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Author |
Jembrih-Simbürger, D.; Neelmeijer, C.; Schalm, O.; Fredrickx, P.; Schreiner, M.; De Vis, K.; Mäder, M.; Schryvers, D.; Caen, J. |
![goto web page (via DOI) doi](http://nano.uantwerpen.be/nanorefs/img/doi.gif)
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Title |
The colour of silver stained glass : analytical investigations carried out with XRF, SEM/EDX, TEM and IBA |
Type |
A1 Journal article |
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Year |
2002 |
Publication |
Journal of analytical atomic spectrometry |
Abbreviated Journal |
J Anal Atom Spectrom |
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Volume |
17 |
Issue |
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Pages |
321-328 |
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Keywords |
A1 Journal article; Art; Electron microscopy for materials research (EMAT); AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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Abstract |
Glass treated on its surface with silver compounds and an aluminosilicate, such as ochre or clay, at higher temperatures (between 550 and 650 °C) accepts a wide variety of a yellow colour. It is the aim of this study to investigate the parameters of the manufacturing process affecting the final colour of silver stained glass and to correlate them with the final colour and colour intensity. Therefore, defined mixtures of ochre and a silver compound (AgCl, AgNO3, Ag2SO4, Ag3PO4, Ag2O) were prepared and applied on soda-lime glass. The firing process was modified within the range from 563 to 630 °C and glass samples were analysed after treatment with energy dispersive X-ray fluorescence analysis (EDXRF), scanning electron microscopy (SEM/EDX), transmission electron microscopy (TEM), as well as ion beam analysis (IBA) with an external beam. Within the scope of IBA simultaneous measurements using particle-induced X-ray emission (PIXE), particle-induced gamma-ray emission (PIGE), and Rutherford backscattering spectrometry (RBS) were carried out in order to obtain the thickness of the Ag-rich surface layer and the depth distribution of Ag. By means of TEM the microstructure of the silver particles was visualised. XRF results show that the lowest amount of Ag could be detected on glass samples treated with silver stain mixtures containing AgCl and Ag2O. A low kiln temperature (e.g. 563 °C) results in a higher silver concentration at the surface and lower penetration depths. Furthermore, the results obtained with SEM/EDX at cross-sections of the glass samples could be confirmed by PIXE, PIGE, RBS, and TEM. |
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Place of Publication |
London |
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Wos |
000175158900001 |
Publication Date |
2002-07-26 |
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Series Issue |
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Edition |
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ISSN |
0267-9477;1364-5544; |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
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Impact Factor ![sorted by Impact Factor field, descending order (down)](img/sort_desc.gif) |
3.379 |
Times cited |
42 |
Open Access |
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Notes |
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Approved |
Most recent IF: 3.379; 2002 IF: 4.250 |
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Call Number |
UA @ lucian @ c:irua:48775 |
Serial |
395 |
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Author |
Fredrickx, P.; Helary, D.; Schryvers, D.; Darque-Ceretti, E. |
![goto web page (via DOI) doi](http://nano.uantwerpen.be/nanorefs/img/doi.gif)
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Title |
A TEM study of nanoparticles in lustre glazes |
Type |
A1 Journal article |
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Year |
2004 |
Publication |
Applied physics A : materials science & processing |
Abbreviated Journal |
Appl Phys A-Mater |
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Volume |
79 |
Issue |
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Pages |
283-288 |
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Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT) |
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Place of Publication |
Heidelberg |
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Wos |
000222008800021 |
Publication Date |
2004-05-11 |
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Edition |
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ISSN |
0947-8396;1432-0630; |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
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Impact Factor ![sorted by Impact Factor field, descending order (down)](img/sort_desc.gif) |
1.455 |
Times cited |
16 |
Open Access |
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Notes |
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Approved |
Most recent IF: 1.455; 2004 IF: 1.452 |
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Call Number |
UA @ lucian @ c:irua:48780 |
Serial |
3489 |
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Author |
Fredrickx, P.; de Ryck, I.; Janssens, K.; Schryvers, D.; Petit, J.-P.; Döcking, H. |
![goto web page (via DOI) doi](http://nano.uantwerpen.be/nanorefs/img/doi.gif)
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Title |
EPMA and µ-SRXRF analysis and TEM-based microstructure characterization of a set of Roman glass fragments |
Type |
A1 Journal article |
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Year |
2004 |
Publication |
X-ray spectrometry |
Abbreviated Journal |
X-Ray Spectrom |
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Volume |
33 |
Issue |
5 |
Pages |
326-333 |
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Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT); AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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Place of Publication |
London |
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Wos |
000223880800002 |
Publication Date |
2004-04-01 |
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ISSN |
0049-8246;1097-4539; |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
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Impact Factor ![sorted by Impact Factor field, descending order (down)](img/sort_desc.gif) |
1.298 |
Times cited |
13 |
Open Access |
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Notes |
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Approved |
Most recent IF: 1.298; 2004 IF: 1.391 |
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Call Number |
UA @ lucian @ c:irua:48786 |
Serial |
1076 |
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Permanent link to this record |
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Author |
Fredrickx, P.; Wouters, J.; Schryvers, D. |
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Title |
The application of transmission electron microscopy (TEM) in the research of inorganic colorants in stained glass windows and parchment illustrations |
Type |
H3 Book chapter |
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Year |
2003 |
Publication |
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Abbreviated Journal |
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Volume |
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Issue |
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Pages |
137-143 |
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Keywords |
H3 Book chapter; Electron microscopy for materials research (EMAT) |
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Publisher |
Archetype |
Place of Publication |
London |
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Publication Date |
0000-00-00 |
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Impact Factor ![sorted by Impact Factor field, descending order (down)](img/sort_desc.gif) |
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Times cited |
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Open Access |
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Notes |
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Approved |
Most recent IF: NA |
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Call Number |
UA @ lucian @ c:irua:48779 |
Serial |
144 |
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Permanent link to this record |
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Author |
Fredrickx, P.; Schryvers, D. |
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Title |
La microscopie électronique à transmission (MET) et son utilisation dans l'étude d'inclusions nano-cristallines dans le verre |
Type |
A3 Journal article |
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Year |
2002 |
Publication |
L'archéométrie au service des monuments et des oeuvres d'art |
Abbreviated Journal |
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Volume |
10 |
Issue |
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Pages |
131-136 |
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Keywords |
A3 Journal article; Electron microscopy for materials research (EMAT) |
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0000-00-00 |
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UA library record |
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Impact Factor ![sorted by Impact Factor field, descending order (down)](img/sort_desc.gif) |
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Times cited |
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Notes |
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Approved |
Most recent IF: NA |
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Call Number |
UA @ lucian @ c:irua:48776 |
Serial |
2036 |
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Permanent link to this record |
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Author |
Fredrickx, P.; Schryvers, D.; Janssens, K. |
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Title |
Nanoscale morphology of a piece of ruby red Kunckel glass |
Type |
A1 Journal article |
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Year |
2002 |
Publication |
Physics and chemistry of glasses |
Abbreviated Journal |
Phys Chem Glasses |
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Volume |
43 |
Issue |
4 |
Pages |
176-183 |
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Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT); AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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Publisher |
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Place of Publication |
Sheffield |
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Publication Date |
0000-00-00 |
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Edition |
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ISSN |
0031-9090 |
ISBN |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
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Impact Factor ![sorted by Impact Factor field, descending order (down)](img/sort_desc.gif) |
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Times cited |
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Open Access |
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Notes |
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Approved |
Most recent IF: NA |
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Call Number |
UA @ lucian @ c:irua:40020 |
Serial |
2268 |
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Permanent link to this record |