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Author
Title
Year
Publication
Volume
Times cited
Additional Links
van Vaeck, L.
;
Adriaens, A.
;
Gijbels, R.
Static secondary ion mass spectrometry (S-SIMS): part 1: methodology and structural interpretation
1999
Mass spectrometry reviews
18
112
UA library record
;
WoS full record
;
WoS citing articles