toggle visibility
Search within Results:
Display Options:
Number of records found: 336

Select All    Deselect All
 | 
Citations
 | 
   print
Electron-energy-loss spectra of NiO”. Dobysheva LV, Potapov PL, Schryvers D, Physical review : B : condensed matter and materials physics 69, 184404 (2004). http://doi.org/10.1103/PhysRevB.69.184404
toggle visibility
Mechanical resonance of the austenite/martensite interface and the pinning of the martensitic microstructures by dislocations in Cu74.08Al23.13Be2.79”. Salje EKH, Zhang H, Idrissi H, Schryvers D, Carpenter MA, Moya X, Planes A, Physical review: B: condensed matter and materials physics 80, 134114 (2009). http://doi.org/10.1103/PhysRevB.80.134114
toggle visibility
Structural and chemical effects on EELS L3,2 ionization edges in Ni-based intermetallic compounds”. Potapov PL, Kulkova SE, Schryvers D, Verbeeck J, Physical review : B : condensed matter and materials physics 64, 184110 (2001). http://doi.org/10.1103/PhysRevB.64.184110
toggle visibility
Neutron-scattering and electron microscopy studies of premartensitic phenomena in NixAl100-x alloys”. Shapiro SM, Yang BX, Noda Y, Tanner LE, Schryvers D, Physical review : B : condensed matter and materials physics 44, 9301 (1991)
toggle visibility
From olivine to ringwoodite : a TEM study of a complex process”. Pittarello L, Ji G, Yamaguchi A, Schryvers D, Debaille V, Claeys P, Meteoritics and Planetary Science 50, 944 (2015). http://doi.org/10.1111/maps.12441
toggle visibility
Precipitation behaviors in Ti-2.3 Wt Pct Cu alloy during isothermal and two-step aging”. Akamine H, Mitsuhara M, Nishida M, Samaee V, Schryvers D, Tsukamoto G, Kunieda T, Fujii H, Metallurgical And Materials Transactions A-Physical Metallurgy And Materials Science 52, 2760 (2021). http://doi.org/10.1007/S11661-021-06265-X
toggle visibility
A comparative investigation of replication techniques used for the study of (S+Au) sensitized AgBr microcrystals”. Buschmann V, Schryvers D, van Landuyt J, van Roost C, de Keyzer R, The journal of imaging science and technology 40, 189 (1996)
toggle visibility
Influence of twinning on the morphology of AgBr and AgCl microcrystals”. van Renterghem W, Goessens C, Schryvers D, van Landuyt J, Bollen D, de Keyzer R, van Roost C, The journal of imaging science and technology 45, 349 (2001)
toggle visibility
Microstructural mechanism of development in photothermographic materials”. Potapov PL, Schryvers D, Strijckers H, van Roost C, The journal of imaging science and technology 47, 115 (2003)
toggle visibility
New method to determine the parity of the number of twin planes in tabular silver halide microcrystals from top views”. Goessens C, Schryvers D, van Landuyt J, de Keyzer R, The journal of imaging science and technology 41, 301 (1997)
toggle visibility
A TEM study of non-parallel twins inducing thickness growth in silver chloride {111} tabular crystals”. van Renterghem W, Schryvers D, van Landuyt J, Bollen D, van Roost C, de Keyzer R, The journal of imaging science and technology 45, 83 (2001)
toggle visibility
Evaluation of top, angle, and side cleaned FIB samples for TEM analysis”. Montoya E, Bals S, Rossell MD, Schryvers D, Van Tendeloo G, Microscopy research and technique 70, 1060 (2007). http://doi.org/10.1002/jemt.20514
toggle visibility
Internal calibration technique for HREM studies of nanoscale particles”. Schryvers D, Goessens C, Safran G, Toth L, Microscopy research and technique T2 –, JOINT MEETING OF DUTCH SOC FOR ELECTRON MICROSCOPY / BELGIAN SOC FOR, ELECTRON MICROSCOPY / BELGIAN SOC FOR CELL BIOLOGY, DEC 10-11, 1992, ANTWERP, BELGIUM 25, 185 (1993). http://doi.org/10.1002/jemt.1070250216
toggle visibility
Transmission electron microscopy studies of (111) twinned silver halide microcrystals”. Goessens C, Schryvers D, van Landuyt J, Microscopy research and technique 42, 85 (1998). http://doi.org/10.1002/(SICI)1097-0029(19980715)42:2<85::AID-JEMT3>3.0.CO;2-M
toggle visibility
Reducing the formation of FIB-induced FCC layers on Cu-Zn-Al austenite”. Zelaya E, Schryvers D, Microscopy research and technique 74, 84 (2011). http://doi.org/10.1002/jemt.20877
toggle visibility
Twin-jet electropolishing for damage-free transmission electron microscopy specimen preparation of metallic microwires”. Pourbabak S, Orekhov A, Schryvers D, Microscopy Research And Technique , 1 (2020). http://doi.org/10.1002/JEMT.23588
toggle visibility
Microstructure of adiabatic shear bands in Ti6Al4V”. Peirs J, Tirry W, Amin-Ahmadi B, Coghe F, Verleysen P, Rabet L, Schryvers D, Degrieck J, Materials characterization 75, 79 (2013). http://doi.org/10.1016/j.matchar.2012.10.009
toggle visibility
Quantitative study of particle size distribution in an in-situ grown Al-TiB2 composite by synchrotron X-ray diffraction and electron microscopy”. Tang Y, Chen Z, Borbely A, Ji G, Zhong SY, Schryvers D, Ji V, Wang HW, Materials characterization 102, 131 (2015). http://doi.org/10.1016/j.matchar.2015.03.003
toggle visibility
Structures in textured Cu-Al-Ni shape memory thin films grown by sputtering”. Espinoza Torres C, Condó, AM, Haberkorn N, Zelaya E, Schryvers D, Guimpel J, Lovey FC, Materials characterization 96, 256 (2014). http://doi.org/10.1016/j.matchar.2014.08.005
toggle visibility
Triple ion beam cutting of diamond/Al composites for interface characterization”. Ji G, Tan Z, Shabadi R, Li Z, Grünewald W, Addad A, Schryvers D, Zhang D, Materials characterization 89, 132 (2014). http://doi.org/10.1016/j.matchar.2014.01.008
toggle visibility
Twinning in pure Ti subjected to monotonic simple shear deformation”. Tirry W, Bouvier S, Benmhenni N, Hammami W, Habraken AM, Coghe F, Schryvers D, Rabet L, Materials characterization 72, 24 (2012). http://doi.org/10.1016/j.matchar.2012.07.001
toggle visibility
Heterogeneous interfacial chemical nature and bonds in a W-coated diamond/Al composite”. Ji G, Tan Z, Lu Y, Schryvers D, Li Z, Zhang D, Materials characterization 112, 129 (2016). http://doi.org/10.1016/j.matchar.2015.12.013
toggle visibility
A quantitative method to characterize the Al4C3-formed interfacial reaction: the case study of MWCNT/Al composites”. Yan L, Tan Z, Ji G, Li Z, Fan G, Schryvers D, Shan A, Zhang D, Materials characterization 112, 213 (2015). http://doi.org/10.1016/j.matchar.2015.12.031
toggle visibility
Microstructure and phase composition characterization in a Co38Ni33Al29 ferromagnetic shape memory alloy”. Lu JB, Schryvers D, Materials characterization 118, 9 (2016). http://doi.org/10.1016/j.matchar.2016.04.028
toggle visibility
Quantitative measurement for the microstructural parameters of nano-precipitates in Al-Mg-Si-Cu alloys”. Li K, Idrissi H, Sha G, Song M, Lu J, Shi H, Wang W, Ringer SP, Du Y, Schryvers D, Materials characterization 118, 352 (2016). http://doi.org/10.1016/j.matchar.2016.06.007
toggle visibility
Martensite crystallography and chemistry in dual phase and fully martensitic steels”. Du C, Hoefnagels JPM, Kolling S, Geers MGD, Sietsma J, Petrov R, Bliznuk V, Koenraad PM, Schryvers D, Amin-Ahmadi B, Materials characterization 139, 411 (2018). http://doi.org/10.1016/j.matchar.2018.03.011
toggle visibility
Microscopic investigation of as built and hot isostatic pressed Hastelloy X processed by Selective Laser Melting”. Pourbabak S, Montero-Sistiaga ML, Schryvers D, Van Humbeeck J, Vanmeensel K, Materials characterization 153, 366 (2019). http://doi.org/10.1016/j.matchar.2019.05.024
toggle visibility
Interfacial characteristics and cohesion mechanisms of linear friction welded dissimilar titanium alloys: Ti–5Al–2Sn–2Zr–4Mo–4Cr (Ti17) and Ti–6Al–2Sn–4Zr–2Mo (Ti6242)”. Boyat X, Ballat-Durand D, Marteau J, Bouvier S, Favergeon J, Orekhov A, Schryvers D, Materials characterization 158, 109942 (2019). http://doi.org/10.1016/j.matchar.2019.109942
toggle visibility
Quantitative FIB/SEM three-dimensional characterization of a unique Ni₄Ti₃, network in a porous Ni50.8Ti49.2 alloy undergoing a two-step martensitic transformation”. Cao S, Zeng CY, Li YY, Yao X, Ma X, Samaee V, Schryvers D, Zhang XP, Materials Characterization 169, 110595 (2020). http://doi.org/10.1016/J.MATCHAR.2020.110595
toggle visibility
TEM investigation of the role of the polycrystalline-silicon film/substrate interface in high quality radio frequency silicon substrates”. Ding L, Raskin J-P, Lumbeeck G, Schryvers D, Idrissi H, Materials Characterization 161, 110174 (2020). http://doi.org/10.1016/J.MATCHAR.2020.110174
toggle visibility
Select All    Deselect All
 | 
Citations
 | 
   print

Save Citations:
Export Records: