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Internal standard activation analysis of silicon in steel”. van Grieken R, Gijbels R, Speecke A, Hoste J, Analytica chimica acta 43, 381 (1968). http://doi.org/10.1016/S0003-2670(00)89235-1
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Interplay of 2D and 3D charge carriers in Si-δ-doped InSb layers grown epitaxially on GaAs”. de Keyser A, Bogaerts R, Karavolas VC, van Bockstal L, Herlach F, Peeters FM, van de Graaf W, Borghs G, Solid state electronics 40, 395 (1996). http://doi.org/10.1016/0038-1101(96)84617-X
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Interpretation of electron diffraction from carbon nanotube bundles presenting precise helicity”. Colomer J-F, Henrard L, Launois P, Van Tendeloo G, Lucas AA, Lambin P, Physical review : B : condensed matter and materials physics 70, 075408 (2004). http://doi.org/10.1103/PhysRevB.70.075408
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Intersubband-coupling and screening effects on the electron transport in a quasi-two-dimensional δ-doped semiconductor system”. Hai G-Q, Studart N, Peeters FM, Koenraad PM, Wolter JH, Journal of applied physics 80, 5809 (1996). http://doi.org/10.1063/1.363573
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Intersubband plasmons in quasi-one-dimensional electron systems on a liquid helium surface”. Tavares MRS, Hai G-Q, Peeters FM, Studart N, Physical review : B : condensed matter and materials physics 68, 140504 (2003). http://doi.org/10.1103/PhysRevB.68.140504
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Intersubband transitions in InAs/GaSb superlattices in a parallel magnetic field”. de Meester RHJ, Peeters FM, Lakrimi M, Nicholas RJ, Poulter AJL, Mason NJ, Walker PJ, Physica. E: Low-dimensional systems and nanostructures 7, 93 (2000)
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Intersublevel absorption in stacked n-type doped self-assembled quantum dots”. Veljkovic D, Tadić, M, Peeters FM, Materials science forum 494, 37 (2005)
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Intersublevel magnetoabsorption in the valence band of p-type InAs/GaAs and Ge/Si self-assembled quantum dots”. Tadić, M, Peeters FM, Physical review : B : condensed matter and materials physics 71, 125342 (2005). http://doi.org/10.1103/PhysRevB.71.125342
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Inverse flux quantum periodicity of magnetoresistance oscillations in two-dimensional short-period surface superlattices”. Wang XF, Vasilopoulos P, Peeters FM, Physical review : B : condensed matter and materials physics 69, 035331 (2004). http://doi.org/10.1103/PhysRevB.69.035331
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Investigation by electron diffraction microscopy of (RE)BaCuOS polycrystalline ceramic compounds: interpretation of unexpected superstructures and influence of secondary phases”. Cloots R, Rulmont A, Krekels T, Van Tendeloo G, Diko P, Ausloos M, Journal of crystal growth 129, 394 (1993)
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Investigation of etching and deposition processes of Cl2/O2/Ar inductively coupled plasmas on silicon by means of plasmasurface simulations and experiments”. Tinck S, Boullart W, Bogaerts A, Journal of physics: D: applied physics 42, 095204 (2009). http://doi.org/10.1088/0022-3727/42/9/095204
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Investigation of laser output power saturation in the He-Cu+ IR hollow cathode discharge laser by experiments and numerical modeling”. Bogaerts A, Gijbels R, Grozeva M, Sabotinov N, Physica scripta T105, 90 (2003). http://doi.org/10.1238/Physica.Topical.105a00090
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The ion- and atom-induced secondary electron emission yield: numerical study for the effect of clean and dirty cathode surfaces”. Bogaerts A, Gijbels R, Plasma sources science and technology 11, 27 (2002). http://doi.org/10.1088/0963-0252/11/1/303
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Ion beam synthesis of Te and Bi nanoclusters in silicon: the effect of post-implantation high frequency electromagnetic field”. Kalitzova M, Peeva A, Ignatova V, Lebedev OI, Zollo G, Vitali G, Nuclear instruments and methods in physics research: B: beam interactions with materials and atoms 242, 209 (2006). http://doi.org/10.1016/j.nimb.2005.08.017
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Ion-bombardment artifact in TOF-SIMS analysis of ZrO2/SiO2/Si stacks”. de Witte H, Conard T, Vandervorst W, Gijbels R, Applied surface science 203, 523 (2003). http://doi.org/10.1016/S0169-4332(02)00728-6
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Ion irradiation for improved graphene network formation in carbon nanotube growth”. Neyts EC, Bogaerts A, Carbon 77, 790 (2014). http://doi.org/10.1016/j.carbon.2014.05.083
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Is atomic resolution transmission electron microscopy able to resolve and refine amorphous structures?”.van Dyck D, Van Aert S, den Dekker AJ, van den Bos A, Ultramicroscopy 98, 27 (2003). http://doi.org/10.1016/S0304-3991(03)00023-8
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Josephson phenomenology and microstructure of YBaCuO artificial grain boundaries characterized by misalignment of the c-axes”. Tafuri F, Granozio FM, Carillo F, Lombardi F, Di Uccio US, Verbist K, Lebedev O, Van Tendeloo G, Physica: C : superconductivity 327, 63 (1999). http://doi.org/10.1016/S0921-4534(99)00372-X
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Joule heat in a two-dimensional electron gas exposed to a normal non-homogeneous magnetic field of a 'chess' configuration”. Badalyan SM, Peeters FM, Physica: B : condensed matter 316, 216 (2002). http://doi.org/10.1016/S0921-4526(02)00462-3
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Landscape roughness at an atomic scale”. Van Tendeloo G, De Meulenaere P, Schryvers D, Physica: D : nonlinear phenomena 107, 401 (1997). http://doi.org/10.1016/S0167-2789(97)00108-5
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Large bipolarons in three and two dimensions”. Verbist G, Peeters FM, Devreese JT, Physical review : B : condensed matter and materials physics 43, 2712 (1991)
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Laser ablation for analytical sampling: what can we learn from modeling?”.Bogaerts A, Chen Z, Gijbels R, Vertes A, Spectrochimica acta: part B : atomic spectroscopy 58, 1867 (2003). http://doi.org/10.1016/j.sab.2003.08.004
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Laser ablation of copper in different background gases: comparative study by numerical modeling and experiments”. Bogaerts A, Chen Z, Bleiner D, Journal of analytical atomic spectrometry 21, 384 (2006). http://doi.org/10.1039/b514313f
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Laser ablation of Cu and plume expansion into 1 atm ambient gas”. Chen Z, Bogaerts A, Journal of applied physics 97, 063305 (2005). http://doi.org/10.1063/1.1863419
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Laser induced phase transition in iron thin films”. Teodorescu VS, Mihailescu IN, Dinescu M, Chitica N, Nistor LC, van Landuyt J, Barborica A, Journal de physique: 3: applied physics, materials science, fluids, plasma and instrumentation 4, 127 (1994). http://doi.org/10.1051/jp4:1994427
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Laser ionization mass spectrometry for the characterization of solid materials”. van Vaeck L, van Roy W, Gijbels R, Analusis : chimie analytique, méthodes physiques d'analyse, composition de la matière 21, 53 (1993)
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Laser microprobe Fourier transform mass spectrometer with external ion source for organic and inorganic microanalysis”. Struyf H, van Roy W, van Vaeck L, van Grieken R, Gijbels R, Caravatti P, Analytica chimica acta 283, 139 (1993). http://doi.org/10.1016/0003-2670(93)85216-7
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Laser microprobe mass spectrometry in biology and biomedicine”. Eeckhaoudt S, van Vaeck L, Gijbels R, van Grieken RE, Scanning microscopy S8, 335 (1994)
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Laser microprobe mass spectrometry of quaternary phosphonium salts: direct versus matrix-assisted laser desorption”. Claereboudt J, Claeys M, Geise H, Gijbels R, Vertes A, Journal of the American Society for Mass Spectrometry 4, 798 (1993). http://doi.org/10.1016/1044-0305(93)80038-Z
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Laser microprobe mass spectrometry: principle and applications in biology and medicine”. van Vaeck L, Poels K, de Nollin S, Hachimi A, Gijbels R, Cell biology international 21, 635 (1997). http://doi.org/10.1006/cbir.1997.0198
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