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Atomic spectroscopy”. Bings NH, Bogaerts A, Broekaert JAC, Analytical chemistry 85, 670 (2013). http://doi.org/10.1021/ac3031459
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Atomic spectroscopy”. Bings NH, Bogaerts A, Broekaert JAC, Analytical chemistry 80, 4317 (2008). http://doi.org/10.1021/ac8006297
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Atomic spectroscopy”. Bings NH, Bogaerts A, Broekaert JAC, Analytical chemistry 78, 3917 (2006). http://doi.org/10.1021/ac060597m
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Atomic spectroscopy”. Bings NH, Bogaerts A, Broekaert JAC, Analytical chemistry 76, 3313 (2004). http://doi.org/10.1021/ac040052x
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Atomic spectroscopy”. Bings NH, Bogaerts A, Broekaert JAC, Analytical chemistry 74, 2691 (2002). http://doi.org/10.1021/ac020190r
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Atomic spectroscopy: a review”. Bings NH, Bogaerts A, Broekaert JAC, Analytical chemistry 82, 4653 (2010). http://doi.org/10.1021/ac1010469
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Automated particle analysis of populations of silver halide microcrystals by electron probe microanalysis under cryogenic conditions”. Gregory CL, Nullens HA, Gijbels RH, van Espen PJ, Geuens I, de Keyzer R, Analytical chemistry 70, 2551 (1998). http://doi.org/10.1021/ac9710644
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Expansion of laser-generated plumes near the plasma ignition threshold”. Balazs L, Gijbels R, Vertes A, Analytical chemistry 63, 314 (1991)
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Hydrodynamic model of matrix-assisted laser desorption mass spectrometry”. Vertes A, Irinyi G, Gijbels R, Analytical chemistry 65, 2389 (1993). http://doi.org/10.1021/ac00065a036
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Influence of axial and radial diffusion processes on the analytical performance of a glow discharge cell”. van Straaten M, Gijbels R, Vertes A, Analytical chemistry 64, 1855 (1992). http://doi.org/10.1021/ac00041a021
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Metal-assisted secondary ion mass spectrometry: the influence of Ag and Au deposition on molecular ion yields”. Adriaensen L, Vangaever F, Gijbels R, Analytical chemistry 76, 6777 (2004). http://doi.org/10.1021/ac049108d
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Microprobe speciation analysis of inorganic solids by Fourier transform laser mass spectrometry”. Poels K, van Vaeck L, Gijbels R, Analytical chemistry 70, 504 (1998). http://doi.org/10.1021/ac9709108
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Optimized transport setup for high repetition rate pulse-separated analysis in laser ablation-inductively coupled plasma mass spectrometry”. Lindner H, Autrique D, Garcia CC, Niemax K, Bogaerts A, Analytical chemistry 81, 4241 (2009). http://doi.org/10.1021/ac802627x
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Simulation and experimental studies on plasma temperature, flow velocity, and injector diameter effects for an inductively coupled plasma”. Lindner H, Murtazin A, Groh S, Niemax K, Bogaerts A, Analytical chemistry 83, 9260 (2011). http://doi.org/10.1021/ac201699q
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Theoretical characterization of an atmospheric pressure glow discharge used for analytical spectrometry”. Martens T, Mihailova D, van Dijk J, Bogaerts A, Analytical chemistry 81, 9096 (2009). http://doi.org/10.1021/ac9017742
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Two-dimensional model of a direct current glow discharge : description of the argon metastable atoms, sputtered atoms and ions”. Bogaerts A, Gijbels R, Analytical chemistry 68, 2676 (1996). http://doi.org/10.1021/ac951206z
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Two-dimensional model of a direct current glow discharge: description of the electrons, argon ions and fast argon atoms”. Bogaerts A, Gijbels R, Goedheer WJ, Analytical chemistry 68, 2296 (1996). http://doi.org/10.1021/ac9510651
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Characterization of a degraded cadmium yellow (CdS) pigment in an oil painting by means of synchrotron radiation based X-ray techniques”. van der Snickt G, Dik J, Cotte M, Janssens K, Jaroszewicz J, de Nolf W, Groenewegen J, van der Loeff L, Analytical chemistry 81, 2600 (2009). http://doi.org/10.1021/AC802518Z
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In vivo investigation of the distribution and the local speciation of selenium in Allium cepa L. by means of microscopic X-ray absorption near-edge structure spectroscopy and confocal microscopic X-ray fluorescence analysis”. Bulska E, Wysocka IA, Wierzbicka MH, Proost K, Janssens K, Falkenberg G, Analytical chemistry 78, 7616 (2006). http://doi.org/10.1021/AC060380S
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A Monte Carlo model for studying the microheterogeneity of trace elements in reference materials by means of synchrotron microscopic X-ray fluorescence”. Kempenaers L, Janssens K, Vincze L, Vekemans B, Somogyi A, Drakopoulos M, Simionovici AS, Adams F, Analytical chemistry 74, 5017 (2002). http://doi.org/10.1021/AC025662G
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Quantitative trace element analysis of individual fly ash particles by means of X-ray microfluorescence”. Vincze L, Somogyi A, Osán J, Vekemans B, Török S, Janssens K, Adams F, Analytical chemistry 74, 1128 (2002). http://doi.org/10.1021/AC010789B
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Visualization of a lost painting by Vincent van Gogh using synchrotron radiation based X-ray fluorescence elemental mapping”. Dik J, Janssens K, van der Snickt G, van der Loeff L, Rickers K, Cotte M, Analytical chemistry 80, 6436 (2008). http://doi.org/10.1021/AC800965G
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Correlation between the fluorination degree of perfluorinated zinc phthalocyanines, their singlet oxygen generation ability, and their photoelectrochemical response for phenol sensing”. Neven L, Barich H, Ching HYV, Khan SU, Colomier C, Patel HH, Gorun SM, Verbruggen S, Van Doorslaer S, De Wael K, Analytical chemistry 94, 5221 (2022). http://doi.org/10.1021/ACS.ANALCHEM.1C04357
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Direct sensing of superoxide and its relatives reactive oxygen and nitrogen species in phosphate buffers during cold atmospheric plasmas exposures”. Girard-Sahun F, Lefrancois P, Badets V, Arbault S, Clement F, Analytical Chemistry 94, 5555 (2022). http://doi.org/10.1021/ACS.ANALCHEM.1C04998
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Photoelectrochemical behavior of phthalocyanine-sensitized TiO₂, in the presence of electron-shuttling mediators”. Khan SU, Trashin S, Beltran V, Korostei YS, Pelmus M, Gorun SM, Dubinina T V, Verbruggen SW, De Wael K, Analytical chemistry 94, 12723 (2022). http://doi.org/10.1021/ACS.ANALCHEM.2C02210
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Absorption correction for X-ray-fluorescence analysis of aerosol loaded filters”. Adams FC, Van Grieken RE, Analytical chemistry 47, 1767 (1975). http://doi.org/10.1021/AC60361A040
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Absorption correction in electron probe x-ray microanalysis of thin samples”. Markowicz AA, Storms HM, Van Grieken RE, Analytical chemistry 58, 1282 (1986). http://doi.org/10.1021/AC00298A003
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Absorption correction via scattered radiation in energy-dispersive X-ray fluorescence analysis for samples of variable composition and thickness”. Van Dyck PM, Van Grieken RE, Analytical chemistry 52, 1859 (1980). http://doi.org/10.1021/AC50062A020
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Assessing the molecular weight of a conducting polymer by grazing emission XRF”. Blockhuys F, Claes M, Van Grieken R, Geise HJ, Analytical chemistry 72, 3366 (2000). http://doi.org/10.1021/AC990877K
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Atomic number correction in electron probe X-ray microanalysis of curved samples and particles”. Markowicz AA, Van Grieken RE, Analytical chemistry 56, 2798 (1984). http://doi.org/10.1021/AC00278A036
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