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Author | Bertoni, G.; Verbeeck, J.; Brosens, F. | ||||
Title | Fitting the momentum dependent loss function in EELS | Type | A1 Journal article | ||
Year | 2011 | Publication | Microscopy research and technique | Abbreviated Journal | Microsc Res Techniq |
Volume | 74 | Issue | 3 | Pages | 212-218 |
Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Theory of quantum systems and complex systems | ||||
Abstract | Momentum dependent inelastic plasmon scattering can be measured by electron energy loss in a transmission electron microscope. From energy filtered diffraction, the characteristic angle of scattering and the cutoff angle are measured, using a thin film of aluminum as a model test. Rather than deconvolving the data (as done in previous works), a fitting technique is used to extract the loss function from angular resolved spectra, starting from a simple model simulation. | ||||
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Corporate Author | Thesis | ||||
Publisher | Place of Publication | New York, N.Y. | Editor | ||
Language | Wos | 000288095200002 | Publication Date | 2010-07-06 | |
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | 1059-910X; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
Impact Factor | 1.147 | Times cited | 6 | Open Access | |
Notes | Fwo; Esteem; Iap; Goa | Approved | Most recent IF: 1.147; 2011 IF: 1.792 | ||
Call Number | UA @ lucian @ c:irua:88782UA @ admin @ c:irua:88782 | Serial | 1222 | ||
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