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  Author Title Year Publication Volume Times cited Additional Links Links
Fedina, L.; van Landuyt, J.; Vanhellemont, J.; Aseev, A.L. Observation of vacancy clustering in FZ-Si crystals during in situ electron irradiation in a high voltage electron microscope 1996 Nuclear instruments and methods in physics research B112 4 UA library record; WoS full record; WoS citing articles doi
Goessens, C.; Schryvers, D.; van Landuyt, J. Transmission electron microscopy studies of (111) twinned silver halide microcrystals 1998 Microscopy research and technique 42 8 UA library record; WoS full record; WoS citing articles doi
De Meulenaere, P.; Van Tendeloo, G.; van Landuyt, J. The study of partially ordered 11/20 alloys by HREM 1993 Microscopy research and technique 25 UA library record; WoS full record pdf doi
Mihailescu, I.N.; Gyorgy, E.; Marin, G.; Popescu, M.; Teodorescu, V.S.; van Landuyt, J.; Grivas, C.; Hatziapostolou, A. Crystalline structure of very hard tungsten carbide thin films obtained by reactive pulsed laser deposition 1999 Journal of vacuum science and technology: A: vacuum surfaces and films 17 8 UA library record; WoS full record; WoS citing articles pdf doi
de Gryse, O.; Vanhellemont, J.; Clauws, P.; Lebedev, O.; van Landuyt, J.; Simoen, E.; Claeys, C. A novel approach to analyse FTIR spectra of precipitates in boron-doped silicon 2003 Physica: B : condensed matter T2 – 22nd International Conference on Defects in Semiconductors (ICDS-22), JUL 28-AUG 01, 2003, UNIV AARHUS, AARHUS, DENMARK 340 4 UA library record; WoS full record; WoS citing articles doi
de Gryse, O.; Clauws, P.; Lebedev, O.; van Landuyt, J.; Vanhellemont, J.; Claeys, C.; Simoen, E. Chemical and structural characterization of oxygen precipitates in silicon by infrared spectroscopy and TEM 2001 Physica: B : condensed matter T2 – 21st International Conference on Defects in Semiconductors, JUL 16-20, 2001, GIESSEN, GERMANY 308 3 UA library record; WoS full record; WoS citing articles pdf doi
de Gryse, O.; Clauws, P.; Rossou, L.; van Landuyt, J.; Vanhellemont, J. Accurate infrared spectroscopy determination of interstitial and precipitated oxygen in highly doped Czochralski-grown silicon 1999 The review of scientific instruments 70 5 UA library record; WoS full record; WoS citing articles doi
Verheijen, M.A.; Meekes, H.; Meijer, G.; Bennema, P.; de Boer, J.L.; van Smaalen, S.; Van Tendeloo, G.; Amelinckx, S.; Muto, S.; van Landuyt, J. The structure of different phases of pure C70 crystals 1992 Chemical physics 166 168 UA library record; WoS full record; WoS citing articles doi
Ghica, C.; Nistor, L.; Bender, H.; Steegen, A.; Lauwers, A.; Maex, K.; van Landuyt, J. In situ transmission electron microscopy study of the silicidation process in Co thin films on patterned (001) Si substrates 2001 Journal of materials research 16 4 UA library record; WoS full record; WoS citing articles doi
Nistor, L.C.; van Landuyt, J. Structural studies of diamond thin films grown from the arc plasma 1998 Journal of materials research 12 13 UA library record; WoS full record; WoS citing articles
Lioutas, C.B.; Manolikas, C.; Van Tendeloo, G.; van Landuyt, J. A 2a2b3c superstructure in hexagonal NiS1-x: a study by means of electron diffraction and HREM 1993 Journal of crystal growth 126 4 UA library record; WoS full record; WoS citing articles
Lioutas, C.B.; Manolikas, C.; Van Tendeloo, G.; van Landuyt, J. A 2a2a3c superstructure in hexagonal Ni1-xS : a study by means of electron-diffraction and HRTEM 1993 Journal of crystal growth 126 4 UA library record; WoS full record; WoS citing articles pdf doi
Zhang, X.F.; Zhang, X.B.; Van Tendeloo, G.; Amelinckx, S.; op de Beeck, M.; van Landuyt, J. Carbon nano-tubes: their formation process and observation by electron microscopy 1993 Journal of crystal growth 130 190 UA library record; WoS full record; WoS citing articles doi
Goessens, C.; Schryvers, D.; van Landuyt, J.; Amelinckx, S.; Verbeeck, A.; de Keyzer, R. Characterization of crystal defects in mixed tabular silver halide grains by conventional transmission electron microscopy and X-ray diffractometry 1991 Journal of crystal growth 110 40 UA library record; WoS full record; WoS citing articles
Amelinckx, S.; Luyten, W.; Krekels, T.; Van Tendeloo, G.; van Landuyt, J. Conical, helically woud, graphite whiskers: a limliting member of the “fullerenes”? 1992 Journal of crystal growth 121 43 UA library record; WoS full record; WoS citing articles doi
Goessens, C.; Schryvers, D.; van Landuyt, J.; Millan, A.; de Keyzer, R. Electron microscopical investigation of AgBr needle crystals 1995 Journal of crystal growth 151 14 UA library record; WoS full record; WoS citing articles doi
Volkov, V.V.; van Landuyt, J.; Marushkin, K.M.; Gijbels, R.; Férauge, C.; Vasilyev, M.G.; Shelyakin, A.A.; Sokolovsky, A.A. Characterization of LPE grown InGaAsP/InP heterostructures: IR-LED at 1.66 μm used for the remote monitoring of methane gas 1997 Journal of crystal growth 173 4 UA library record; WoS full record; WoS citing articles
van Renterghem, W.; Goessens, C.; Schryvers, D.; van Landuyt, J.; Verrept, P.; Bollen, D.; van Roost, C.; de Keyzer, R. Defects and growth mechanisms of AgCl(100) tabular crystals 1998 Journal of crystal growth 187 8 UA library record; WoS full record; WoS citing articles doi
Goessens, C.; Schryvers, D.; van Landuyt, J.; de Keyzer, R. Electron microscopical investigation of tetrahedral-shaped AgBr microcrystals 1997 Journal of crystal growth 172 15 UA library record; WoS full record; WoS citing articles
Frangis, N.; Stoemenos, J.; van Landuyt, J.; Nejim, A.; Hemment, P.L.F. The formation of 3C-SiC in crystalline Si by carbon implantation at 9500C and annealing: a structural study 1997 Journal of crystal growth 181 9 UA library record; WoS full record; WoS citing articles
Frangis, N.; van Landuyt, J.; Kaltsas, G.; Travlos, A.; Nassiopoulos, A.G. Growth of erbium-silicide films on (100) silicon as characterised by electron microscopy and diffraction 1997 Journal of crystal growth 172 29 UA library record; WoS full record; WoS citing articles
Bernaerts, D.; Amelinckx, S.; Van Tendeloo, G.; van Landuyt, J. Microstructure and formation mechanisms of cylindrical and conical scrolls of the misfit layer compounds PbNbnS2n+1 1997 Journal of crystal growth 172 23 UA library record; WoS full record; WoS citing articles
Nistor, L.C.; van Landuyt, J.; Barton, J.D.; Hole, D.E.; Skelland, N.D.; Townsend, P.D. Colloid size distributions in ion implanted glass 1993 Journal of non-crystalline solids 162 63 UA library record; WoS full record; WoS citing articles doi
Hole, D.E.; Townsend, P.D.; Barton, J.D.; Nistor, L.C.; van Landuyt, J. Gallium colloid formation during ion implantation of glass 1995 Journal of non-crystalline solids 180 34 UA library record; WoS full record; WoS citing articles doi
De Gryse, O.; Clauws, P.; Rossou, L.; van Landuyt, J.; Vanhellemont, J. Accurate infrared absorption measurement of interstitial and precipitated oxygen in p+ silicon wafers 1999 Microelectronic engineering 45 UA library record; WoS full record doi
Deveirman, A.; van Landuyt, J.; Vanhellemont, J.; Maes, H.E.; Yallup, K. Defects in high-dose oxygen implanted silicon : a TEM study 1991 Vacuum: the international journal and abstracting service for vacuum science and technology T2 – 1ST SIOMX WORKSHOP ( SEPARATION BY IMPLANTATION OF OXYGEN ) ( SWI-88 ), NOV 07-08, 1988, UNIV SURREY, GUILDFORD, ENGLAND 42 4 UA library record; WoS full record; WoS citing articles pdf doi
Ivanov, V.; Nagy, J.B.; Lambin, P.; Lucas, A.; Zhang, X.B.; Zhang, X.F.; Bernaerts, D.; Van Tendeloo, G.; Amelinckx, S.; van Landuyt, J. The study of carbon nanotubes produced by catalytic method 1994 Chemical physics letters 223 405 UA library record; WoS full record; WoS citing articles
Ivanov, V.; Nagy, J.B.; Lambin, P.; Lucas, A.; Zhang, X.B.; Zhang, X.F.; Bernaerts, D.; Van Tendeloo, G.; Amelinckx, S.; van Landuyt, J. The study of carbon nanotubules produced by catalytic method 1994 Chemical physics letters 223 405 UA library record; WoS full record; WoS citing articles pdf doi
Goessens, C.; Schryvers, D.; van Landuyt, J.; Amelinckx, S.; de Keyzer, R. Long period surface ordering of iodine ions in mixed tabular AgBr-AgBrI microcrystals 1995 Surface science : a journal devoted to the physics and chemistry of interfaces 337 10 UA library record; WoS full record; WoS citing articles doi
Schryvers, D.; Van Tendeloo, G.; van Landuyt, J.; Amelinckx, S. Some examples of electron microscopy studies of microstructures and phase transitions in solids 1995 Meccanica 30 1 UA library record; WoS full record; WoS citing articles doi
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