Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Verleysen, E.; Bender, H.; Richard, O.; Schryvers, D.; Vandervorst, W. |
Characterization of nickel silicides using EELS-based methods |
2010 |
Journal of microscopy |
240 |
11 |
UA library record; WoS full record; WoS citing articles |
Yang, Z.; Schryvers, D.; Roels, F.; d' Haese, P.C.; de Broe, M.E. |
Demonstration of lanthanum in liver cells by energy-dispersive X-ray spectroscopy, electron energy loss spectroscopy and high-resolution transmission electron microscopy |
2006 |
Journal of microscopy |
223 |
29 |
UA library record; WoS full record; WoS citing articles |
Oleshko, V.; Gijbels, R.; Jacob, W. |
Energy-filtering TEM and electron energy-loss spectroscopy of double structure tabular microcrystals of silver halide emulsions |
1996 |
Journal of microscopy |
183 |
8 |
UA library record; WoS full record; WoS citing articles |
Gregory, C.; Gijbels, R.; Jacob, W.; Geuens, I.; van Roost, C.; de Keyzer, R. |
Evaluation of characterization methods for thin sections of silver halide microcrystals by analytical electron microscopy |
1997 |
Journal of microscopy |
188 |
6 |
UA library record; WoS full record; WoS citing articles |
Potapov, P.L.; Kulkova, S.E.; Schryvers, D. |
Study of changes in L32 EELS ionisation edges upon formation of Ni-based intermetallic compounds |
2003 |
Journal of microscopy |
210 |
11 |
UA library record; WoS full record; WoS citing articles |
Mehta, A.N.; Zhang, H.; Dabral, A.; Richard, O.; Favia, P.; Bender, H.; Delabie, A.; Caymax, M.; Houssa, M.; Pourtois, G.; Vandervorst, W. |
Structural characterization of SnS crystals formed by chemical vapour deposition |
2017 |
Journal of microscopy
T2 – 20th International Conference on Microscopy of Semiconducting Materials, (MSM), APR 09-13, 2017, Univ Oxford, Univ Oxford, Oxford, ENGLAND |
268 |
2 |
UA library record; WoS full record; WoS citing articles |
Cautaerts, N.; Delville, R.; Schryvers, D. |
ALPHABETA: a dedicated open-source tool for calculating TEM stage tilt angles |
2019 |
Journal of microscopy |
273 |
2 |
UA library record; WoS full record; WoS citing articles |
Lu, J.; Bartholomeeusen, E.; Sels, B.F.; Schryvers, D. |
Internal architecture of coffin-shaped ZSM-5 zeolite crystals with hourglass contrast unravelled by focused ion beam-assisted transmission electron microscopy: INTERNAL ARCHITECTURE OF COFFIN-SHAPED |
2017 |
Journal of microscopy |
265 |
4 |
UA library record; WoS full record; WoS citing articles |
Cao, S.; Tirry, W.; van den Broek, W.; Schryvers, D. |
Optimization of a FIB/SEM slice-and-view study of the 3D distribution of Ni4Ti3 precipitates in NiTi |
2009 |
Journal of microscopy |
233 |
22 |
UA library record; WoS full record; WoS citing articles |
Montoya, E.; Bals, S.; Van Tendeloo, G. |
Redeposition and differential sputtering of La in transmission electron microscopy samples of LaAIO3/SrTiO3 multilayers prepared by focused ion beam |
2008 |
Journal of microscopy |
231 |
|
UA library record; WoS full record |
Ramachandran, D.; Egoavil, R.; Crabbe, A.; Hauffman, T.; Abakumov, A.; Verbeeck, J.; Vandendael, I.; Terryn, H.; Schryvers, D. |
TEM and AES investigations of the natural surface nano-oxide layer of an AISI 316L stainless steel microfibre |
2016 |
Journal of microscopy |
264 |
12 |
UA library record; WoS full record; WoS citing articles |