| |
Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Links |
|
|
Verleysen, E.; Bender, H.; Richard, O.; Schryvers, D.; Vandervorst, W. |
Compositional characterization of nickel silicides by HAADF-STEM imaging |
2011 |
Journal of materials science |
46 |
1 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Verbist, K.; Lebedev, O.I.; Van Tendeloo, G.; Tafuri, F.; Granozio, F.M.; Di Chiara, A.; Bender, H. |
A potential method to correlate electrical properties and microstructure of a unique high-Tc superconducting Josephson junction |
1999 |
Applied physics letters |
74 |
5 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Nistor, L.C.; Richard, O.; Zhao, C.; Bender, H.; Van Tendeloo, G. |
Thermal stability of atomic layer deposited Zr:Al mixed oxide thin films: an in situ transmission electron microscopy study |
2005 |
Journal of materials research |
20 |
|
UA library record; WoS full record |
|
|
|
Shimizu, K.; Habazaki, H.; Bender, H.; Gijbels, R. |
The dawn of surface analysis that stands by the side users: ultra-thin film analysis by rf-GDOES |
2004 |
Engineering materials |
52 |
|
UA library record |
|
