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Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Links |
|
|
Bogaerts, A.; Chen, Z.; Bleiner, D. |
Laser ablation of copper in different background gases: comparative study by numerical modeling and experiments |
2006 |
Journal of analytical atomic spectrometry |
21 |
67 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Bogaerts, A.; Gijbels, R. |
Modeling of a microsecond pulsed glow discharge: behavior of the argon excited levels and of the sputtered copper atoms and ions |
2001 |
Journal of analytical atomic spectrometry |
16 |
36 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Bogaerts, A.; Gijbels, R.; Jackson, G.P. |
Modeling of a millisecond pulsed glow discharge: investigation of the afterpeak |
2003 |
Journal of analytical atomic spectrometry |
18 |
42 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Bogaerts, A.; Gijbels, R. |
Modeling of argon direct current glow discharges and comparison with experiment: how good is the agreement? |
1998 |
Journal of analytical atomic spectrometry |
13 |
24 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Bogaerts, A.; Chen, Z. |
Nanosecond laser ablation of Cu: modeling of the expansion in He background gas, and comparison with expansion in vacuum |
2004 |
Journal of analytical atomic spectrometry |
19 |
39 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Bogaerts, A.; Gijbels, R. |
Relative sensitivity factors in glow discharge mass spectrometry: the role of charge transfer ionization |
1996 |
Journal of analytical atomic spectrometry |
11 |
38 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Bogaerts, A.; Gijbels, R. |
Similarities and differences between direct current and radio-frequency glow discharges: a mathematical simulation |
2000 |
Journal of analytical atomic spectrometry |
15 |
25 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Verlinden, G.; Gijbels, R.; Geuens, I.; de Keyzer, R. |
Surface analysis of halide distributions in complex AgX microcrystals by imaging time-of-flight SIMS (TOF-SIMS) |
1999 |
Journal of analytical atomic spectrometry |
14 |
10 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Gamez, G.; Bogaerts, A.; Hieftje, G.M. |
Temporal and spatially resolved laser-scattering plasma diagnostics for the characterization of a ms-pulsed glow discharge |
2006 |
Journal of analytical atomic spectrometry |
21 |
17 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Bleiner, D.; Altorfer, H. |
A novel gas inlet system for improved aerosol entrainment in laser ablation inductively coupled plasma mass spectrometry |
2005 |
Journal of analytical atomic spectrometry |
|
21 |
UA library record; WoS full record; WoS citing articles |
|
|
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Bleiner, D.; Belloni, F.; Doria, D.; Lorusso, A.; Nassisi, V. |
Overcoming pulse mixing and signal tailing in laser ablation inductively coupled plasma mass spectrometry depth profiling |
2005 |
Journal of analytical atomic spectrometry |
|
26 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Kempenaers, L.; Janssens, K.; Jochum, K.P.; Vincze, L.; Vekemans, B.; Somogyi, A.; Drakopoulos, M.; Adams, F. |
Micro-heterogeneity study of trace elements in USGS, MPI-DING and glass reference materials by means of synchrotron micro-XRF |
2003 |
Journal of analytical atomic spectrometry |
18 |
38 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Janssens, K.; Vincze, L.; Rubio, J.; Bernasconi, G.; Adams, F. |
Microscopic X-ray fluorescence analysis |
1994 |
Journal of analytical atomic spectrometry |
9 |
|
UA library record; WoS full record; WoS citing articles |
|
|
|
Vincze, L.; Wei, F.; Proost, K.; Vekemans, B.; Janssens, K.; He, Y.; Yan, Y.; Falkenberg, G. |
Suitability of polycapillary optics for focusing of monochromatic synchrotron radiation as used in trace level micro-XANES measurements |
2002 |
Journal of analytical atomic spectrometry |
17 |
23 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Kuczumow, A.; Vekemans, B.; Schalm, O.; Gysels, K.; Ro, C.-U.; Van Grieken, R. |
Analysis of speleothems by electron and X-ray microprobes |
2001 |
Journal of analytical atomic spectrometry |
16 |
|
UA library record; WoS full record; WoS citing articles |
|
|
|
de Gendt, S.; Van Grieken, R.; Hang, W.; Harrison, W.W. |
Comparison between direct current and radiofrequency glow discharge mass spectrometry for the analysis of oxide-based samples |
1995 |
Journal of analytical atomic spectrometry |
10 |
|
UA library record; WoS full record; WoS citing articles |
|
|
|
Kuczumow, A.; Schmeling, M.; Van Grieken, R. |
Critical assessment and proposal for reconstruction of a grazing emission X-ray fluorescence instrument |
2000 |
Journal of analytical atomic spectrometry |
15 |
|
UA library record; WoS full record; WoS citing articles |
|
|
|
Tsuji, K.; Nullens, R.; Wagatsuma, K.; Van Grieken, R.E. |
Elemental x-ray images obtained by grazing-exit electron probe microanalysis (GE-EPMA) |
1999 |
Journal of analytical atomic spectrometry |
14 |
|
UA library record; WoS full record; WoS citing articles |
|
|
|
Bruynseels, F.; Otten, P.; Van Grieken, R. |
Inorganic nitrogen speciation in single micrometer-size particles by laser microprobe mass analysis |
1988 |
Journal of analytical atomic spectrometry |
3 |
|
UA library record; WoS full record; WoS citing articles |
|
|
|
Schelles, W.; de Gendt, S.; Van Grieken, R.E. |
Optimization of secondary cathode thickness for direct current glow discharge mass spectrometric analysis of glass |
1996 |
Journal of analytical atomic spectrometry |
11 |
|
UA library record; WoS full record; WoS citing articles |
|
|
|
Vekemans, B.; Vincze, L.; Brenker, F.E.; Adams, F. |
Processing of three-dimensional microscopic X-ray fluorescence data |
2004 |
Journal of analytical atomic spectrometry |
19 |
|
UA library record; WoS full record; WoS citing articles |
|
|
|
Kuczumow, A.; Claes, M.; Schmeling, M.; Van Grieken, R.; de Gendt, S. |
Quantification problems in light element determination by grazing emission X-ray fluorescence |
2000 |
Journal of analytical atomic spectrometry |
15 |
|
UA library record; WoS full record; WoS citing articles |
|
|
|
de Gendt, S.; Schelles, W.; Van Grieken, R.; Müller, V. |
Quantitative analysis of iron-rich and other oxide-based samples by means of glow discharge mass spectrometry |
1995 |
Journal of analytical atomic spectrometry |
10 |
|
UA library record; WoS full record; WoS citing articles |
|
|
|
Schelles, W.; Van Grieken, R. |
Quantitative analysis of zirconium oxide by direct glow discharge mass spectrometry using a secondary cathode |
1997 |
Journal of analytical atomic spectrometry |
12 |
|
UA library record |
|
|
|
Szalóki, I.; Braun, M.; Van Grieken, R. |
Quantitative characterisation of the leaching of lead and other elements from glazed surfaces of historical ceramics |
2000 |
Journal of analytical atomic spectrometry |
15 |
|
UA library record; WoS full record; WoS citing articles |
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