, H.W. Characterization of NbC and (Nb, Ti)N nanoprecipitates in TRIP assisted multiphase steels 2011 Acta materialia 59 58 UA library record; WoS full record; WoS citing articles
Verleysen, E.; Bender, H.; Richard, O.; Schryvers, D.; Vandervorst, W. Characterization of nickel silicides using EELS-based methods 2010 Journal of microscopy 240 11 UA library record; WoS full record; WoS citing articles