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“Reduced dimensionality in different forms of carbon”. Van Tendeloo G, Bernaerts D, Amelinckx S, Fullerenes and carbon based materials , 487 (1998)
Abstract: Several TEM techniques are used to characterise the local structure of low dimensional forms of carbon. HREM is particularly useful to describe the defect structure of thin films of diamond or fullerenes and C-60-C-70 nanoclusters. A columnar form of graphite is analysed, mainly by electron diffraction which allowed us to propose a growth mechanism. Diffraction contrast dark field microscopy, in combination with electron diffraction, allows a detailed characterisation of carbon nanotubes; e.g. the chirality distribution of tubes in ropes of single wall tubes is studied by selected area electron diffraction. (C) 1998 Elsevier Science Ltd. All rights reserved.
Keywords: P1 Proceeding; Electron microscopy for materials research (EMAT)
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“Relativistic virial relations for both homogeneous and spatially varying electron liquids”. Leys FE, March NH, Lamoen D, Physics And Chemistry Of Liquids 42, 423 (2004). http://doi.org/10.1080/00319100410001697873
Keywords: A1 Journal article; Electron Microscopy for Materials Science (EMAT);
Impact Factor: 1.145
DOI: 10.1080/00319100410001697873
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“Reliability of copper dual damascene influenced by pre-clean”. Tokei Z, Lanckmans F, van den Bosch G, Van Hove M, Maex K, Bender H, Hens S, van Landuyt J, Analysis Of Integrated Circuits , 118 (2002). http://doi.org/10.1109/IPFA.2002.1025629
Keywords: P1 Proceeding; Electron microscopy for materials research (EMAT)
Times cited: 5
DOI: 10.1109/IPFA.2002.1025629
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“Reliable pore-size measurements based on a procedure specifically designed for electron tomography measurements of nanoporous samples”. Van Eyndhoven G, Batenburg KJ, van Oers C, Kurttepeli M, Bals S, Cool P, Sijbers J, (2014)
Keywords: P3 Proceeding; Electron microscopy for materials research (EMAT); Vision lab; Laboratory of adsorption and catalysis (LADCA)
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“Revealing the innermost nanostructure of sputtered NiCrOx solar absorber cermets”. Gaouyat L, He Z, Colomer J-F, Lambin P, Mirabella F, Schryvers D, Deparis O, Solar energy materials and solar cells 122, 303 (2014). http://doi.org/10.1016/j.solmat.2013.10.009
Abstract: Conversion of solar energy into thermal energy helps reducing consumption of non-renewable energies. Cermets (ceramicmetal composites) are versatile materials suitable, amongst other applications, for solar selective absorbers. Although the presence of metallic Ni particles in the dielectric matrix is a prerequisite for efficient solar selective absorption in NiCrOx cermets, no clear evidence of such particles is reported so far. By combining comprehensive chemical and structural analyses, we reveal the presumed nanostructure which is at the origin of the remarkable optical properties of this cermet material. Using sputtered NiCrOx layers in a solar absorber multilayer stack on aluminium substrate allows us to achieve solar absorptance as high as α=96.1% while keeping thermal emissivity as low as ε=2.2%, both values being comparable to best values recorded so far. With the nanostructure of sputtered NiCrOx cermets eventually revealed, further optimization of solar absorbers can be anticipated and technological exploitation of cermet materials in other applications can be foreseen.
Keywords: A1 Journal article; Engineering sciences. Technology; Electron microscopy for materials research (EMAT)
Impact Factor: 4.784
Times cited: 12
DOI: 10.1016/j.solmat.2013.10.009
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“Review of phonon behaviour and microstructural development leading to martensitic transformations in NixAl100-x alloys”. Tanner LE, Shapiro SM, Schryvers D, Noda Y, Shape memory materials and phenomena: fundamental aspects and applications 246, 265 (1992)
Keywords: A3 Journal article; Electron microscopy for materials research (EMAT)
Times cited: 4
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“Role of the defect microstructure on the electrical transport properties in undoped and Si-doped GaN grown by LP-MOVPE”. Farvacque JL, Bougrioua Z, Moerman I, Van Tendeloo G, Lebedev O, Physica: B : condensed matter
T2 –, 20th International Conference on Defects in Semiconductors (ICDS-20), JUL 26-30, 1999, BERKELEY, CA 273-4, 140 (1999). http://doi.org/10.1016/S0921-4526(99)00431-7
Abstract: Experimental results show that the room-temperature carrier mobility in bulk layers of undoped or Si-doped GaN grown by LP-MOVPE on sapphire substrate shows a sudden increase as soon as the carrier density exceeds a critical value of about 10(18) cm(-3). We show that such a behavior can be theoretically reproduced by assuming that the columnar structure i.e. the dislocation microstructure is responsible for internal electronic barriers. (C) 1999 Elsevier Science B.V. All rights reserved.
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 1.386
Times cited: 5
DOI: 10.1016/S0921-4526(99)00431-7
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“Room temperature (2a x 2b) superstructure formed in Sr-submitted Bi2(Sr1.6Y0.4)CaCu2Oy single crystals”. Zhang XF, Van Tendeloo G, Hu DW, Brabers VAM, Physica: C : superconductivity 278, 31 (1997)
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 1.404
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“Room temperature and low-temperature structure of Nd1-xCaxMnO3 (0.3*x*0.5)”. Richard O, Schuddinck W, Van Tendeloo G, Millange F, Hervieu M, Caignaert C, Raveau B, Acta crystallographica: section A: foundations of crystallography 55, 704 (1999). http://doi.org/10.1107/S0108767398012215
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 5.725
Times cited: 24
DOI: 10.1107/S0108767398012215
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“Selective imaging of sublattices in complex structures”. Amelinckx S, Milat O, Van Tendeloo G, Ultramicroscopy 51, 90 (1993). http://doi.org/10.1016/0304-3991(93)90138-N
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 2.436
Times cited: 8
DOI: 10.1016/0304-3991(93)90138-N
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“The selective imaging of “substructures&rdquo, in the mixed layer compounds Ca0.85CuO2 and (Ca,Sr)14Cu24O41”. Amelinckx S, Milat O, Van Tendeloo G, , 240 (1992)
Keywords: P3 Proceeding; Electron microscopy for materials research (EMAT)
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“Selective imaging of the “substructures&rdquo, in incommensurately modulated intergrowth crystal structures”. Milat O, Van Tendeloo G, Amelinckx S, Ultramicroscopy 41, 65 (1992). http://doi.org/10.1016/0304-3991(92)90095-2
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 2.436
Times cited: 5
DOI: 10.1016/0304-3991(92)90095-2
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“Self consistent nonlocal linear-response theory of a relativistic electron gas”. Leys FE, March NH, Angilella GGN, Lamoen D, Physical Review B 67, 113105 (2003). http://doi.org/10.1103/PhysRevB.67.113105
Keywords: A1 Journal article; Electron Microscopy for Materials Science (EMAT);
Impact Factor: 3.836
DOI: 10.1103/PhysRevB.67.113105
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“A simple preparation method for air-sensitive specimens for transmission electron microscopy demonstrated by Rb6C60”. Zhang XF, Zhang XB, Bernaerts D, Van Tendeloo G, Amelinckx S, van Landuyt J, Werner H, Ultramicroscopy 55, 25 (1994). http://doi.org/10.1016/0304-3991(94)90077-9
Abstract: In this paper a particularly simple but efficient method is presented by which samples of alkali-doped C-60 materials or other air-sensitive materials can be prepared and transferred into a transmission electron microscope for direct observations and investigations. Flexible, transparent glove bags are used which are filled to a slight overpressure with dry nitrogen. Under this protective atmosphere, the air-sensitive sample is mounted in the specimen holder and inserted in the vacuum of the electron microscope. Rb6C60 which is prepared and transferred into the microscope in this way has been investigated by transmission electron microscopy (TEM). The results confirm the bcc structure and especially the location of the rubidium atoms.
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 2.436
Times cited: 2
DOI: 10.1016/0304-3991(94)90077-9
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“Site occupation of Nb atoms in ternary Ni-Ti-Nb shape memory alloys”. Shi H, Frenzel J, Martinez GT, Van Rompaey S, Bakulin A, Kulkova A, Van Aert S, Schryvers D, Acta materialia 74, 85 (2014). http://doi.org/10.1016/j.actamat.2014.03.062
Abstract: Nb occupancy in the austenite B2-NiTi matrix and Ti2Ni phase in NiTiNb shape memory alloys was investigated by aberration-corrected scanning transmission electron microscopy and precession electron diffraction. In both cases, Nb atoms were found to prefer to occupy the Ti rather than Ni sites. A projector augmented wave method within density functional theory was used to calculate the atomic and electronic structures of the austenitic B2-NiTi matrix phase and the Ti2Ni precipitates both with and without addition of Nb. The obtained formation energies and analysis of structural and electronic characteristics explain the preference for Ti sites for Nb over Ni sites.
Keywords: A1 Journal article; Engineering sciences. Technology; Electron microscopy for materials research (EMAT)
Impact Factor: 5.301
Times cited: 21
DOI: 10.1016/j.actamat.2014.03.062
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“Some examples of electron microscopy studies of microstructures and phase transitions in solids”. Schryvers D, Van Tendeloo G, van Landuyt J, Amelinckx S, Meccanica 30, 433 (1995). http://doi.org/10.1007/BF01557075
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 1.949
Times cited: 1
DOI: 10.1007/BF01557075
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“Some properties of a model liquid of C60 buckyballs”. Alonso JA, López MJ, March NH, Lamoen D, Physics And Chemistry Of Liquids 40, 457 (2002). http://doi.org/10.1080/00319100290010809
Keywords: A1 Journal article; Electron Microscopy for Materials Science (EMAT);
Impact Factor: 1.145
Times cited: 4
DOI: 10.1080/00319100290010809
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“Special microstructures and twin features in Ti50Ni50-x(Pd,Au)x at small hysteresis”. Delville R, Shi H, James RD, Schryvers D, Diffusion and defect data : solid state data : part B : solid state phenomena 172/174, 105 (2011). http://doi.org/10.4028/www.scientific.net/SSP.172-174.105
Abstract: The breaking of symmetry due to atomic displacements in the austenite-martensite phase transformation generally leads to their crystallographic incompatibility. Energy minimizing accommodation mechanisms such as martensite twinning have been recently shown to be a source of hysteresis and irreversible plastic deformation. Compatibility between the two phases can however be achieved by carefully tuning lattice parameters through composition change. A dramatic drop in hysteresis and novel microstructures such as a lowering of the amount of twin lamella are then observed. Related theoretical and simulation works also support the existence of such microstructures including peculiar self-accommodating configurations at near-compatibility. We present the transmission electron microscopy (TEM) study of these novel microstructures for the alloy systems Ti50Ni50-xPdx and Ti50Ni50-xAux where the composition was systemically tuned to approach perfect compatibility. High resolution imaging of the interface between austenite and martensite supplies evidences of compatibility at the atomic level.
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Times cited: 3
DOI: 10.4028/www.scientific.net/SSP.172-174.105
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“Stability of Ge12C48 and Ge20C40 heterofullerenes : a first principles molecular dynamics study”. Massobrio C, Djimbi DM, Matsubara M, Scipioni R, Boero M, Chemical physics letters 556, 163 (2013). http://doi.org/10.1016/j.cplett.2012.11.033
Abstract: By using first-principles molecular dynamics, we address the issue of structural stability for the C-60 Ge-m(m) family of doped heterofullerenes through a set of calculations targeting C48Ge12 and C40Ge20. Three kinds of theoretical tools are employed: (a) static structural optimization, (b) a bonding analysis based on localized orbitals (Wannier wavefunctions and centers) and (c) first-principles molecular dynamics at finite temperature. This latter tool allows concluding that the segregated form of C40Ge20 is less stable than its Si-based counterpart. However, the non-segregated forms of C40Ge20 and C40Si20 have comparable stabilities at finite temperatures. (C) 2012 Elsevier B. V. All rights reserved.
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 1.815
Times cited: 3
DOI: 10.1016/j.cplett.2012.11.033
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“Stability of vortex-antivortex “molecules&rdquo, in mesoscopic superconducting triangles”. Misko VR, Fomin VM, Devreese JT, Moshchalkov VV, 3rd International Symposium on Mesoscopic Superconductivity and, Spintronics, MAR 01-04, 2004, Atsug, 191 (2005). http://doi.org/10.1142/9789812701619_0030
Abstract: We have revealed thermodynamically stable vortex-antivortex configurations in mesoscopic type I superconducting equilateral triangles. The revealed effect is explained by two factors: (i) vortex confinement in mesoscopic triangles and (ii) appearance of the vortex-antivortex repulsion in mesoscopic type I superconductor triangles in the vicinity of the dual point. The stability of the obtained solutions is examined as a function of material and external parameters – the Ginzburg-Landau parameter K and temperature – as well as a function of a distortion of the sample's shape. The vortex-antivortex. “molecule” turns out to be stable in a wide range of the parameters that makes it possible its experimental visualization.
Keywords: A1 Journal article; Electron Microscopy for Materials Science (EMAT);
DOI: 10.1142/9789812701619_0030
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“Stability of vortex-antivortex molecules in mesoscopic superconducting triangles”. Misko VR, Fomin VM, Devreese JT, Moshchalkov VV, Physica C-Superconductivity And Its Applications 404, 251 (2004). http://doi.org/10.1016/j.physc.2003.11.043
Keywords: A1 Journal article; Electron Microscopy for Materials Science (EMAT);
Impact Factor: 1.404
Times cited: 2
DOI: 10.1016/j.physc.2003.11.043
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“Stable vortex-antivortex molecules in mesoscopic superconducting triangles”. Misko VR, Fomin VM, Devreese JT, Moshchalkov VV, Physical Review Letters 90, 147003 (2003). http://doi.org/10.1103/PhysRevLett.90.147003
Keywords: A1 Journal article; Electron Microscopy for Materials Science (EMAT);
Impact Factor: 8.462
Times cited: 103
DOI: 10.1103/PhysRevLett.90.147003
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“Statistical experimental design for quantitative atomic resolution transmission electron microscopy”. Van Aert S, den Dekker AJ, van den Bos A, van Dyck D Academic Press, San Diego, Calif., page 1 (2004).
Keywords: H1 Book chapter; Electron microscopy for materials research (EMAT); Vision lab
Times cited: 13
DOI: 10.1016/S1076-5670(04)30001-7
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“Statistical parameter estimation theory : a tool for quantitative electron microscopy”. Van Aert S Wiley-VCH, Weinheim, page 281 (2012).
Keywords: H1 Book chapter; Electron microscopy for materials research (EMAT)
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Egoavil R (2014) STEM investigation of complex oxides at the atomic scale. Antwerpen
Keywords: Doctoral thesis; Electron microscopy for materials research (EMAT)
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“Strain measurement at the nanoscale : comparison between convergent beam electron diffraction, nano-beam electron diffraction, high resolution imaging and dark field electron holography”. Béché, A, Rouviere JL, Barnes JP, Cooper D, Ultramicroscopy 131, 10 (2013). http://doi.org/10.1016/j.ultramic.2013.03.014
Abstract: Convergent beam electron diffraction (CBED), nano-beam electron diffraction (NBED or NBD), high resolution imaging (HRTEM and HRSTEM) and dark field electron holography (DFEH or HoloDark) are five TEM based techniques able to quantitatively measure strain at the nanometer scale. In order to demonstrate the advantages and disadvantages of each technique, two samples composed of epitaxial silicon-germanium layers embedded in a silicon matrix have been investigated. The five techniques are then compared in terms of strain precision and accuracy, spatial resolution, field of view, mapping abilities and ease of performance and analysis. (C) 2013 Elsevier By. All rights reserved.
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 2.843
Times cited: 73
DOI: 10.1016/j.ultramic.2013.03.014
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“Strained La1-xSrxMnO3 (x = 0.1 – 0.3) thin films studied by HREM”. Lebedev OI, Van Tendeloo G, Amelinckx S s.l., page 201 (2000).
Keywords: H3 Book chapter; Electron microscopy for materials research (EMAT)
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“Stress analysis with convergent beam electron diffraction around NMOS transistors”. Stuer G, Bender H, van Landuyt J, Eyben P, , 359 (2001)
Keywords: P1 Proceeding; Electron microscopy for materials research (EMAT); Internet Data Lab (IDLab)
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“Strong enhancement of superconductivity in a nanosized Pb bridge”. Misko VR, Fomin VM, Devreese JT, Physical Review B 64, 014517 (2001). http://doi.org/10.1103/PhysRevB.64.014517
Keywords: A1 Journal article; Electron Microscopy for Materials Science (EMAT);
Impact Factor: 3.836
Times cited: 28
DOI: 10.1103/PhysRevB.64.014517
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“Structural and microstructural aspects of Six(Ta, Nb)Te2”. Frangis N, Van Tendeloo G, Manolikas C, Amelinckx S, Journal of solid state chemistry 139, 105 (1998). http://doi.org/10.1006/jssc.1998.7815
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 2.299
Times cited: 2
DOI: 10.1006/jssc.1998.7815
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