|
Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
|
Schryvers, D.; Van Tendeloo, G.; van Landuyt, J.; Amelinckx, S. |
Some examples of electron microscopy studies of microstructures and phase transitions in solids |
1995 |
Meccanica |
30 |
1 |
UA library record; WoS full record; WoS citing articles |
|
Goessens, C.; Schryvers, D.; van Landuyt, J.; Amelinckx, S.; de Keyzer, R. |
Long period surface ordering of iodine ions in mixed tabular AgBr-AgBrI microcrystals |
1995 |
Surface science : a journal devoted to the physics and chemistry of interfaces |
337 |
10 |
UA library record; WoS full record; WoS citing articles |
|
Ivanov, V.; Nagy, J.B.; Lambin, P.; Lucas, A.; Zhang, X.B.; Zhang, X.F.; Bernaerts, D.; Van Tendeloo, G.; Amelinckx, S.; van Landuyt, J. |
The study of carbon nanotubes produced by catalytic method |
1994 |
Chemical physics letters |
223 |
405 |
UA library record; WoS full record; WoS citing articles |
|
Ivanov, V.; Nagy, J.B.; Lambin, P.; Lucas, A.; Zhang, X.B.; Zhang, X.F.; Bernaerts, D.; Van Tendeloo, G.; Amelinckx, S.; van Landuyt, J. |
The study of carbon nanotubules produced by catalytic method |
1994 |
Chemical physics letters |
223 |
405 |
UA library record; WoS full record; WoS citing articles |
|
Deveirman, A.; van Landuyt, J.; Vanhellemont, J.; Maes, H.E.; Yallup, K. |
Defects in high-dose oxygen implanted silicon : a TEM study |
1991 |
Vacuum: the international journal and abstracting service for vacuum science and technology
T2 – 1ST SIOMX WORKSHOP ( SEPARATION BY IMPLANTATION OF OXYGEN ) ( SWI-88 ), NOV 07-08, 1988, UNIV SURREY, GUILDFORD, ENGLAND |
42 |
4 |
UA library record; WoS full record; WoS citing articles |
|
De Gryse, O.; Clauws, P.; Rossou, L.; van Landuyt, J.; Vanhellemont, J. |
Accurate infrared absorption measurement of interstitial and precipitated oxygen in p+ silicon wafers |
1999 |
Microelectronic engineering |
45 |
|
UA library record; WoS full record |
|
Nistor, L.C.; van Landuyt, J.; Barton, J.D.; Hole, D.E.; Skelland, N.D.; Townsend, P.D. |
Colloid size distributions in ion implanted glass |
1993 |
Journal of non-crystalline solids |
162 |
63 |
UA library record; WoS full record; WoS citing articles |
|
Hole, D.E.; Townsend, P.D.; Barton, J.D.; Nistor, L.C.; van Landuyt, J. |
Gallium colloid formation during ion implantation of glass |
1995 |
Journal of non-crystalline solids |
180 |
34 |
UA library record; WoS full record; WoS citing articles |
|
Volkov, V.V.; van Landuyt, J.; Marushkin, K.M.; Gijbels, R.; Férauge, C.; Vasilyev, M.G.; Shelyakin, A.A.; Sokolovsky, A.A. |
Characterization of LPE grown InGaAsP/InP heterostructures: IR-LED at 1.66 μm used for the remote monitoring of methane gas |
1997 |
Journal of crystal growth |
173 |
4 |
UA library record; WoS full record; WoS citing articles |
|
van Renterghem, W.; Goessens, C.; Schryvers, D.; van Landuyt, J.; Verrept, P.; Bollen, D.; van Roost, C.; de Keyzer, R. |
Defects and growth mechanisms of AgCl(100) tabular crystals |
1998 |
Journal of crystal growth |
187 |
8 |
UA library record; WoS full record; WoS citing articles |
|
Goessens, C.; Schryvers, D.; van Landuyt, J.; de Keyzer, R. |
Electron microscopical investigation of tetrahedral-shaped AgBr microcrystals |
1997 |
Journal of crystal growth |
172 |
15 |
UA library record; WoS full record; WoS citing articles |
|
Frangis, N.; Stoemenos, J.; van Landuyt, J.; Nejim, A.; Hemment, P.L.F. |
The formation of 3C-SiC in crystalline Si by carbon implantation at 9500C and annealing: a structural study |
1997 |
Journal of crystal growth |
181 |
9 |
UA library record; WoS full record; WoS citing articles |
|
Frangis, N.; van Landuyt, J.; Kaltsas, G.; Travlos, A.; Nassiopoulos, A.G. |
Growth of erbium-silicide films on (100) silicon as characterised by electron microscopy and diffraction |
1997 |
Journal of crystal growth |
172 |
29 |
UA library record; WoS full record; WoS citing articles |
|
Bernaerts, D.; Amelinckx, S.; Van Tendeloo, G.; van Landuyt, J. |
Microstructure and formation mechanisms of cylindrical and conical scrolls of the misfit layer compounds PbNbnS2n+1 |
1997 |
Journal of crystal growth |
172 |
23 |
UA library record; WoS full record; WoS citing articles |
|
Lioutas, C.B.; Manolikas, C.; Van Tendeloo, G.; van Landuyt, J. |
A 2a2b3c superstructure in hexagonal NiS1-x: a study by means of electron diffraction and HREM |
1993 |
Journal of crystal growth |
126 |
4 |
UA library record; WoS full record; WoS citing articles |
|
Lioutas, C.B.; Manolikas, C.; Van Tendeloo, G.; van Landuyt, J. |
A 2a2a3c superstructure in hexagonal Ni1-xS : a study by means of electron-diffraction and HRTEM |
1993 |
Journal of crystal growth |
126 |
4 |
UA library record; WoS full record; WoS citing articles |
|
Zhang, X.F.; Zhang, X.B.; Van Tendeloo, G.; Amelinckx, S.; op de Beeck, M.; van Landuyt, J. |
Carbon nano-tubes: their formation process and observation by electron microscopy |
1993 |
Journal of crystal growth |
130 |
190 |
UA library record; WoS full record; WoS citing articles |
|
Goessens, C.; Schryvers, D.; van Landuyt, J.; Amelinckx, S.; Verbeeck, A.; de Keyzer, R. |
Characterization of crystal defects in mixed tabular silver halide grains by conventional transmission electron microscopy and X-ray diffractometry |
1991 |
Journal of crystal growth |
110 |
40 |
UA library record; WoS full record; WoS citing articles |
|
Amelinckx, S.; Luyten, W.; Krekels, T.; Van Tendeloo, G.; van Landuyt, J. |
Conical, helically woud, graphite whiskers: a limliting member of the “fullerenes”? |
1992 |
Journal of crystal growth |
121 |
43 |
UA library record; WoS full record; WoS citing articles |
|
Goessens, C.; Schryvers, D.; van Landuyt, J.; Millan, A.; de Keyzer, R. |
Electron microscopical investigation of AgBr needle crystals |
1995 |
Journal of crystal growth |
151 |
14 |
UA library record; WoS full record; WoS citing articles |
|
Ghica, C.; Nistor, L.; Bender, H.; Steegen, A.; Lauwers, A.; Maex, K.; van Landuyt, J. |
In situ transmission electron microscopy study of the silicidation process in Co thin films on patterned (001) Si substrates |
2001 |
Journal of materials research |
16 |
4 |
UA library record; WoS full record; WoS citing articles |
|
Nistor, L.C.; van Landuyt, J. |
Structural studies of diamond thin films grown from the arc plasma |
1998 |
Journal of materials research |
12 |
13 |
UA library record; WoS full record; WoS citing articles |
|
Verheijen, M.A.; Meekes, H.; Meijer, G.; Bennema, P.; de Boer, J.L.; van Smaalen, S.; Van Tendeloo, G.; Amelinckx, S.; Muto, S.; van Landuyt, J. |
The structure of different phases of pure C70 crystals |
1992 |
Chemical physics |
166 |
168 |
UA library record; WoS full record; WoS citing articles |
|
de Gryse, O.; Clauws, P.; Rossou, L.; van Landuyt, J.; Vanhellemont, J. |
Accurate infrared spectroscopy determination of interstitial and precipitated oxygen in highly doped Czochralski-grown silicon |
1999 |
The review of scientific instruments |
70 |
5 |
UA library record; WoS full record; WoS citing articles |
|
de Gryse, O.; Vanhellemont, J.; Clauws, P.; Lebedev, O.; van Landuyt, J.; Simoen, E.; Claeys, C. |
A novel approach to analyse FTIR spectra of precipitates in boron-doped silicon |
2003 |
Physica: B : condensed matter
T2 – 22nd International Conference on Defects in Semiconductors (ICDS-22), JUL 28-AUG 01, 2003, UNIV AARHUS, AARHUS, DENMARK |
340 |
4 |
UA library record; WoS full record; WoS citing articles |
|
de Gryse, O.; Clauws, P.; Lebedev, O.; van Landuyt, J.; Vanhellemont, J.; Claeys, C.; Simoen, E. |
Chemical and structural characterization of oxygen precipitates in silicon by infrared spectroscopy and TEM |
2001 |
Physica: B : condensed matter
T2 – 21st International Conference on Defects in Semiconductors, JUL 16-20, 2001, GIESSEN, GERMANY |
308 |
3 |
UA library record; WoS full record; WoS citing articles |
|
Mihailescu, I.N.; Gyorgy, E.; Marin, G.; Popescu, M.; Teodorescu, V.S.; van Landuyt, J.; Grivas, C.; Hatziapostolou, A. |
Crystalline structure of very hard tungsten carbide thin films obtained by reactive pulsed laser deposition |
1999 |
Journal of vacuum science and technology: A: vacuum surfaces and films |
17 |
8 |
UA library record; WoS full record; WoS citing articles |
|
De Meulenaere, P.; Van Tendeloo, G.; van Landuyt, J. |
The study of partially ordered 11/20 alloys by HREM |
1993 |
Microscopy research and technique |
25 |
|
UA library record; WoS full record |
|
Goessens, C.; Schryvers, D.; van Landuyt, J. |
Transmission electron microscopy studies of (111) twinned silver halide microcrystals |
1998 |
Microscopy research and technique |
42 |
8 |
UA library record; WoS full record; WoS citing articles |
|
Frangis, N.; van Landuyt, J.; Grimaldi, M.G.; Calcagno, L. |
Electron microscopy and Rutherford backscattering spectrometry characterisation of 6H SiC samples implanted with He+ |
1996 |
Nuclear instruments and methods in physics research: B: beam interactions with materials and atoms
T2 – Symposium 1 on New Trends in Ion Beam Processing of Materials, at the, E-MRS 96 Spring Meeting, June 04-07, 1996, Strasbourg, France |
120 |
2 |
UA library record; WoS full record; WoS citing articles |