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Author Title Year Publication Volume Times cited Additional Links
Bals, S.; Radmilovic, V.; Kisielowski, C. TEM annular objective apertures fabricated by FIB 2004 Microscopy and microanalysis 10 UA library record
Ke, X.; Bals, S.; Cott, D.; Hantschel, T.; Bender, H.; Van Tendeloo, G. Three-dimensional analysis of carbon nanotube networks in interconnects by electron tomography without missing wedge artifacts 2010 Microscopy and microanalysis 16 42 UA library record; WoS full record; WoS citing articles
Goris, B.; Freitag, B.; Zanaga, D.; Bladt, E.; Altantzis, T.; Ringnalda, J.; Bals, S. Towards quantitative EDX results in 3 dimensions 2014 Microscopy and microanalysis 20 UA library record
Batenburg, K.J.; Bals, S.; Van Aert, S.; Roelandts, T.; Sijbers, J. Ultra-high resolution electron tomography for materials science : a roadmap 2011 Microscopy and microanalysis 17 UA library record
Masenelli-Varlot, K.; Malchere, A.; Ferreira, J.; Heidari Mezerji, H.; Bals, S.; Messaoudi, C.; Garrido, S.M. Wet-STEM tomography : principles, potentialities and limitations 2014 Microscopy and microanalysis 20 9 UA library record; WoS full record; WoS citing articles
Gjorgievska, E.; Van Tendeloo, G.; Nicholson, J.W.; Coleman, N.J.; Slipper, I.J.; Booth, S. The incorporation of nanoparticles into conventional glass-ionomer dental restorative cements 2015 Microscopy and microanalysis 21 15 UA library record; WoS full record; WoS citing articles
Heidari, H.; Rivero, G.; Idrissi, H.; Ramachandran, D.; Cakir, S.; Egoavil, R.; Kurttepeli, M.; Crabbé, A.C.; Hauffman, T.; Terryn, H.; Du Prez, F.; Schryvers, D. Melamine–Formaldehyde Microcapsules: Micro- and Nanostructural Characterization with Electron Microscopy 2016 Microscopy and microanalysis 22 2 UA library record; WoS full record; WoS citing articles
Jones, L.; Martinez, G.T.; Béché, A.; Van Aert, S.; Nellist, P.D. Getting the best from an imperfect detector : an alternative normalisation procedure for quantitative HAADF STEM 2014 Microscopy and microanalysis 20 UA library record
Nord, M.; Verbeeck, J. Towards Reproducible and Transparent Science of (Big) Electron Microscopy Data Using Version Control 2019 Microscopy and microanalysis T2 – Microscopy & Microanalysis 2019, 4-8 August, 2019, Portland, Oregon 25 UA library record
Nord, M.; Verbeeck, J. Open Source Development Tools for Robust and Reproducible Electron Microscopy Data Analysis 2019 Microscopy And Microanalysis 25
Denecke, M.A.; Somogyi, A.; Janssens, K.; Simon, R.; Dardenne, K.; Noseck, U. Microanalysis (micro-XRF, micro-XANES, and micro-XRD) of a tertiary sediment using microfocused synchrotron radiation 2007 Microscopy and microanalysis 13 31 UA library record; WoS full record; WoS citing articles
van der Linden, V.; Meesdom, E.; Devos, A.; van Dooren, R.; Nieuwdorp, H.; Janssen, E.; Balace, S.; Vekemans, B.; Vincze, L.; Janssens, K. PXRF, \mu-XRF, vacuum \mu-XRF, and EPMA analysis of Email Champlevé objects present in Belgian museums 2011 Microscopy and microanalysis 17 9 UA library record; WoS full record; WoS citing articles
MacArthur, K.E.; Yankovich, A.B.; Béché, A.; Luysberg, M.; Brown, H.G.; Findlay, S.D.; Heggen, M.; Allen, L.J. Optimizing Experimental Conditions for Accurate Quantitative Energy-Dispersive X-ray Analysis of Interfaces at the Atomic Scale 2021 Microscopy And Microanalysis UA library record; WoS full record; WoS citing articles
Esteban, D.A.; Vanrompay, H.; Skorikov, A.; Béché, A.; Verbeeck, J.; Freitag, B.; Bals, S. Fast electron low dose tomography for beam sensitive materials 2021 Microscopy And Microanalysis 27 UA library record
Neelisetty, K.K.; Kumar C.N., S.; Kashiwar, A.; Scherer, T.; Chakravadhanula, V.S.K.; Kuebel, C. Novel thin film lift-off process for in situ TEM tensile characterization 2021 Microscopy And Microanalysis 27 UA library record
Neyts, E.C.; Bogaerts, A. Combining molecular dynamics with Monte Carlo simulations : implementations and applications 2013 Theoretical chemistry accounts : theory, computation, and modeling 132 27 UA library record; WoS full record; WoS citing articles
Phung, Q.M.; Vancoillie, S.; Delabie, A.; Pourtois, G.; Pierloot, K. Ruthenocene and cyclopentadienyl pyrrolyl ruthenium as precursors for ruthenium atomic layer deposition : a comparative study of dissociation enthalpies 2012 Theoretical chemistry accounts : theory, computation, and modeling 131 5 UA library record; WoS full record; WoS citing articles
Orlinskii, S.B.; Bogomolov, R.S.; Kiyamova, A.M.; Yavkin, B.V.; Mamin, G.M.; Turner, S.; Van Tendeloo, G.; Shiryaev, A.A.; Vlasov, I.I.; Shenderova, O. Identification of substitutional nitrogen and surface paramagnetic centers in nanodiamond of dynamic synthesis by electron paramagnetic resonance 2011 Nanoscience and nanotechnology letters 3 14 UA library record; WoS full record; WoS citing articles
Lemberge, P.; Deraedt, I.; Janssens, K.; van Espen, P. Quantitative analysis of 16-17th century archaeological glass vessels using PLS regression of EPXMA and μ-XRF data 2000 Journal of chemometrics 14 UA library record; WoS full record; WoS citing articles
Amin-Ahmadi, B.; Idrissi, H.; Galceran, M.; Colla, M.S.; Raskin, J.P.; Pardoen, T.; Godet, S.; Schryvers, D. Effect of deposition rate on the microstructure of electron beam evaporated nanocrystalline palladium thin films 2013 Thin solid films : an international journal on the science and technology of thin and thick films 539 13 UA library record; WoS full record; WoS citing articles
E. Zaghi, A.; Buffière, M.; Koo, J.; Brammertz, G.; Batuk, M.; Verbist, C.; Hadermann, J.; Kim, W.K.; Meuris, M.; Poortmans, J.; Vleugels, J.; Effect of selenium content of CuInSex alloy nanopowder precursors on recrystallization of printed CuInSe2 absorber layers during selenization heat treatment 2014 Thin solid films : an international journal on the science and technology of thin and thick films 7 UA library record; WoS full record; WoS citing articles
Batuk, M.; Buffiere, M.; Zaghi, A.E.; Lenaers, N.; Verbist, C.; Khelifi, S.; Vleugels, J.; Meuris, M.; Hadermann, J. Effect of the burn-out step on the microstructure of the solution-processed Cu(In,Ga)Se2 solar cells 2015 Thin solid films : an international journal on the science and technology of thin and thick films 583 5 UA library record; WoS full record; WoS citing articles
Laffez, P.; Chen, X.Y.; Banerjee, G.; Pezeril, T.; Rossell, M.D.; Van Tendeloo, G.; Lacorre, P.; Liu, J.M.; Liu, Z.-G. Growth of La2Mo2O9 films on porous Al2O3 substrates by radio frequency magnetron sputtering 2006 Thin solid films : an international journal on the science and technology of thin and thick films 500 15 UA library record; WoS full record; WoS citing articles
Jehanathan, N.; Georgieva, V.; Saraiva, M.; Depla, D.; Bogaerts, A.; Van Tendeloo, G. The influence of Cr and Y on the micro structural evolution of Mg―Cr―O and Mg―Y―O thin films 2011 Thin solid films : an international journal on the science and technology of thin and thick films 519 4 UA library record; WoS full record; WoS citing articles
Mahieu, S.; Ghekiere, P.; de Winter, G.; Depla, D.; de Gryse, R.; Lebedev, O.I.; Van Tendeloo, G. Influence of the Ar/O2 ratio on the growth and biaxial alignment of yttria stabilized zirconia layers during reactive unbalanced magnetron sputtering 2005 Thin solid films : an international journal on the science and technology of thin and thick films 484 23 UA library record; WoS full record; WoS citing articles
Espinosa, E.H.; Lonescu, R.; Bittencourt, C.; Felten, A.; Erni, R.; Van Tendeloo, G.; Pireaux, J.-J.; Llobet, E. Metal-decorated multi-wall carbon nanotubes for low temperature gas sensing 2007 Thin solid films : an international journal on the science and technology of thin and thick films 515 86 UA library record; WoS full record; WoS citing articles
Schryvers, D.; Yandouzi, M.; Toth, L. TEM study of B2 + L12 decomposition in a nanoscale Ni-rich Ni-Al film 1998 Thin solid films : an international journal on the science and technology of thin and thick films 326 1 UA library record; WoS full record; WoS citing articles
Samani, M.K.; Ding, X.Z.; Khosravian, N.; Amin-Ahmadi, B.; Yi, Y.; Chen, G.; Neyts, E.C.; Bogaerts, A.; Tay, B.K. Thermal conductivity of titanium nitride/titanium aluminum nitride multilayer coatings deposited by lateral rotating cathode arc 2015 Thin solid films : an international journal on the science and technology of thin and thick films 578 41 UA library record; WoS full record; WoS citing articles
Conard, T.; de Witte, H.; Loo, R.; Verheyen, P.; Vandervorst, W.; Caymax, M.; Gijbels, R. XPS and TOFSIMS studies of shallow Si/Si1-xGex/Si layers 1999 Thin solid films : an international journal on the science and technology of thin and thick films 343/344 1 UA library record; WoS full record; WoS citing articles
Forsh, E.A.; Abakumov, A.M.; Zaytsev, V.B.; Konstantinova, E.A.; Forsh, P.A.; Rumyantseva, M.N.; Gaskov, A.M.; Kashkarov, P.K. Optical and photoelectrical properties of nanocrystalline indium oxide with small grains 2015 Thin solid films : an international journal on the science and technology of thin and thick films 595 18 UA library record; WoS full record; WoS citing articles