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Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Links |
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Geuens, I.; Gijbels, R.; Jacob, W. |
Depth profiling of silver halide microcrystals |
1991 |
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UA library record |
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Ignatova, V.A.; Conard, T.; Möller, W.; Vandervorst, W.; Gijbels, R. |
Depth profiling of ZrO2/SiO2/Si stacks : a TOF-SIMS and computer simulation study |
2004 |
Applied surface science |
231/232 |
4 |
UA library record; WoS full record; WoS citing articles |
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Bogaerts, A.; Gijbels, R. |
Description of the argon-excited levels in a radio-frequency and direct current glow discharge |
2000 |
Spectrochimica acta: part B : atomic spectroscopy |
55 |
24 |
UA library record; WoS full record; WoS citing articles |
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De Bie, C.; Martens, T.; van Dijk, J.; van der Mullen, J.J.A.M.; Bogaerts, A. |
Description of the plasma chemistry in an atmospheric pressure CH4 dielectric barrier discharge using a two dimensional fluid model |
2009 |
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UA library record; WoS full record; WoS citing articles |
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Bogaerts, A.; van Straaten, M.; Gijbels, R. |
Description of the thermalization process of the sputtered atoms in a glow discharge using a 3-dimensional Monte Carlo method |
1995 |
Journal of applied physics |
77 |
87 |
UA library record; WoS full record; WoS citing articles |
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Robben, J.; Dufour, D.; Gijbels, R. |
Design and development of a new program for data processing of mass spectra acquired by means of a high-resolution double-focusing glow-discharge mass spectrometer |
2001 |
Fresenius' journal of analytical chemistry |
370 |
2 |
UA library record; WoS full record; WoS citing articles |
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van Roy, W.; Struyf, H.; van Vaeck, L.; Gijbels, R.; Caravatti, P. |
Desorption-ionization of organic compounds studied by Fourier transform laser microprobe mass spectrometry |
1994 |
Rapid communications in mass spectrometry |
8 |
5 |
UA library record; WoS full record; WoS citing articles |
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Cidu, R.; Fanfani, L.; Shaud, P.; Edmunds, W.M.; Van 't dack, L.; Gijbels, R. |
Determination of gold at the ultratrace level in natural waters |
1994 |
Analytica chimica acta |
296 |
20 |
UA library record; WoS full record; WoS citing articles |
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van Grieken, R.; Gijbels, R.; Speecke, A.; Hoste, J. |
Determination of oxygen, silicon, phosphorus and copper in iron and steel by 14 MeV neutron activation analysis |
1971 |
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UA library record |
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Shazali, I.; Van 't dack, L.; Gijbels, R. |
Determination of precious metals in ores and rocks by thermal neutron activation/\gamma-spectrometry after preconcentration by nickel sulphide fire assay and coprecipitation with tellurium |
1987 |
Analytica chimica acta |
196 |
49 |
UA library record; WoS full record; WoS citing articles |
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Held, A.; Taylor, P.; Ingelbrecht, C.; de Bièvre, P.; Broekaert, J.; van Straaten, M.; Gijbels, R. |
Determination of scandium in high-purity titanium using inductively coupled plasma mass spectrometry and glow discharge mass spectrometry as part of its certification as a reference material |
1995 |
Journal of analytical atomic spectrometry |
10 |
6 |
UA library record; WoS full record; WoS citing articles |
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van Grieken, R.; Gijbels, R.; Speecke, A.; Hoste, J. |
The determination of silicon in steel by 14-mev neutron activation analysis |
1968 |
Analytica chimica acta |
43 |
19 |
UA library record; WoS full record; WoS citing articles |
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Charlier, E.; Gijbels, R.; Van Doorselaer, M.; De Keyzer, R. |
Determination of the silver sulphide cluster size distribution via computer simulations |
2000 |
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UA library record; WoS full record; |
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Gijbels, R. |
Development of a Fourier transform laser microprobe mass spectrometer with external ion source |
1993 |
ICR/Ion trap newsletter |
30 |
|
UA library record |
|
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Huygh, S.; Bogaerts, A.; van Duin, A.C.T.; Neyts, E.C. |
Development of a ReaxFF reactive force field for intrinsic point defects in titanium dioxide |
2014 |
Computational materials science |
95 |
15 |
UA library record; WoS full record; WoS citing articles |
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Adriaens, A.; Goossens, D.; Pijpers, A.; Van Tendeloo, G.; Gijbels, R. |
Dissolution study of potassium feldspars using hydrothermally treated sanidine as an example |
1999 |
Surface and interface analysis |
27 |
4 |
UA library record; WoS full record; WoS citing articles |
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Chen, Z.Y.; Bogaerts, A.; Depla, D.; Ignatova, V. |
Dynamic Monte Carlo simulation for reactive sputtering of aluminium |
2003 |
Nuclear instruments and methods in physics research: B |
207 |
20 |
UA library record; WoS full record; WoS citing articles |
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Neyts, E.; Bogaerts, A.; van de Sanden, M.C.M. |
Effect of hydrogen on the growth of thin hydrogenated amorphous carbon films from thermal energy radicals |
2006 |
Applied physics letters |
88 |
35 |
UA library record; WoS full record; WoS citing articles |
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Bogaerts, A.; Gijbels, R. |
Effect of small amounts of hydrogen added to argon glow discharges: hybrid Monte-Carlo-fluid model |
2002 |
Physical review : E : statistical, nonlinear, and soft matter physics |
65 |
33 |
UA library record; WoS full record; WoS citing articles |
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Bultinck, E.; Bogaerts, A. |
The effect of the magnetic field strength on the sheath region of a dc magnetron discharge |
2008 |
Journal of physics: D: applied physics |
41 |
16 |
UA library record; WoS full record; WoS citing articles |
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Bogaerts, A.; Gijbels, R. |
Effects of adding hydrogen to an argon glow discharge: overview of relevant processes and some qualitative explanations |
2000 |
Journal of analytical atomic spectrometry |
15 |
58 |
UA library record; WoS full record; WoS citing articles |
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Gijbels, R.; Adriaens, A. |
Einleitung zu den massenspektrometrischen Methoden |
2000 |
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UA library record |
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Okhrimovskyy, A.; Bogaerts, A.; Gijbels, R. |
Electron anisotropic scattering in gases: a formula for Monte Carlo simulations |
2002 |
Physical review : E : statistical, nonlinear, and soft matter physics |
65 |
57 |
UA library record; WoS full record; WoS citing articles |
|
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Yan, M.; Bogaerts, A.; Goedheer, W.J.; Gijbels, R. |
Electron energy distribution function in capacitively coupled RF discharges: differences between electropositive Ar and electronegative SiH4 discharges |
2000 |
Plasma sources science and technology |
9 |
21 |
UA library record; WoS full record; WoS citing articles |
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Volkov, V.V.; Luyten, W.; van Landuyt, J.; Férauge, C.; Oksenoid, K.G.; Gijbels, R.; Vasilev, M.G.; Shelyakin, A.A.; Lazarev, V.B. |
Electron microscopy and mass-spectrometry study of In GaAsP/InP heterostructures (p-i-n diodes) grown by liquid phase epitaxy |
1993 |
Physica status solidi: A: applied research |
140 |
7 |
UA library record; WoS full record; WoS citing articles |
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Oleshko, V.; Gijbels, R.; Amelinckx, S. |
Electron microscopy and scanning microanalysis |
2000 |
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UA library record |
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Oleshko, V.P.; Gijbels, R.; Amelinckx, S. |
Electron microscopy, nanoscopy, and scanning micro- and nanoanalysis |
2013 |
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UA library record |
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Van 't dack, L.; Blommaert, W.; Vandelannoote, R.; Gijbels, R.; van Grieken, R. |
Equilibrium constants for trace elements in natural waters |
1983 |
Reviews in analytical chemistry |
7 |
|
UA library record |
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Gregory, C.; Gijbels, R.; Jacob, W.; Geuens, I.; van Roost, C.; de Keyzer, R. |
Evaluation of characterization methods for thin sections of silver halide microcrystals by analytical electron microscopy |
1997 |
Journal of microscopy |
188 |
6 |
UA library record; WoS full record; WoS citing articles |
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van Roy, W.; van Vaeck, L.; Gijbels, R. |
Evaluation of the laser microprobe with time-of-flight mass spectrometer for organic surface and micro-analysis |
1992 |
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UA library record |
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