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| Record | |||||
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| Author | van Put, A.; Vertes, A.; Wegrzynek, D.; Treiger, B.; Van Grieken, R. | ||||
| Title | Quantitative characterization of individual particle surfaces by fractal analysis of scanning electron microscope images | Type | A1 Journal article | ||
| Year | 1994 | Publication | Fresenius' journal of analytical chemistry | Abbreviated Journal | |
| Volume | 350 | Issue | Pages | 440-447 | |
| Keywords | A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) | ||||
| Abstract | |||||
| Address | |||||
| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | Editor | |||
| Language | Wos | A1994PR64400005 | Publication Date | 2004-10-19 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 0937-0633; 1432-1130 | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor | Times cited | Open Access | |||
Notes  |
Approved | no | |||
| Call Number | UA @ admin @ c:irua:9505 | Serial | 8442 | ||
| Permanent link to this record | |||||