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Lujan, G.S.; Magnus, W.; Soree, B.; Pourghaderi, M.A.; Veloso, A.; van Dal, M.J.H.; Lauwers, A.; Kubicek, S.; De Gendt, S.; Heyns, M.; De Meyer, K.; |
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Title |
A new method to calculate leakage current and its applications for sub-45nm MOSFETs |
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H1 Book chapter |
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Year |
2005 |
Publication |
Solid-State Device Research (ESSDERC), European Conference
T2 – ESSDERC 2005 : proceedings of 35th European Solid-State Device Research Conference, September 12-16, 2005, Grenoble, France |
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Pages |
489-492 |
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Keywords |
H1 Book chapter; Condensed Matter Theory (CMT) |
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Abstract |
This paper proposes a new quantum mechanical model for the calculation of leakage currents. The model incorporates both variational calculus and the transfer matrix method to compute the subband energies and the life times of the inversion layer states. The use of variational calculus simplifies the subband energy calculation due to the analytical firm of the wave functions, which offers an attractive perspective towards the calculation of the electron mobility in the channel. The model can be extended to high-k dielectrics with several layers. Good agreement between experimental data and simulation results is obtained for metal gate capacitors. |
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Ieee |
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S.l. |
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000236176200114 |
Publication Date |
2005-12-13 |
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ISBN |
0-7803-9203-5 |
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UA library record; WoS full record |
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Most recent IF: NA |
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Call Number |
UA @ lucian @ c:irua:103691 |
Serial |
2323 |
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Author |
Kollarahithlu, S.C.; Sathiyamoorthy, S.; Thiruvottriyur Shanmugam, S.; De Wael, K.; Das, J.; Veluswamy, P. |
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Title |
Foodborne outbreaks : sources and mode of transmission of foodborne pathogenic microorganisms |
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H1 Book chapter |
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Year |
2023 |
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Pages |
93-104
T2 - Global food safety : microbial interve |
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H1 Book chapter; Antwerp Electrochemical and Analytical Sciences Lab (A-Sense Lab) |
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Abstract |
The foodborne pathogens and microorganisms have played a prevalent role in the ebb and flow of the economy worldwide. The increasing population has strained the food processing industry to produce food in large quantity, which in turn has affected the quality of food. To curb this issue, there is immense pressure to produce and maintain quality food within a short time frame. Hence, high throughput technology is used to determine and timely assess the safety and hygiene of food. Further, the revolution of the food industry has also seen an upsurge of new pathogens and microorganisms, thereby increasing the risk of exposure towards rarest diseases to a larger population. This chapter sheds light on the different types of foodborne pathogens affecting the food industry and its social impact. It further emphasizes the safety measures to be taken on the prevention of the disease from the farm to the processing industries and in turn to the household. |
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978-1-003-28314-0 |
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Most recent IF: NA |
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Call Number |
UA @ admin @ c:irua:200591 |
Serial |
9039 |
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Author |
Jacobs, W.; Floren, E.; Luyckx, D.; Bueken, P.; van Beeck, J.; Van Grieken, R. |
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Title |
Mapping of toxic vapours on board of tankers |
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P3 Proceeding |
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Year |
2011 |
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P3 Proceeding; Economics; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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978-1-905040-85-8 |
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Call Number |
UA @ admin @ c:irua:89790 |
Serial |
8202 |
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Author |
Lubk, A.; Vogel, K.; Wolf, D.; Krehl, J.; Röder, F.; Clark, L.; Guzzinati, G.; Verbeeck, J. |
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Title |
Fundamentals of Focal Series Inline Electron Holography |
Type |
H1 Book chapter |
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Year |
2016 |
Publication |
Advances in imaging and electron physics
T2 – Advances in imaging and electron physics / Hawkes, P.W. [edit.] |
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105-147 |
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H1 Book chapter; Electron microscopy for materials research (EMAT) |
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Elsevier BV |
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Publication Date |
2016-09-24 |
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1076-5670; http://id.crossref.org/isbn/9780128048115 |
ISBN |
9780128048115 |
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UA library record |
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Notes |
L.C., G.G., and J.V. acknowledge funding from the European Research Council under the 7th Framework Program (FP7), ERC Starting Grant no. 278510 VORTEX. A.L., K.V., J. K., D.W., and F.R. acknowledge funding from the DIP of the Deutsche Forschungsgesellschaft.; ECASJO_; |
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Most recent IF: NA |
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EMAT @ emat @ c:irua:140097UA @ admin @ c:irua:140097 |
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4419 |
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