| |
Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Links |
|
|
Jones, L.; Martinez, G.T.; Béché, A.; Van Aert, S.; Nellist, P.D. |
Getting the best from an imperfect detector : an alternative normalisation procedure for quantitative HAADF STEM |
2014 |
Microscopy and microanalysis |
20 |
|
UA library record |
|
|
|
Neelisetty, K.K.; Kumar C.N., S.; Kashiwar, A.; Scherer, T.; Chakravadhanula, V.S.K.; Kuebel, C. |
Novel thin film lift-off process for in situ TEM tensile characterization |
2021 |
Microscopy And Microanalysis |
27 |
|
UA library record |
|
|
|
Yu, C.-P.; Friedrich, T.; Jannis, D.; Van Aert, S.; Verbeeck, J. |
Real-Time Integration Center of Mass (riCOM) Reconstruction for 4D STEM |
2022 |
Microscopy and microanalysis |
|
7 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Verlinden, G.; Gijbels, R.; Geuens, I. |
Chemical microcharacterization of ultrathin iodide conversion layers and adsorbed thiocyanate surface layers on silver halide microcrystals with time-of-flight SIMS |
2002 |
Microscopy and microanalysis |
8 |
1 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Jinschek, J.R.; Bals, S.; Gopal, V.; Xus, X.; Kisielowski, C. |
Probing local stoichiometry in InGaN based quantum wells of solid-state LEDs |
2004 |
Microscopy and microanalysis |
10 |
|
UA library record |
|
|
|
Nord, M.; Verbeeck, J. |
Towards Reproducible and Transparent Science of (Big) Electron Microscopy Data Using Version Control |
2019 |
Microscopy and microanalysis
T2 – Microscopy & Microanalysis 2019, 4-8 August, 2019, Portland, Oregon |
25 |
|
UA library record |
|
|
|
Nord, M.; Verbeeck, J. |
Open Source Development Tools for Robust and Reproducible Electron Microscopy Data Analysis |
2019 |
Microscopy And Microanalysis |
25 |
|
|
|
