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  Author Title Year Publication Volume Times cited Additional Links Links
Lichte, H.; Dunin-Borkowski, R.; Tillmann, K.; Van Aert, S.; Van Tendeloo, G. 65th birthdays of W. Owen Saxton, David J. Smith and Dirk Van Dyck / PICO 2013 From multislice to big bang 2013 UA library record
Wang, A.; Chen, F.R.; Van Aert, S.; van Dyck, D. Direct structure inversion from exit waves : part 2 : a practical example 2012 Ultramicroscopy 116 8 UA library record; WoS full record; WoS citing articles pdf doi
den Dekker, A.J.; Van Aert, S.; van Dyck, D.; van den Bos, A.; Geuens, P. Does a monochromator improve the precision in quantitative HRTEM? 2001 Ultramicroscopy 89 22 UA library record; WoS full record; WoS citing articles doi
Van Aert, S.; den Dekker, A.J.; van Dyck, D.; van den Bos, A. High-resolution electron microscopy and electron tomography: resolution versus precision 2002 Journal of structural biology 138 33 UA library record; WoS full record; WoS citing articles doi
Schryvers, D.; Van Aert, S. High-resolution visualization techniques : structural aspects 2012 UA library record
Van Aert, S.; den Dekker, A.J.; van Dyck, D. How to optimize the experimental design of quantitative atomic resolution TEM experiments? 2004 Micron 35 14 UA library record; WoS full record; WoS citing articles pdf doi
Dunin-Borkowski, R.E.; Lichte, H.; Tillmann, K.; Van Aert, S.; Van Tendeloo, G. Introduction to a special issue in honour of W. Owen Saxton, David J. Smith and Dirk Van Dyck on the occasion of their 65th birthdays 2013 Ultramicroscopy 134 1 UA library record; WoS full record; WoS citing articles pdf url doi
van Dyck, D.; Van Aert, S.; den Dekker, A.J.; van den Bos, A. Is atomic resolution transmission electron microscopy able to resolve and refine amorphous structures? 2003 Ultramicroscopy 98 26 UA library record; WoS full record; WoS citing articles doi
Van Aert, S. Meer zien met onzichtbaar licht 2007 Karakter : tijdschrift van wetenschap 18 UA library record
Schryvers, D.; Shi, H.; Martinez, G.T.; Van Aert, S.; Frenzel, J.; Van Humbeeck, J. Nano- and microcrystal investigations of precipitates, interfaces and strain fields in Ni-Ti-Nb by various TEM techniques 2013 Materials science forum T2 – 9th European Symposium on Martensitic Transformations (ESOMAT 2012), SEP 09-16, 2012, St Petersburg, RUSSIA 738/739 2 UA library record; WoS full record; WoS citing articles pdf doi
Van Aert, S.; den Dekker, A.J.; van Dyck, D.; van den Bos, A. The notion of resolution 2008 UA library record
Van Aert, S.; den Dekker, A.J.; van Dyck, D.; van den Bos, A. The notion of resolution 2007 UA library record
Van Aert, S.; den Dekker, A.J.; van Dyck, D.; van den Bos, A. Optimal experimental design of STEM measurement of atom column positions 2002 Ultramicroscopy 90 35 UA library record; WoS full record; WoS citing articles doi
van Dyck, D.; Van Aert, S.; den Dekker, A.J. Physical limits on atomic resolution 2004 Microscopy and microanalysis 10 14 UA library record; WoS full record; WoS citing articles doi
Wang, A.; Van Aert, S.; Goos, P.; van Dyck, D. Precision of three-dimensional atomic scale measurements from HRTEM images : what are the limits? 2012 Ultramicroscopy 114 5 UA library record; WoS full record; WoS citing articles pdf doi
Shi, H.; Frenzel, J.; Martinez, G.T.; Van Rompaey, S.; Bakulin, A.; Kulkova, A.; Van Aert, S.; Schryvers, D. Site occupation of Nb atoms in ternary Ni-Ti-Nb shape memory alloys 2014 Acta materialia 74 21 UA library record; WoS full record; WoS citing articles pdf doi
Van Aert, S.; den Dekker, A.J.; van den Bos, A.; van Dyck, D. Statistical experimental design for quantitative atomic resolution transmission electron microscopy 2004 13 UA library record; WoS full record; WoS citing articles doi
Van Aert, S. Statistical parameter estimation theory : a tool for quantitative electron microscopy 2012 UA library record
Batenburg, J.; Van Aert, S. Three-dimensional reconstruction of a nanoparticle at atomic resolution 2011 ERCIM news 86 UA library record pdf
Liao, Z.L.; Green, R.J.; Gauquelin, N.; Gonnissen, J.; Van Aert, S.; Verbeeck, J.; et al. Engineering properties by long range symmetry propagation initiated at perovskite heterostructure interface 2016 Advanced functional materials UA library record
Van Aert, S.; den Dekker, A.J.; van den Bos, A.; Van Dyck, D. High resolution electron microscopy from imaging towards measuring 2001 ... IEEE International Instrumentation and Measurement Technology Conference T2 – Rediscovering measurement in the age of informatics : proceedings of the 18th IEEE Instrumentation and Measurement Technology Conference (IMTC), 2001: vol 3 UA library record doi
de Backer, A.; De wael, A.; Gonnissen, J.; Martinez, G.T.; Béché, A.; MacArthur, K.E.; Jones, L.; Nellist, P.D.; Van Aert, S. Quantitative annular dark field scanning transmission electron microscopy for nanoparticle atom-counting : what are the limits? 2015 Journal of physics : conference series 644 UA library record url doi
Van Aert, S.; Bals, S.; Chang, L.Y.; den Dekker, A.J.; Kirkland, A.I.; Van Dyck, D.; Van Tendeloo, G. The benefits of statistical parameter estimation theory for quantitative interpretation of electron microscopy data 2008 UA library record doi
Goris, B.; De Beenhouwer, J.; de Backer, A.; Zanaga, D.; Batenburg, J.; Sanchez-Iglesias, A.; Liz-Marzan, L.; Van Aert, S.; Sijbers, J.; Van Tendeloo, G.; Bals, S. Investigating lattice strain in Au nanodecahedrons 2016 UA library record doi
Friedrich, T.; Yu, C.-P.; Verbeek, J.; Pennycook, T.; Van Aert, S. Phase retrieval from 4-dimensional electron diffraction datasets 2021 Proceedings T2 – IEEE International Conference on Image Processing (ICIP), SEP 19-22, 2021, Electr. network UA library record; WoS full record; WoS citing articles pdf url doi
Zhang, Z.; Lobato, I.; Brown, H.; Jannis, D.; Verbeeck, J.; Van Aert, S.; Nellist, P. Generalised oscillator strength for core-shell electron excitation by fast electrons based on Dirac solutions 2023 UA library record doi
Grünewald, L.; Chezganov, D.; De Meyer, R.; Orekhov, A.; Van Aert, S.; Bogaerts, A.; Bals, S.; Verbeeck, J. Supplementary Information for “In-situ Plasma Studies using a Direct Current Microplasma in a Scanning Electron Microscope” 2023 UA library record doi
Wang, A.; Turner, S.; Van Aert, S.; van Dyck, D. An alternative approach to determine attainable resolution directly from HREM images 2013 Ultramicroscopy 133 UA library record; WoS full record pdf url doi
de Backer, A.; Martinez, G.T.; Rosenauer, A.; Van Aert, S. Atom counting in HAADF STEM using a statistical model-based approach : methodology, possibilities, and inherent limitations 2013 Ultramicroscopy 134 48 UA library record; WoS full record; WoS citing articles pdf url doi
Egoavil, R.; Gauquelin, N.; Martinez, G.T.; Van Aert, S.; Van Tendeloo, G.; Verbeeck, J. Atomic resolution mapping of phonon excitations in STEM-EELS experiments 2014 Ultramicroscopy 147 22 UA library record; WoS full record; WoS citing articles pdf url doi
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