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Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Links |
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Bogaerts, A.; Gijbels, R. |
Argon and copper optical emission spectra in a Grimm glow discharge source: mathematical simulations and comparison with experiment |
1998 |
Journal of analytical atomic spectrometry |
13 |
25 |
UA library record; WoS full record; WoS citing articles |
|
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Bogaerts, A.; Gijbels, R. |
Modeling of glow discharges: what can we learn from it? |
1997 |
Analytical chemistry A-pages |
69 |
|
UA library record |
|
|
|
Oleshko, V.; Gijbels, R.; Jacob, W.; Alfimov, M. |
Complex structural and analytical characterization of silver halide photographic systems by means of analytical electron microscopy |
1994 |
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UA library record; WoS full record; |
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Struyf, H.; van Vaeck, L.; Kennis, P.; Gijbels, R.; van Grieken, R. |
Chemical characterization of neo-ceramic powders by time-of-flight and Fourier transform laser microprobe mass spectrometry |
1996 |
Rapid communications in mass spectrometry |
10 |
11 |
UA library record; WoS full record; WoS citing articles |
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de Bleecker, K.; Bogaerts, A.; Goedheer, W.; Gijbels, R. |
Investigation of growth mechanisms of clusters in a silane discharge with the use of a fluid model |
2004 |
IEEE transactions on plasma science |
32 |
29 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Oleshko, V.P.; Gijbels, R.H.; van Daele, A.J.; Jacob, W.A. |
On estimation of the dielectric function of Ag(Br,I) nanocrystals by cryo-EELS (addendum) |
1999 |
Nanostructered materials |
11 |
|
UA library record |
|
|
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Robben, J.; Dufour, D.; Gijbels, R. |
Design and development of a new program for data processing of mass spectra acquired by means of a high-resolution double-focusing glow-discharge mass spectrometer |
2001 |
Fresenius' journal of analytical chemistry |
370 |
2 |
UA library record; WoS full record; WoS citing articles |
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Oleshko, V.; Gijbels, R. |
Scanning microanalysis |
1997 |
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UA library record |
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Oleshko, V.; Gijbels, R. |
Scanning microanalysis |
1996 |
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UA library record |
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Herrebout, D.; Bogaerts, A.; Gijbels, R.; Goedheer, W.J.; Vanhulsel, A. |
A one-dimensional fluid model for an acetylene rf discharge: a study of the plasma chemistry |
2003 |
IEEE transactions on plasma science |
31 |
26 |
UA library record; WoS full record; WoS citing articles |
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Oleshko, V.P.; van Daele, A.J.; Gijbels, R.H.; Jacob, W.A. |
Study of electron excitations in Ag(Br,I) nanocrystals by cryo-AEM techniques |
1998 |
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UA library record; WoS full record; |
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Oleshko, V.P.; Gijbels, R.H.; Jacob, W.A. |
Reduction of composite Ag(Br,I) grains as studied by AEM and digital image analysis techniques |
1998 |
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UA library record; WoS full record; |
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Lenaerts, J.; Verlinden, G.; Ignatova, V.A.; van Vaeck, L.; Gijbels, R.; Geuens, I. |
Modeling of the sputtering process of cubic silver halide microcrystals and its relevance in depth profiling by secondary ion-mass spectrometry (SIMS) |
2001 |
Fresenius' journal of analytical chemistry |
370 |
3 |
UA library record; WoS full record; WoS citing articles |
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van Vaeck, L.; Poels, K.; de Nollin, S.; Hachimi, A.; Gijbels, R. |
Laser microprobe mass spectrometry: principle and applications in biology and medicine |
1997 |
Cell biology international |
21 |
6 |
UA library record; WoS full record; WoS citing articles |
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van Straaten, M.; Butaye, L.; Gijbels, R. |
Depth profiling of coated steel wires by GDMS |
1992 |
|
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UA library record |
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Volkov, V.V.; van Landuyt, J.; Marushkin, K.; Gijbels, R.; Férauge, C.; Vasilyev, M.G.; Shelyakin, A.A.; Sokolovsky, A.A. |
LPE growth and characterization of InGaAsP/InP heterostructures: IR-emitting diodes at 1.66 μm: application to the remote monitoring of methane gas |
1997 |
Sensors and actuators : A : physical |
62 |
3 |
UA library record; WoS full record; WoS citing articles |
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Adriaensen, L.; Vangaever, F.; Lenaerts, J.; Gijbels, R. |
Comparative study of organic dyes with time-of-flight static secondary ion mass spectrometry and related techniques |
2005 |
Journal of mass spectrometry |
40 |
4 |
UA library record; WoS full record; WoS citing articles |
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Lenaerts, J.; Gijbels, R.; van Vaeck, L.; Verlinden, G.; Geuens, I. |
Imaging TOF-SIMS for the surface analysis of silver halide microcrystals |
2003 |
Applied surface science |
203/204 |
7 |
UA library record; WoS full record; WoS citing articles |
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de Witte, H.; Conard, T.; Vandervorst, W.; Gijbels, R. |
Study of oxynitrides with dual beam TOF-SIMS |
2000 |
|
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UA library record |
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Bogaerts, A.; Neyts, E.; Gijbels, R.; van der Mullen, J. |
Gas discharge plasmas and their applications |
2002 |
Spectrochimica acta: part B : atomic spectroscopy |
57 |
462 |
UA library record; WoS full record; WoS citing articles |
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Ignatova, V.A.; Conard, T.; Möller, W.; Vandervorst, W.; Gijbels, R. |
Depth profiling of ZrO2/SiO2/Si stacks : a TOF-SIMS and computer simulation study |
2004 |
Applied surface science |
231/232 |
4 |
UA library record; WoS full record; WoS citing articles |
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van Cleempoel, A.; Joutsensaari, J.; Kauppinen, E.; Gijbels, R.; Claeys, M. |
Aerosol synthesis and characterization of ultrafine fullerene particles |
1998 |
Fullerene science and technology |
6 |
3 |
UA library record; WoS full record; WoS citing articles |
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Struyf, H.; van Roy, W.; van Vaeck, L.; Gijbels, R.; Caravatti, P. |
Laser microprobe Fourier transform mass spectrometer with external ion source for organic and inorganic microanalysis |
1993 |
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UA library record |
|
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Bogaerts, A.; Chen, Z.; Gijbels, R. |
Glow discharge modelling: from basic understanding towards applications |
2003 |
Surface and interface analysis |
35 |
14 |
UA library record; WoS full record; WoS citing articles |
|
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Yan, M.; Bogaerts, A.; Goedheer, W.J.; Gijbels, R. |
Electron energy distribution function in capacitively coupled RF discharges: differences between electropositive Ar and electronegative SiH4 discharges |
2000 |
Plasma sources science and technology |
9 |
21 |
UA library record; WoS full record; WoS citing articles |
|
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van Straaten, M.; Bogaerts, A.; Gijbels, R. |
Experimental determination of the energy distribution of ions bombarding the cathode surface in a glow discharge |
1995 |
Spectrochimica acta: part B : atomic spectroscopy |
50 |
22 |
UA library record; WoS full record; WoS citing articles |
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Conard, T.; de Witte, H.; Loo, R.; Verheyen, P.; Vandervorst, W.; Caymax, M.; Gijbels, R. |
XPS and TOFSIMS studies of shallow Si/Si1-xGex/Si layers |
1999 |
Thin solid films : an international journal on the science and technology of thin and thick films |
343/344 |
1 |
UA library record; WoS full record; WoS citing articles |
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Bogaerts, A.; Gijbels, R. |
Comprehensive three-dimensional modeling network for a dc glow discharge plasma |
1998 |
Plasma physics reports |
24 |
8 |
UA library record; WoS full record; WoS citing articles |
|
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Herrebout, D.; Bogaerts, A.; Yan, M.; Goedheer, W.; Dekempeneer, E.; Gijbels, R. |
1D fluid model for an rf methane plasma of interest in deposition of diamond-like carbon layers |
2001 |
Journal of applied physics |
90 |
83 |
UA library record; WoS full record; WoS citing articles |
|
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Bogaerts, A.; Gijbels, R. |
Comparison of argon and neon as discharge gases in a direct current glow discharge: a mathematical simulation |
1997 |
Spectrochimica acta: part B : atomic spectroscopy |
52 |
13 |
UA library record; WoS full record; WoS citing articles |
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