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Title
Year
Publication
Volume
Times cited
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Verlinden, G.
;
Gijbels, R.
;
Geuens, I.
;
de Keyzer, R.
Chemical surface characterization of complex AgX microcrystals by imaging TOF-SIMS and dual beam depth profiling
2000
UA library record
Verlinden, G.
;
Gijbels, R.
;
Geuens, I.
;
de Keyzer, R.
Surface analysis of halide distributions in complex AgX microcrystals by imaging time-of-flight SIMS (TOF-SIMS)
1999
Journal of analytical atomic spectrometry
14
10
UA library record
;
WoS full record
;
WoS citing articles
Verlinden, G.
;
Gijbels, R.
;
Geuens, I.
;
de Keyzer, R.
Surface analysis of halide distributions in complex AgX microcrystals by imaging time-of-flight SIMS (TOF-SIMS)
1998
UA library record