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  Author Title Year Publication Volume Times cited Additional Links Links
de Mondt, R.; Adriaensen, L.; Vangaever, F.; Lenaerts, J.; van Vaeck, L.; Gijbels, R. Empirical evaluation of metal deposition for the analysis of organic compounds with static secondary ion mass spectrometry (S-SIMS) 2006 Applied surface science 252 9 UA library record; WoS full record; WoS citing articles doi
Lenaerts, J.; Gijbels, R.; van Vaeck, L.; Verlinden, G.; Geuens, I. Imaging TOF-SIMS for the surface analysis of silver halide microcrystals 2003 Applied surface science 203/204 7 UA library record; WoS full record; WoS citing articles doi
Lenaerts, J.; Verlinden, G.; van Vaeck, L.; Gijbels, R.; Geuens, I.; Callant, P. Exchange of fluorinated cyanine dyes between different types of silver halide microcrystals studied by imaging time-of-flight secondary ion mass spectrometry 2001 Langmuir 17 8 UA library record; WoS full record; WoS citing articles doi
Struyf, H.; van Roy, W.; van Vaeck, L.; van Grieken, R.; Gijbels, R.; Caravatti, P. Laser microprobe Fourier transform mass spectrometer with external ion source for organic and inorganic microanalysis 1993 Analytica chimica acta 283 17 UA library record; WoS full record; WoS citing articles doi
Ignatova, V.A.; Lebedev, O.I.; Wätjen, U.; van Vaeck, L.; van Landuyt, J.; Gijbels, R.; Adams, F. Observation of Sb203 nanocrystals in SiO2 after Sb ion implantation 2002 Microchimica acta 139 3 UA library record; WoS full record; WoS citing articles doi
Poels, K.; van Vaeck, L.; Gijbels, R. Microprobe speciation analysis of inorganic solids by Fourier transform laser mass spectrometry 1998 Analytical chemistry 70 32 UA library record; WoS full record; WoS citing articles doi
van Vaeck, L.; Adriaens, A.; Gijbels, R. Static secondary ion mass spectrometry (S-SIMS): part 1: methodology and structural interpretation 1999 Mass spectrometry reviews 18 112 UA library record; WoS full record; WoS citing articles
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