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De wael, A.; De Backer, A.; Yu, C.-P.; Sentürk, D.G.; Lobato, I.; Faes, C.; Van Aert, S. Three Approaches for Representing the Statistical Uncertainty on Atom-Counting Results in Quantitative ADF STEM 2022 Microscopy and microanalysis UA library record; WoS full record pdf url doi
de Backer, A. Quantitative atomic resolution electron microscopy using advanced statistical techniques 2015 UA library record url
Stoops, T.; De Backer, A.; Lobato, I.; Van Aert, S. Obtaining 3D Atomic Reconstructions from Electron Microscopy Images Using a Bayesian Genetic Algorithm: Possibilities, Insights, and Limitations 2024 Microscopy and Microanalysis pdf url doi
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