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Author | Verlinden, G.; Gijbels, R.; Geuens, I.; de Keyzer, R. | ||||
Title | Surface analysis of halide distributions in complex AgX microcrystals by imaging time-of-flight SIMS (TOF-SIMS) | Type | A1 Journal article | ||
Year | 1999 | Publication | Journal of analytical atomic spectrometry | Abbreviated Journal | J Anal Atom Spectrom |
Volume | 14 | Issue ![]() |
Pages | 429-434 | |
Keywords | A1 Journal article; Plasma Lab for Applications in Sustainability and Medicine – Antwerp (PLASMANT) | ||||
Abstract | |||||
Address | |||||
Corporate Author | Thesis | ||||
Publisher | Place of Publication | London | Editor | ||
Language | Wos | 000079138500015 | Publication Date | 2002-07-26 | |
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | 0267-9477;1364-5544; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
Impact Factor | 3.379 | Times cited | 10 | Open Access | |
Notes | Approved | Most recent IF: 3.379; 1999 IF: 3.677 | |||
Call Number | UA @ lucian @ c:irua:24928 | Serial | 3390 | ||
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