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Author | Pennycook, T.J.; Martinez, G.T.; Nellist, P.D.; Meyer, J.C. | ||||
Title | High dose efficiency atomic resolution imaging via electron ptychography | Type | A1 Journal article | ||
Year | 2019 | Publication | Ultramicroscopy | Abbreviated Journal | Ultramicroscopy |
Volume | 196 | Issue | 196 | Pages | 131-135 |
Keywords | A1 Journal article; Electron microscopy for materials research (EMAT) | ||||
Abstract | Radiation damage places a fundamental limitation on the ability of microscopy to resolve many types of materials at high resolution. Here we evaluate the dose efficiency of phase contrast imaging with electron ptychography. The method is found to be far more resilient to temporal incoherence than conventional and spherical aberration optimized phase contrast imaging, resulting in significantly greater clarity at a given dose. This robustness is explained by the presence of achromatic lines in the four dimensional ptychographic dataset. | ||||
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Corporate Author | Thesis | ||||
Publisher | Place of Publication | Editor | |||
Language ![]() |
Wos | 000451180800018 | Publication Date | 2018-10-18 | |
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | 0304-3991 | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
Impact Factor | 2.843 | Times cited | 1 | Open Access | |
Notes | Approved | Most recent IF: 2.843 | |||
Call Number | UA @ admin @ c:irua:165939 | Serial | 6301 | ||
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