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Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Links |
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Herrebout, D.; Bogaerts, A.; Yan, M.; Goedheer, W.; Dekempeneer, E.; Gijbels, R. |
An extended RF methane plasma 1D fluid model of interest in deposition of diamond-like carbon layers |
2000 |
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UA library record |
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Charlier, E.; Gijbels, R.; Van Doorselaer, M.; De Keyzer, R. |
Functioning of thiocyanate ions during sulphur and sulphur-plus-gold Sensitization |
2000 |
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UA library record; WoS full record; |
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Bogaerts, A. |
Glow discharge mass spectrometry, methods |
2000 |
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UA library record |
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Giorgio, S.; Henry, C.R.; Pauwels, B.; Van Tendeloo, G. |
Gold particles supported on TiO2 |
2000 |
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UA library record |
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Kuhn, L.T.; Vanhoutte, F.; Cannaerts, M.; Neukermans, S.; Verschoren, G.; Bouwen, W.; van Haesendonck, C.; Lievens, P.; Silverans, R.E.; Pauwels, B.; Van Tendeloo, G. |
Granular films assembled of CoN, CrM and mixtures of CoN and CrM clusters: structure and electron transport properties |
2000 |
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UA library record |
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Riva, C.; Peeters, F.M.; Varga, K. |
Ground state of excitons and charged excitons in a quantum well |
2000 |
Physica status solidi: A: applied research
T2 – 6th International Conference on Optics of Excitons in Confined Systems, (OECS-6), AUG 30-SEP 02, 1999, ASCONA, SWITZERLAND |
178 |
16 |
UA library record; WoS full record; WoS citing articles |
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Lebedev, O.I.; Van Tendeloo, G.; Amelinckx, S.; Ju, H.L.; Krishnan, K.M. |
High-resolution electron microscopy study of strained epitaxial La0.7Sr0.3MnO3 thin films |
2000 |
Philosophical magazine: A: physics of condensed matter: defects and mechanical properties |
80 |
52 |
UA library record; WoS full record; WoS citing articles |
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Van Tendeloo, G.; Krekels, T. |
Identification of new superconducting compounds by electron microscopy |
2000 |
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UA library record |
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Schuddinck, W.; Van Tendeloo, G.; Martin, C.; Hervieu, M.; Raveau, B. |
Influence of oxygen content on the charge-ordering process in La0.5Ca0.5MnO3 |
2000 |
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UA library record |
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Schweigert, I.V.; Schweigert, V.A.; Peeters, F.M. |
Influence of the lattice symmetry on melting of the bilayer Wigner crystal |
2000 |
Journal de physique: 4
T2 – International Conference on Strongly Coupled Coulomb Systems, SEP 04-10, 1999, ST MALO, FRANCE |
10 |
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UA library record; WoS full record |
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Schryvers, D.; Boullay, P.; Potapov, P.; Satto, C. |
Martensitic transformations studied on nano- and microscopic length scales |
2000 |
Festkörperprobleme |
40 |
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UA library record |
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Bogaerts, A.; Gijbels, R. |
Modeling network for argon glow discharges: the output cannot be better than the input |
2000 |
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1 |
UA library record; WoS full record; WoS citing articles |
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Bogaerts, A.; Gijbels, R. |
Modeling of radio-frequency and direct current glow discharges in argon |
2000 |
Journal of technical physics |
41 |
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UA library record |
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Jochum, K.P.; Gijbels, R.; Adriaens, A. |
Multielementmassenspektrometrie (MMS) |
2000 |
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UA library record |
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van Vaeck, L.; van Espen, P.; Gijbels, R.; Baykut, G.; Laukien, F.H. |
A new electrostatic transfer line for improved transmission in Fourier transform laser microprobe mass spectrometry with external ion source |
2000 |
European mass spectrometry |
6 |
10 |
UA library record; WoS full record; WoS citing articles |
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Gijbels, R.; Verlinden, G.; Geuens, I. |
SIMS/TOF-SIMS study of microparticles: surface analysis, imaging and quantification |
2000 |
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UA library record; WoS full record; |
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Lebedev, O.I.; Van Tendeloo, G.; Amelinckx, S. |
Strained La1-xSrxMnO3 (x = 0.1 – 0.3) thin films studied by HREM |
2000 |
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UA library record |
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Hadermann, J.; Abakumov, A.M.; Lebedev, O.I.; Antipov, E.V.; Van Tendeloo, G. |
Structural changes in fluorinated T{'} and T* phases |
2000 |
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UA library record |
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Pauwels, B.; Van Tendeloo, G.; Bouwen, W.; Kuhn, L.T.; Lievens, P. |
Structural properties of Au clusters on MgO |
2000 |
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UA library record |
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Hadermann, J.; Van Tendeloo, G.; Abakumov, A.M.; Pavlyuk, B.P.; Rozova, M.G.; Antipov, E.V. |
Structural transformation in fluorinated LaACuGaO5 (A=Ca, Sr) brownmillerites |
2000 |
International journal of inorganic materials |
2 |
13 |
UA library record; WoS full record; WoS citing articles |
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de Witte, H.; Conard, T.; Vandervorst, W.; Gijbels, R. |
Study of oxynitrides with dual beam TOF-SIMS |
2000 |
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UA library record |
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Van Tendeloo, G.; Pauwels, B.; Geuens, P.; Lebedev, O. |
TEM of nanostructured materials |
2000 |
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31 |
UA library record; WoS full record; WoS citing articles |
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Van Tendeloo, G. |
TEM of phase transitions in tridymite and cristobalite based materials |
2000 |
Microscoy and microanalysis |
6 |
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UA library record |
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Lenaerts, J.; Verlinden, G.; Gijbels, R.; Geuens, I.; Callant, P. |
The exchange of fluorinated dyes between different types of silver halide microcrystals studied by time of flight secondary ion mass spectrometry (TOF-SIMS) |
2000 |
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UA library record; WoS full record; |
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Van Renterghem, W.; Karthauser, S.; Schryvers, D.; van Landuyt, J.; De Keyzer, R.; Van Roost, C. |
The influence of the precipitation method on defect formation in multishell AgBrI (111) tabular crystals |
2000 |
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UA library record; WoS full record; |
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Lenaerts, J.; Verlinden, G.; van Vaeck, L.; Gijbels, R.; Geuens, I. |
TOF-SIMS analysis of carbocyanine dyes adsorbed on silver substrates |
2000 |
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UA library record |
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de Witte, H.; Conard, T.; Sporken, R.; Gouttebaron, R.; Magnee, R.; Vandervorst, W.; Caudano, R.; Gijbels, R. |
XPS study of ion induced oxidation of silicon with and without oxygen flooding |
2000 |
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UA library record |
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Charlier, E.; van Doorselaer, M.; Gijbels, R.; de Keyzer, R.; Geuens, I. |
Unveiling the composition of sulphur sensitization specks by their interactions with TAI |
2000 |
Journal Of Imaging Science And Technology |
44 |
16 |
UA library record; WoS full record; WoS citing articles |
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Dluzewski, P.; Pietraszko, A.; Kozlowski, M.; Szczepanska, A.; Gorecka, J.; Baran, M.; Leonyuk, L.; Babonas, G.J.; Lebedev, O.I.; Szymczak, R. |
Electron microscopy and X-ray structural investigations of incommensurate spin-ladder Sr4.1Ca4.7Bi0.3Cu17O29 single crystals |
2000 |
Acta physica Polonica: A: general physics, solid state physics, applied physics |
98 |
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UA library record; WoS full record; |
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Laffez, P.; Retoux, R.; Boullay, P.; Zaghrioui, M.; Lacorre, P.; Van Tendeloo, G. |
Transmission electron microscopy of NdNiO3 thin films on silicon substrates |
2000 |
European physical journal: applied physics |
12 |
16 |
UA library record; WoS full record; WoS citing articles |
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