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| Author | Zelaya, E.; Schryvers, D. | ||||
| Title | FCC surface precipitation in Cu-Zn-Al after low angle GA+ ion irradiation | Type | A1 Journal article | ||
| Year | 2010 | Publication | Materials transactions | Abbreviated Journal | Mater Trans |
| Volume | 51 | Issue | 12 | Pages | 2177-2180 |
Keywords  |
A1 Journal article; Electron microscopy for materials research (EMAT) | ||||
| Abstract | The precipitation of a disordered FCC surface structure after low angle Ga+ ion irradiation during focused ion beam thinning of a B2 Cu-Zn-Al alloy with e/a=1.48 is reported. Conventional as well as high-resolution transmission electron microscopy techniques reveal FCC layers on both sides of the thinned sample. The occurrence of this structure is attributed to disordering and dezincification of the alloy resulting from the sputtering process during the irradiation. Changes in crystallographic sample orientation with respect to the incoming ion beam do not have a significant effect on the appearance of the FCC surface structure. | ||||
| Address | |||||
| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | Sendai | Editor | ||
| Language | Wos | 000287390300009 | Publication Date | 2010-11-25 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 1347-5320;1345-9678; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor | 0.713 | Times cited | 2 | Open Access | |
| Notes | Bof; Fwo | Approved | Most recent IF: 0.713; 2010 IF: 0.787 | ||
| Call Number | UA @ lucian @ c:irua:85997 | Serial | 1175 | ||
| Permanent link to this record | |||||
| Author | Zelaya, E.; Schryvers, D. | ||||
| Title | Reducing the formation of FIB-induced FCC layers on Cu-Zn-Al austenite | Type | A1 Journal article | ||
| Year | 2011 | Publication | Microscopy research and technique | Abbreviated Journal | Microsc Res Techniq |
| Volume | 74 | Issue | 1 | Pages | 84-91 |
| Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT) | ||||
| Abstract | The irradiation effects of thinning a sample of a Cu-Zn-Al shape memory alloy to electron transparency by a Ga+ focused ion beam were investigated. This thinning method was compared with conventional electropolishing and Ar+ ion milling. No implanted Ga was detected but surface FCC precipitation was found as a result of the focused ion beam sample preparation. Decreasing the irradiation dose by lowering the energy and current of the Ga+ ions did not lead to a complete disappearance of the FCC structure. The latter could only be removed after gentle Ar+ ion milling of the sample. It was further concluded that the precipitation of the FCC is independent of the crystallographic orientation of the surface. | ||||
| Address | |||||
| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | New York, N.Y. | Editor | ||
| Language | Wos | 000285976000012 | Publication Date | 2010-05-25 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 1059-910X; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor | 1.147 | Times cited | 2 | Open Access | |
| Notes | Approved | Most recent IF: 1.147; 2011 IF: 1.792 | |||
| Call Number | UA @ lucian @ c:irua:85994 | Serial | 2852 | ||
| Permanent link to this record | |||||