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  Author Title Year Publication Volume Times cited Additional Links Links
Geuens, P.; Lebedev, O.I.; van Dyck, D.; Van Tendeloo, G. Accurate measurements of atomic displacements in La0.9Sr0.1MnO3 thin films grown on a SrTiO3 substrate 2000 UA library record
Lobato Hoyos, I.P.; van Dyck, D. An accurate parameterization for scattering factors, electron densities and electrostatic potentials for neutral atoms that obey all physical constraints 2014 Acta crystallographica: section A: foundations of crystallography 70 19 UA library record; WoS full record; WoS citing articles url doi
van Dyck, D.; Van Aert, S.; Croitoru, M. Atomic resolution electron tomography: a dream? 2006 International journal of materials research 97 6 UA library record; WoS full record; WoS citing articles pdf doi
Chen, J.H.; van Dyck, D.; op de Beeck, M.; van Landuyt, J. Computational comparisons between the conventional multislice method and the third-order multislice method for calculating high-energy electron diffraction and imaging 1997 Ultramicroscopy 69 11 UA library record; WoS full record; WoS citing articles
Van Aert, S.; van Dyck, D. Do smaller probes in a scanning transmission electron microscope result in more precise measurement of the distances between atom columns? 2001 Philosophical magazine: B: physics of condensed matter: electronic, optical and magnetic properties 81 11 UA library record; WoS full record; WoS citing articles pdf doi
van Dyck, D.; Lobato, I.; Chen, F.-R.; Kisielowski, C. Do you believe that atoms stay in place when you observe them in HREM? 2015 Micron 68 11 UA library record; WoS full record; WoS citing articles pdf doi
den Dekker, A.J.; Van Aert, S.; van Dyck, D.; van den Bos, A.; Geuens, P. Does a monochromator improve the precision in quantitative HRTEM? 2001 Ultramicroscopy 89 22 UA library record; WoS full record; WoS citing articles doi
De Meulenaere, P.; van Dyck, D.; Van Tendeloo, G.; van Landuyt, J. Dynamical electron diffraction in substitutionally disordered column structures 1995 Ultramicroscopy 60 14 UA library record; WoS full record; WoS citing articles pdf doi
Van Aert, S.; Geuens, P.; van Dyck, D.; Kisielowski, C.; Jinschek, J.R. Electron channelling based crystallography 2007 Ultramicroscopy 107 32 UA library record; WoS full record; WoS citing articles doi
Luyten, W.; Krekels, T.; Amelinckx, S.; Van Tendeloo, G.; van Dyck, D.; van Landuyt, J. Electron diffraction effects of conical, helically wound, graphite whiskers 1993 Ultramicroscopy 49 14 UA library record; WoS full record; WoS citing articles doi
Goessens, C.; Schryvers, D.; van Dyck, D.; van Landuyt, J.; de Keyzer, R. Electron diffraction evidence for ordering of interstitial silver ions in silver bromide microcrystals 1994 Icem 13 UA library record; WoS full record;
Goessens, C.; Schryvers, D.; van Dyck, D.; van Landuyt, J.; de Keyzer, R. Electron-diffraction evidence for ordering of interstitial silver ions in silver bromide microcrystals 1994 Physica status solidi: A 143 7 UA library record; WoS full record; WoS citing articles pdf doi
Zhang, X.B.; Van Tendeloo, G.; van Landuyt, J.; van Dyck, D.; Briers, J.; Bao, Y.; Geise, H.J. An electron microscopic study of highly oriented undoped and FeCl3-doped poly (p-phenylenevinylene) 1996 Macromolecules 29 10 UA library record; WoS full record; WoS citing articles pdf doi
Amelinckx, S.; van Dyck, D.; van Landuyt, J.; Van Tendeloo, G. Electron microscopy: principles and fundamentals 1997 UA library record
Caen, J.; Schalm, O.; van der Snickt, G.; van der Linden, V.; Frederickx, P.; Schryvers, D.; Janssens, K.; Cornelis, E.; van Dyck, D.; Schreiner, M. Enamels in stained-glass windows : preparation, chemical composition, microstructure and causes of deterioration 2005 UA library record
Amelinckx, S.; van Dyck, D.; van Landuyt, J.; Van Tendeloo, G. Handbook of microscopy: applications in materials science, solid-state physics and chemistry 1997 UA library record
Van Aert, S.; den Dekker, A.J.; van Dyck, D.; van den Bos, A. High-resolution electron microscopy and electron tomography: resolution versus precision 2002 Journal of structural biology 138 33 UA library record; WoS full record; WoS citing articles doi
Van Aert, S.; den Dekker, A.J.; van den Bos, A.; van Dyck, D. High-resolution electron microscopy : from imaging toward measuring 2002 IEEE transactions on instrumentation and measurement 51 13 UA library record; WoS full record; WoS citing articles doi
Cloetens, P.; Ludwig, W.; Baruchel, J.; van Dyck, D.; van Landuyt, J.; Guigay, J.P.; Schlenker, M. Holotomography: quantitative phase tomography with micrometer resolution using hard synchrotron radiation X-rays 1999 Applied physics letters 75 481 UA library record; WoS full record; WoS citing articles pdf doi
Van Aert, S.; den Dekker, A.J.; van Dyck, D. How to optimize the experimental design of quantitative atomic resolution TEM experiments? 2004 Micron 35 14 UA library record; WoS full record; WoS citing articles pdf doi
Lobato, I.; van Dyck, D. Improved multislice calculations for including higher-order Laue zones effects 2012 Ultramicroscopy 119 6 UA library record; WoS full record; WoS citing articles doi
Fanidis, C.; van Dyck, D.; van Landuyt, J. Inelastic scattering of high-energy electrons in a crystal in thermal equilibrium with the environment: 1: theoretical framework 1992 Ultramicroscopy 41 17 UA library record; WoS full record; WoS citing articles doi
Fanidis, C.; van Dyck, D.; van Landuyt, J. Inelastic scattering of high-energy electrons in a crystal in thermal equilibrium with the environment: part 2: solution of the equations and applications to concrete cases 1993 Ultramicroscopy 48 6 UA library record; WoS full record; WoS citing articles
van Dyck, D.; Van Aert, S.; den Dekker, A.J.; van den Bos, A. Is atomic resolution transmission electron microscopy able to resolve and refine amorphous structures? 2003 Ultramicroscopy 98 26 UA library record; WoS full record; WoS citing articles doi
den Dekker, A.J.; Van Aert, S.; van den Bos, A.; van Dyck, D. Maximum likelihood estimation of structure parameters from high resolution electron microscopy images: part 1: a theoretical framework 2005 Ultramicroscopy 104 70 UA library record; WoS full record; WoS citing articles pdf doi
Van Aert, S.; den Dekker, A.J.; van den Bos, A.; van Dyck, D.; Chen, J.H. Maximum likelihood estimation of structure parameters from high resolution electron microscopy images : part 2 : a practical example 2005 Ultramicroscopy 104 37 UA library record; WoS full record; WoS citing articles pdf doi
Croitoru, M.D.; van Dyck, D.; Liu, Y.Z.; Zhang, Z. Measurement of specimen thickness by phase change determination in TEM 2008 Ultramicroscopy 108 2 UA library record; WoS full record; WoS citing articles doi
van den Broek, W.; Van Aert, S.; van Dyck, D. A model based atomic resolution tomographic algorithm 2009 Ultramicroscopy 109 17 UA library record; WoS full record; WoS citing articles doi
Chen, J.H.; van Dyck, D.; op de Beeck, M.; Broeckx, J.; van Landuyt, J. Modification of the multislice method for calculating coherent STEM images 1995 Physica status solidi: A: applied research 150 5 UA library record; WoS full record; WoS citing articles pdf doi
Van Aert, S.; den Dekker, A.J.; van Dyck, D.; van den Bos, A. The notion of resolution 2008 UA library record
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