toggle visibility
Search within Results:
Display Options:

Select All    Deselect All
List View
 |   | 
   print
  Author Title Year Publication Volume Times cited Additional Links Links
Marezio, M.; Alexandre, E.T.; Bordet, P.; Capponi, J.-J.; Chaillout, C.; Kopnin, E.M.; Loureiro, S.M.; Radaelli, P.G.; Van Tendeloo, G. Cation and anion disorder in HbBa2Can-1CunO2n+2+\delta 1995 Journal of superconductivity 8 4 UA library record; WoS full record; WoS citing articles
Van Tendeloo, G.; De Meulenaere, P.; Letouzé, F.; Martin, C.; Hervieu, M.; Raveau, B. Cation ordering in [(Tl, M)O] layers of “1202”-based cuprates : similarity to ordering in fcc-based alloys 1997 Journal of solid state chemistry 132 2 UA library record; WoS full record; WoS citing articles pdf doi
Yan, L.; Niu, H.J.; Duong, G.V.; Suchomel, M.R.; Bacsa, J.; Chalker, P.R.; Hadermann, J.; Van Tendeloo, G.; Rosseinsky, M.J. Cation ordering within the perovskite block of a six-layer Ruddlesden-Popper oxide from layer-by-layer growth artificial interfaces in complex unit cells 2011 Chemical science 2 16 UA library record; WoS full record; WoS citing articles doi
Robin, I.-C.; Aichele, T.; Bougerol, C.; André, R.; Tatarenko, S.; Bellet-Amalric, E.; van Daele, B.; Van Tendeloo, G. CdSe quantum dot formation: alternative paths to relaxation of a strained CdSe layer and influence of the capping conditions 2007 Nanotechnology 18 8 UA library record; WoS full record; WoS citing articles pdf doi
Aichele, T.; Robin, I.-C.; Bougerol, C.; André, R.; Tatarenko, S.; Van Tendeloo, G. CdSe quantum dot formation induced by amorphous Se 2007 Surface science : a journal devoted to the physics and chemistry of interfaces T2 – International Conference on NANO-Structures Self Assembling, JUL 02-06, 2006, Aix en Provence, FRANCE 601 UA library record; WoS full record pdf doi
Neyts, E.C.; van Duin, A.C.T.; Bogaerts, A. Changing chirality during single-walled carbon nanotube growth : a reactive molecular dynamics/Monte Carlo study 2011 Journal of the American Chemical Society 133 116 UA library record; WoS full record; WoS citing articles pdf doi
Blank, D.H.A.; Rijnders, A.J.H.M.; Verhoeven, M.A.J.; Bergs, R.M.H.; Rogalla, H.; Verbist, K.; Lebedev, O.; Van Tendeloo, G. Characterisation of multilayer ramp-type REBa2Cu3O7-\delta structures by scanning probe microscopy and high-resolution electron microscopy 1997 Journal of alloys and compounds T2 – Symposium on High Temperature Superconductor Thin Films, Growth, Mechanisms, Interfaces, Multilayers, at the 1996 Spring Meeting of the European-Materials-Society, June 04-07, 1996, Strasbourg, France 251 UA library record; WoS full record doi
Stuer, C.; Steegen, A.; van Landuyt, J.; Bender, H.; Maex, K. Characterisation of the local stress induced by shallow trench isolation and CoSi2 silicidation 2001 Institute of physics conference series UA library record; WoS full record;
Bultinck, E.; Bogaerts, A. Characterization of an Ar/O2 magnetron plasma by a multi-species Monte Carlo model 2011 Plasma sources science and technology 20 7 UA library record; WoS full record; WoS citing articles pdf doi
Oleshko, V.; Gijbels, R.; Jacob, W.; Alfimov, M. Characterization of complex silver halide photographic systems by means of analytical electron microscopy 1995 Microbeam analysis 4 9 UA library record; WoS full record; WoS citing articles
Oleshko, V.; Gijbels, R.; Jacob, W.; Alfimov, M. Characterization of complex silver halide photographic systems by means of analytical electron microscopy 1994 Microbeam analysis 3 UA library record
Goessens, C.; Schryvers, D.; van Landuyt, J.; Amelinckx, S.; Verbeeck, A.; de Keyzer, R. Characterization of crystal defects in mixed tabular silver halide grains by conventional transmission electron microscopy and X-ray diffractometry 1991 Journal of crystal growth 110 40 UA library record; WoS full record; WoS citing articles
Oleshko, V.; Gijbels, R.; Jacob, W.; Lakiere, F.; van Daele, A.; Silaev, E.; Kaplun, L. Characterization of double structure tabular microcrystals of silver halide emulsions by means of electron energy-loss spectroscopy, zero-loss electron spectroscopic imaging and energy dispersive X-ray microanalysis 1995 Microscopy, microanalysis, microstructures 6 7 UA library record; WoS full record; WoS citing articles doi
Volkov, V.V.; van Landuyt, J.; Marushkin, K.M.; Gijbels, R.; Férauge, C.; Vasilyev, M.G.; Shelyakin, A.A.; Sokolovsky, A.A. Characterization of LPE grown InGaAsP/InP heterostructures: IR-LED at 1.66 μm used for the remote monitoring of methane gas 1997 Journal of crystal growth 173 4 UA library record; WoS full record; WoS citing articles
Tirumalasetty, G.K.; van Huis, M.A.; Fang, C.M.; Xu, Q.; Tichelaar, F.D.; Hanlon, D.N.; Sietsma, J.; Zandbergen, H.W. Characterization of NbC and (Nb, Ti)N nanoprecipitates in TRIP assisted multiphase steels 2011 Acta materialia 59 58 UA library record; WoS full record; WoS citing articles pdf doi
Verleysen, E.; Bender, H.; Richard, O.; Schryvers, D.; Vandervorst, W. Characterization of nickel silicides using EELS-based methods 2010 Journal of microscopy 240 11 UA library record; WoS full record; WoS citing articles doi
van Cleempoel, A.; Gijbels, R.; Claeys, M.; van den Heuvel, H. Characterization of ozonated C60 and C70 by high performance liquid chromatography and low- and high-energy collision-induced dissociation tandem mass spectrometry 1996 Rapid communications in mass spectrometry 10 10 UA library record; WoS full record; WoS citing articles
Colomer, J.-F.; Benoit, J.-M.; Stephan, C.; Lefrant, S.; Van Tendeloo, G.; Nagy, J.B. Characterization of single-wall carbon nanotubes produced by CCVD method 2001 Chemical physics letters 345 45 UA library record; WoS full record; WoS citing articles doi
de Vyt, A.; Gijbels, R.; Davock, H.; van Roost, C.; Geuens, I. Characterization of AgxAuy nano particles by TEM and STEM 1999 Journal of analytical atomic spectrometry 14 2 UA library record; WoS full record; WoS citing articles doi
Hervieu, M.; Martin, C.; Maignan, A.; Van Tendeloo, G.; Raveau, B. Charge ordering-disordering in Th-doped CaMnO3 1999 European physical journal : B : condensed matter and complex systems 10 6 UA library record; WoS full record; WoS citing articles pdf doi
Nikolaev, A.V.; Prassides, K.; Michel, K.H. Charge transfer and polymer phases in AC60 (A=K, Rb, Cs) fullerides 1998 The journal of chemical physics 108 14 UA library record; WoS full record; WoS citing articles doi
Riva, C.; Escorcia, R.A.; Govorov, A.O.; Peeters, F.M. Charged donors in quantum dots: finite difference and fractional dimensions results 2004 Physical review : B : condensed matter and materials physics 69 23 UA library record; WoS full record; WoS citing articles url doi
Hens, S.; van Landuyt, J.; Bender, H.; Boullart, W.; Vanhaelemeersch, S. Chemical and structural analysis of etching residue layers in semiconductor devices with energy filtering transmission electron microscopy 2001 Materials science in semiconductor processing 4 UA library record; WoS full record pdf doi
de Gryse, O.; Clauws, P.; Lebedev, O.; van Landuyt, J.; Vanhellemont, J.; Claeys, C.; Simoen, E. Chemical and structural characterization of oxygen precipitates in silicon by infrared spectroscopy and TEM 2001 Physica: B : condensed matter T2 – 21st International Conference on Defects in Semiconductors, JUL 16-20, 2001, GIESSEN, GERMANY 308 3 UA library record; WoS full record; WoS citing articles pdf doi
Struyf, H.; van Vaeck, L.; Kennis, P.; Gijbels, R.; van Grieken, R. Chemical characterization of neo-ceramic powders by time-of-flight and Fourier transform laser microprobe mass spectrometry 1996 Rapid communications in mass spectrometry 10 11 UA library record; WoS full record; WoS citing articles pdf doi
Verlinden, G.; Gijbels, R.; Geuens, I. Chemical microcharacterization of ultrathin iodide conversion layers and adsorbed thiocyanate surface layers on silver halide microcrystals with time-of-flight SIMS 2002 Microscopy and microanalysis 8 1 UA library record; WoS full record; WoS citing articles doi
Obradors, X.; Puig, T.; Pomar, A.; Sandiumenge, F.; Piñol, S.; Mestres, N.; Castaño, O.; Coll, M.; Cavallaro, A.; Palau, A.; Gázquez, J.; González, J.C.; Gutiérrez, J.; Romá, N.; Ricart, S.; Moretó, J.M.; Rossell, M.D.; Van Tendeloo, G. Chemical solution deposition: a path towards low cost coated conductors 2004 Superconductor science and technology 17 107 UA library record; WoS full record; WoS citing articles pdf doi
Vernochet, C.; Vannier, R.-N.; Huvé, M.; Pirovano, C.; Nowogrocki, G.; Mairesse, G.; Van Tendeloo, G. Chemical, structural and electrical characterizations in the BIZNVOX family 2000 Journal of materials chemistry 10 13 UA library record; WoS full record; WoS citing articles pdf doi
Abakumov, A.M.; Hadermann, J.; Van Tendeloo, G.; Antipov, E.V. Chemistry and structure of anion-deficient perovskites with translational interfaces 2008 Journal of the American Ceramic Society 91 39 UA library record; WoS full record; WoS citing articles pdf doi
Li, Y.; Yang, X.-Y.; Tian, G.; Vantomme, A.; Yu, J.; Van Tendeloo, G.; Su, B.-L. Chemistry of trimethyl aluminum: a spontaneous route to thermally stable 3D crystalline macroporous alumina foams with a hierarchy of pore sizes 2010 Chemistry of materials 22 38 UA library record; WoS full record; WoS citing articles doi
Select All    Deselect All
List View
 |   | 
   print

Save Citations:
Export Records: