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Resistive switching at manganite/manganite interfaces”. Kalkert C, Krisponeit J-O, Esseling M, Lebedev OI, Moshnyaga V, Damaschke B, Van Tendeloo G, Samwer K, Applied physics letters 99, 132512 (2011). http://doi.org/10.1063/1.3643425
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The role of Al on Ohmic contact formation on n-type GaN and AlGaN/GaN”. van Daele B, Van Tendeloo G, Ruythooren W, Derluyn J, Leys M, Germain M, Applied physics letters 87, 061905 (2005). http://doi.org/10.1063/1.2008361
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Site-specific mapping of transition metal oxygen coordination in complex oxides”. Turner S, Egoavil R, Batuk M, Abakumov AA, Hadermann J, Verbeeck J, Van Tendeloo G, Applied physics letters 101, 241910 (2012). http://doi.org/10.1063/1.4770512
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Stabilization of the cubic phase of HfO2 by Y addition in films grown by metal organic chemical vapor deposition”. Rauwel E, Dubourdieu C, Holländer B, Rochat N, Ducroquet F, Rossell MD, Van Tendeloo G, Pelissier B, Applied physics letters 89, 012902 (2006). http://doi.org/10.1063/1.2216102
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Statistical method for thickness measurement of amorphous objects”. van Dyck D, Croitoru MD, Applied physics letters 90, 241911 (2007). http://doi.org/10.1063/1.2749184
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Strain relaxation and oxygen superstructure modulation in epitaxial Sr4Fe6O13\pm\delta films”. Santiso J, Pardo JA, Solis C, Garcia G, Figueras A, Rossell MD, Van Tendeloo G, Applied physics letters 86, 132105 (2005). http://doi.org/10.1063/1.1886264
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Superconducting single-phase Sr1-xLaxCuO2 thin films with improved crystallinity grown by pulsed laser deposition”. Leca V, Blank DHA, Rijnders G, Bals S, Van Tendeloo G, Applied physics letters 89 (2006). http://doi.org/10.1063/1.2339840
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Symmetry and electronic states of Mn2+ in ZnS nanowires with mixed hexagonal and cubic stacking”. Chen L, Kirilenko D, Stesmans A, Nguyen XS, Binnemans K, Goderis B, Vanacken J, Lebedev O, Van Tendeloo G, Moshchalkov VV, Applied physics letters 97, 041918 (2010). http://doi.org/10.1063/1.3475017
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Fe3O4/ZnO : a high-quality magnetic oxide-semiconductor heterostructure by reactive deposition”. Paul M, Kufer D, Müller A, Brück S, Goering E, Kamp M, Verbeeck J, Tian H, Van Tendeloo G, Ingle NJC, Sing M, Claessen R, Applied physics letters 98, 012512 (2011). http://doi.org/10.1063/1.3540653
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Y2O3 inclusions in YBa2Cu3O7-\delta thin films”. Verbist K, Vasiliev AL, Van Tendeloo G, Applied physics letters 66, 1424 (1995). http://doi.org/10.1063/1.113266
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Three-dimensional fabrication and characterisation of core-shell nano-columns using electron beam patterning of Ge-doped SiO2”. Gontard LC, Jinschek JR, Ou H, Verbeeck J, Dunin-Borkowski RE, Applied physics letters 100, 263113 (2012). http://doi.org/10.1063/1.4731765
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Transmission electron microscopy and electron energy-loss spectroscopy analysis of manganese oxide nanowires”. Du GH, Yuan ZY, Van Tendeloo G, Applied physics letters 86 (2005). http://doi.org/10.1063/1.1861963
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Why are sputter deposited Nd1+xBa2-xCu3O7-\delta thin films flatter than NdBa2Cu3O7-\delta films?”.Bals S, Van Tendeloo G, Salluzzo M, Maggio-Aprile I, Applied physics letters 79, 3660 (2001). http://doi.org/10.1063/1.1421622
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Ga segregation in DyBa2Cu3O7-\delta/PrBa2Cu3-xGaxO7-\delta/DyBa2Cu3O7-\delta ramp-type Josephson junctions”. Verbist K, Lebedev OI, Van Tendeloo G, Verhoeven MAJ, Rijnders AJHM, Blank DHA, Rogalia H, Applied physics letters 70, 1167 (1997)
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Thick homoepitaxial (110)-oriented phosphorus-doped n-type diamond”. Balasubramaniam Y, Pobedinskas P, Janssens SD, Sakr G, Jomard F, Turner S, Lu YG, Dexters W, Soltani A, Verbeeck J, Barjon J, Nesládek M, Haenen K;, Applied physics letters 109, 062105 (2016). http://doi.org/10.1063/1.4960970
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Towards rapid nanoscale measurement of strain in III-nitride heterostructures”. Jones E, Cooper D, Rouvière J-L, Béché, A, Azize M, Palacios T, Gradecak S, Applied Physics Letters 103, 231904 (2013). http://doi.org/10.1063/1.4838617
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Quantitative strain mapping of InAs/InP quantum dots with 1 nm spatial resolution using dark field electron holography”. Cooper D, Rouvière J-L, Béché, A, Kadkhodazadeh S, Semenova ES, Dunin-Borkowsk R, Applied physics letters 99, 261911 (2011). http://doi.org/10.1063/1.3672194
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Strain mapping for the silicon-on-insulator generation of semiconductor devices by high-angle annular dark field scanning electron transmission microscopy”. Cooper D, Le Royer C, Béché, A, Rouvière J-L, Applied Physics Letters 100, 233121 (2012). http://doi.org/10.1063/1.4723572
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Strain mapping with nm-scale resolution for the silicon-on-insulator generation of semiconductor devices by advanced electron microscopy”. Cooper D, Denneulin T, Barnes J-P, Hartmann J-M, Hutin L, Le Royer C, Béché, A, Rouvière J-L, Applied Physics Letters 112, 124505 (2012). http://doi.org/10.1063/1.4767925
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Improved strain precision with high spatial resolution using nanobeam precession electron diffraction”. Rouvière J-L, Béché, A, Martin Y, Denneulin T, Cooper D, Applied physics letters 103, 241913 (2013). http://doi.org/10.1063/1.4829154
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Thermal characterization of polycrystalline diamond thin film heat spreaders grown on GaN HEMTs”. Zhou Y, Ramaneti R, Anaya J, Korneychuk S, Derluyn J, Sun H, Pomeroy J, Verbeeck J, Haenen K, Kuball M, Applied physics letters 111, 041901 (2017). http://doi.org/10.1063/1.4995407
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Atomic layer epitaxy of Ruddlesden-Popper SrO(SrTiO3)n films by means of metalorganic aerosol deposition”. Jungbauer M, Huehn S, Egoavil R, Tan H, Verbeeck J, Van Tendeloo G, Moshnyaga V, Applied physics letters 105, 251603 (2014). http://doi.org/10.1063/1.4905055
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Microstructural analysis of 9.7% efficient Cu2ZnSnSe4 thin film solar cells”. Buffière M, Brammertz G, Batuk M, Verbist C, Mangin D, Koble C, Hadermann J, Meuris M, Poortmans J, Applied physics letters 105, 183903 (2014). http://doi.org/10.1063/1.4901401
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Optimal experimental design for the detection of light atoms from high-resolution scanning transmission electron microscopy images”. Gonnissen J, de Backer A, den Dekker AJ, Martinez GT, Rosenauer A, Sijbers J, Van Aert S, Applied physics letters 105, 063116 (2014). http://doi.org/10.1063/1.4892884
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Plasticity mechanisms in ultrafine grained freestanding aluminum thin films revealed by in-situ transmission electron microscopy nanomechanical testing”. Idrissi H, Kobler A, Amin-Ahmadi B, Coulombier M, Galceran M, Raskin J-P, Godet S, Kuebel C, Pardoen T, Schryvers D, Applied physics letters 104, 101903 (2014). http://doi.org/10.1063/1.4868124
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A comprehensive modelling approach for the neutral atmospheric boundary layer : consistent inflow conditions, wall function and turbulence model”. Parente A, Gorlé, C, van Beeck J, Benocci C, Boundary-layer meteorology 140, 411 (2011). http://doi.org/10.1007/s10546-011-9621-5
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Dispersion in the wake of a rectangular building : validation of two Reynolds-averaged Navier-Stokes modelling approaches”. Gorlé, C, van Beeck J, Rambaud P, Boundary-layer meteorology 137, 115 (2010). http://doi.org/10.1007/s10546-010-9521-0
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Relationship between the Size of Magnetic Nanoparticles and Efficiency of MRT Imaging of Cerebral Glioma in Rats”. Semkina AS, Abakumov MA, Abakumov AM, Nukolova NV, Chekhonin VP, Bulletin of experimental biology and medicine 161, 292 (2016). http://doi.org/10.1007/S10517-016-3398-Y
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The evolution of twin patterns in perthitic K-feldspar from garnitic pegmatites”. Sánchez-Muñoz L, García-Guinea J, Zagorsky VY, Juwono T, Modreski PJ, Cremades A, Van Tendeloo G, de Moura OJM, Canadian mineralogist 50, 989 (2012). http://doi.org/10.3749/canmin.50.4.989
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Carbon single-electron point source controlled by Coulomb blockade”. Kleshch VI, Porshyn V, Orekhov AS, Orekhov AS, Lützenkirchen-Hecht D, Obraztsov AN, Carbon 171, 154 (2021). http://doi.org/10.1016/j.carbon.2020.09.008
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