| Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
| Bogaerts, A.; Gijbels, R. |
The ion- and atom-induced secondary electron emission yield: numerical study for the effect of clean and dirty cathode surfaces |
2002 |
Plasma sources science and technology |
11 |
51 |
UA library record; WoS full record; WoS citing articles |
| Geuens, I.; Gijbels, R.; Dekeyzer, R.; Verbeeck, A. |
Micro and surface analysis of individual silver halide microcrystals using a scanning ion microprobe |
1994 |
Papers |
|
|
UA library record; WoS full record; |
| Veldeman, E.; Van 't dack, L.; Gijbels, R.; Campbell, M.; Vanhaecke, F.; Vanhoe, H.; Vandecasteele, C. |
Analysis of thermal waters by ICP-MS |
1991 |
|
|
|
UA library record |
| Martin, J.M.L.; François, J.P.; Gijbels, R. |
The impact of quantum chemical methods on the interpretation of molecular spectra of carbon clusters (review article) |
1993 |
Journal of molecular structure |
294 |
21 |
UA library record; WoS full record; WoS citing articles |
| Wu, S.; van Daele, A.; Jacob, W.; Gijbels, R.; Verbeeck, A.; de Keyzer, R. |
Microanalysis of individual silver halide microcrystals |
1993 |
Scanning microscopy |
7 |
7 |
UA library record; WoS full record; WoS citing articles |
| de Witte, H.; de Gendt, S.; Douglas, M.; Conard, T.; Kenis, K.; Mertens, P.W.; Vandervorst, W.; Gijbels, R. |
Evaluation of time-of-flight secondary ion mass spectrometry for metal contamination monitoring on wafer surfaces |
2000 |
Journal of the electrochemical society |
147 |
14 |
UA library record; WoS full record; WoS citing articles |
| Adriaensen, L.; Vangaever, F.; Gijbels, R. |
Organische TOF-S-SIMS: gebruik van opgedampt Ag en Au voor de verhoging van secundaire ionenintensiteiten |
2004 |
Chemie magazine |
|
|
UA library record |
| Adriaens, A.; Goossens, D.; Pijpers, A.; Van Tendeloo, G.; Gijbels, R. |
Dissolution study of potassium feldspars using hydrothermally treated sanidine as an example |
1999 |
Surface and interface analysis |
27 |
4 |
UA library record; WoS full record; WoS citing articles |
| Gijbels, R.; Bogaerts, A. |
Modeling of glow discharge ion sources for mass spectrometry: potentials and limitations |
1997 |
Spectroscopy |
9 |
|
UA library record |
| van Vaeck, L.; van Roy, W.; Gijbels, R.; Adams, F. |
Lasers in mass spectrometry: organic and inorganic instrumentation |
1993 |
|
|
|
UA library record |
| Oleshko, V.; Gijbels, R.; Jacob, W.; Alfimov, M. |
Characterization of complex silver halide photographic systems by means of analytical electron microscopy |
1995 |
Microbeam analysis |
4 |
9 |
UA library record; WoS full record; WoS citing articles |
| Oleshko, V.; Gijbels, R.; Jacob, W.; Alfimov, M. |
Characterization of complex silver halide photographic systems by means of analytical electron microscopy |
1994 |
Microbeam analysis |
3 |
|
UA library record |
| Oleshko, V.P.; Gijbels, R.; Amelinckx, S. |
Electron microscopy, nanoscopy, and scanning micro- and nanoanalysis |
2013 |
|
|
|
UA library record |
| Oleshko, V.P.; Gijbels, R.H.; Bilous, V.M.; Jacob, W.A.; Alfimov, M.V. |
Evolution of impurity clusters and photographic sensitivity |
2000 |
Zhurnal nauchnoj prikladnoj fotografii i kinematografii |
45 |
|
UA library record |
| Bogaerts, A.; Gijbels, R. |
Fundamental aspects and applications of glow discharge spectrometric techniques |
1998 |
Spectrochimica acta: part B : atomic spectroscopy |
53 |
49 |
UA library record; WoS full record; WoS citing articles |
| Vertes, A.; Gijbels, R.; Adams, F. |
Introduction |
1993 |
|
|
|
UA library record |
| Bogaerts, A.; Gijbels, R. |
Modeling network for argon glow discharge plasmas with copper cathode |
2002 |
|
|
|
UA library record |
| van Vaeck, L.; Adriaens, A.; Gijbels, R. |
Static secondary ion mass spectrometry (S-SIMS): part 1: methodology and structural interpretation |
1999 |
Mass spectrometry reviews |
18 |
112 |
UA library record; WoS full record; WoS citing articles |
| Vandecasteele, C.; van Grieken, R.; Gijbels, R.; Speecke, A. |
Systematic errors in 14-MeV neutron activation analysis for oxygen : part 2 : a general standardization method for the determination of oxygen |
1973 |
Analytica chimica acta |
65 |
12 |
UA library record; WoS full record; WoS citing articles |
| Gijbels, R.; van Grieken, R. |
Application of analytical methods for trace elements in geothermal waters : part 1 : Amélie-les-Bains (Eastern Pyrenees) |
1977 |
|
|
|
UA library record |
| Gijbels, R.; van Grieken, R.; Blommaert, W.; Van 't dack, L.; van Espen, P.; Nullens, H.; Saelens, R. |
Application of analytical methods for trace elements in geothermal waters : part 2 : Plombières, Bains-les-Bains, Bourbonne (Vosges) |
1983 |
|
|
|
UA library record |
| Goessens, C.; Schryvers, D.; van Landuyt, J.; Amelinckx, S.; Geuens, I.; Gijbels, R.; Jacob, W.; Verbeeck, A.; de Keyzer, R. |
Characterization of crystal defects and analysis of iodide distribution in mixed tabular silver halide grains by conventional transmission electron microscopy, X-ray diffractometry and back-scattered electron imaging |
1991 |
|
|
|
UA library record |
| van Grieken, R.; Gijbels, R.; Speecke, A.; Hoste, J. |
Determination of oxygen, silicon, phosphorus and copper in iron and steel by 14 MeV neutron activation analysis |
1971 |
|
|
|
UA library record |
| Gijbels, R. |
Development of a Fourier transform laser microprobe mass spectrometer with external ion source |
1993 |
ICR/Ion trap newsletter |
30 |
|
UA library record |
| Cidu, R.; Fanfani, L.; Shand, P.; Edmunds, W.M.; Van 't dack, L.; Gijbels, R. |
Gold mobility in waters from temperate regions |
1995 |
|
|
|
UA library record |
| Pentcheva, E.N.; Van 't dack, L.; Veldeman, E.; Hristov, V.; Gijbels, R. |
Hydrochemical characteristics of geothermal systems in South Bulgaria |
1997 |
|
|
|
UA library record |
| Adams, F.; Gijbels, R.; van Grieken, R.; Kim, Y.-sang |
Inorganic mass spectrometry |
1999 |
|
|
|
UA library record |
| Goossens, D.; Van 't dack, L.; Gijbels, R. |
Ion microprobe analysis of rock-forming minerals from the Carnmenellis granite |
1989 |
|
|
|
UA library record |
| Yan, M.; Bogaerts, A.; Gijbels, R. |
Kinetic modeling of relaxation phenomena after photodetachment in a rf electronegative SiH4 discharge |
2001 |
Physical review : E : statistical physics, plasmas, fluids, and related interdisciplinary topics |
63 |
4 |
UA library record; WoS full record; WoS citing articles |
| Vertes, A.; Gijbels, R.; Adams, F. |
Laser ionization mass analysis |
1993 |
|
|
|
UA library record |
