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Author | Xu, Q.; Zandbergen, H.W.; van Dyck, D. | ||||
Title | Applying an information transmission approach to extract valence electron information from reconstructed exit waves | Type | A1 Journal article | ||
Year | 2011 | Publication | Ultramicroscopy | Abbreviated Journal | Ultramicroscopy |
Volume | 111 | Issue | 7 | Pages | 912-919 |
Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab | ||||
Abstract | The knowledge of the valence electron distribution is essential for understanding the properties of materials. However this information is difficult to obtain from HREM images because it is easily obscured by the large scattering contribution of core electrons and by the strong dynamical scattering process. In order to develop a sensitive method to extract the information of valence electrons, we have used an information transmission approach to describe the electron interaction with the object. The scattered electron wave is decomposed in a set of basic functions, which are the eigen functions of the Hamiltonian of the projected electrostatic object potential. Each basic function behaves as a communication channel that transfers the information of the object with its own transmission characteristic. By properly combining the components of the different channels, it is possible to design a scheme to extract the information of valence electron distribution from a series of exit waves. The method is described theoretically and demonstrated by means of computer simulations. | ||||
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Corporate Author | Thesis | ||||
Publisher | Place of Publication | Amsterdam | Editor | ||
Language | Wos | 000300461000024 | Publication Date | 2011-02-02 | |
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | 0304-3991; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
Impact Factor | 2.843 | Times cited | 1 | Open Access | |
Notes | Fwo | Approved | Most recent IF: 2.843; 2011 IF: 2.471 | ||
Call Number | UA @ lucian @ c:irua:93623 | Serial | 146 | ||
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Author | Xu, Q.; Zandbergen, H.W.; van Dyck, D. | ||||
Title | Imaging from atomic structure to electronic structure | Type | A1 Journal article | ||
Year | 2012 | Publication | Micron | Abbreviated Journal | Micron |
Volume | 43 | Issue | 4 | Pages | 524-531 |
Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab | ||||
Abstract | This paper discusses the possibility of retrieving the electron distribution (with highlighted valence electron distribution information) of materials from recorded HREM images. This process can be achieved by solving two inverse problems: reconstruction of the exit wave and reconstruction of the electron distribution from exit waves. The first inverse problem can be solved using a focal series reconstruction method. We show that the second inverse problem can be solved by combining a series of exit waves recorded at different thickness conditions. This process is designed based on an improved understanding of the dynamical scattering process. It also explains the fundamental difficulty of obtaining the valence electron distribution information and the basis of our solution. | ||||
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Corporate Author | Thesis | ||||
Publisher | Place of Publication | Oxford | Editor | ||
Language | Wos | 000301702400005 | Publication Date | 2011-11-05 | |
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | 0968-4328; | ISBN | Additional Links | UA library record; WoS full record | |
Impact Factor | 1.98 | Times cited | Open Access | ||
Notes | Fwo | Approved | Most recent IF: 1.98; 2012 IF: 1.876 | ||
Call Number | UA @ lucian @ c:irua:93634 | Serial | 1553 | ||
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