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Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Links |
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Teodorescu, V.; Nistor, L.; Bender, H.; Steegen, A.; Lauwers, A.; Maex, K.; van Landuyt, J. |
In situ transmission electron microscopy study of Ni silicide phases formed on (001) Si active lines |
2001 |
Journal of applied physics |
90 |
97 |
UA library record; WoS full record; WoS citing articles |
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Van Renterghem, W.; Karthauser, S.; Schryvers, D.; van Landuyt, J.; De Keyzer, R.; Van Roost, C. |
The influence of the precipitation method on defect formation in multishell AgBrI (111) tabular crystals |
2000 |
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UA library record; WoS full record; |
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Frangis, N.; Van Tendeloo, G.; van Landuyt, J.; Muret, P.; Nguyen, T.T.A. |
Electron microscopy characterisation of erbium silicide-thin films grown on a Si(111) substrate |
1996 |
Applied surface science |
102 |
9 |
UA library record; WoS full record; WoS citing articles |
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Nistor, L.C.; van Landuyt, J.; Ralchenko, V.G.; Obratzova, E.D.; Smolin, A.A. |
Nanocrystalline diamond films: transmission electron microscopy and Raman spectroscopy characterization |
1997 |
Diamond and related materials |
6 |
116 |
UA library record; WoS full record; WoS citing articles |
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Udoh, K.-I.; El- Araby, A.M.; Tanaka, Y.; Hisatsune, K.; Yasuda, K.; Van Tendeloo, G.; van Landuyt, J. |
Structural aspects of AuCu I or AuCu II and a cuboidal black configuration of f.c.c. disordered phase in AuCu-Pt and AuCu-Ag pseudobinary alloys |
1995 |
Materials science and engineering: part A: structural materials: properties, microstructure and processing |
203 |
15 |
UA library record; WoS full record; WoS citing articles |
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Goessens, C.; Schryvers, D.; van Landuyt, J.; Amelinckx, S.; de Keyzer, R. |
Long period surface ordering of iodine ions in mixed tabular AgBr-AgBrI microcrystals |
1995 |
Surface science : a journal devoted to the physics and chemistry of interfaces |
337 |
10 |
UA library record; WoS full record; WoS citing articles |
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Kaltsas, G.; Travlos, A.; Nassiopoulos, A.G.; Frangis, N.; van Landuyt, J. |
High crystalline quality erbium silicide films on (100) silicon grown in high vacuum |
1996 |
Applied surface science |
102 |
14 |
UA library record; WoS full record; WoS citing articles |
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Goessens, C.; Schryvers, D.; van Landuyt, J.; de Keyzer, R. |
In situ HREM study of electron irradiation effects in AgCl microcrystals |
1992 |
Ultramicroscopy |
40 |
10 |
UA library record; WoS full record; WoS citing articles |
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Fedina, L.; Gutakovskii, A.; Aseev, A.; van Landuyt, J.; Vanhellemont, J. |
Extended defects formation in Si crystals by clustering of intrinsic point defects studied by in-situ electron irradiation in an HREM |
1999 |
Physica status solidi: A: applied research
T2 – International Conference on Extended Defects in Semiconductors (EDS 98), Sept. 06-11, 1998, Jaszowiec, Poland |
171 |
40 |
UA library record; WoS full record; WoS citing articles |
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Fedina, L.; Gutakovskii, A.; Aseev, A.; van Landuyt, J.; Vanhellemont, J. |
Extended defects formation in Si crystals by clustering of intrinsic point defects studied by in-situ irradiation in an HREM |
1999 |
Physica status solidi: A: applied research |
171 |
40 |
UA library record; WoS full record; WoS citing articles |
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Zhang, X.B.; Zhang, X.F.; Bernaerts, D.; Van Tendeloo, G.; Amelinckx, S.; van Landuyt, J.; Ivanov, V.; Nagy, J.B.; Lambin, P.; Lucas, A.A. |
The texture of catalytically grown coil-shaped carbon nanotubes |
1994 |
Europhysics letters |
27 |
168 |
UA library record; WoS full record; WoS citing articles |
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Ferroni, M.; Carotta, M.C.; Guidi, V.; Martinelli, G.; Ronconi, F.; Richard, O.; van Dyck, D.; van Landuyt, J. |
Structural characterization of Nb-TiO2 nanosized thick-films for gas sensing application |
2000 |
Sensors and actuators : B : chemical |
68 |
51 |
UA library record; WoS full record; WoS citing articles |
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Nistor, L.C.; van Landuyt, J.; Ralchenko, V.G.; Kononenko, T.V.; Obraztsova, E.D.; Strelnitsky, V.E. |
Direct observation of laser-induced crystallization of a-C : H films |
1994 |
Applied physics A : materials science & processing |
58 |
73 |
UA library record; WoS full record; WoS citing articles |
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Fanidis, C.; van Dyck, D.; van Landuyt, J. |
Inelastic scattering of high-energy electrons in a crystal in thermal equilibrium with the environment: part 2: solution of the equations and applications to concrete cases |
1993 |
Ultramicroscopy |
48 |
6 |
UA library record; WoS full record; WoS citing articles |
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van Renterghem, W.; Schryvers, D.; van Landuyt, J.; van Roost, C.; de Keyzer, R. |
The influence of crystal thickness on the image tone |
2003 |
Journal of imaging science |
47 |
|
UA library record; WoS full record; WoS citing articles |
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Fedina, L.; van Landuyt, J.; Vanhellemont, J.; Aseev, A.L. |
Observation of vacancy clustering in FZ-Si crystals during in situ electron irradiation in a high voltage electron microscope |
1996 |
Nuclear instruments and methods in physics research |
B112 |
4 |
UA library record; WoS full record; WoS citing articles |
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Teodorescu, V.S.; Mihailescu, I.N.; Dinescu, M.; Chitica, N.; Nistor, L.C.; van Landuyt, J.; Barborica, A. |
Laser induced phase transition in iron thin films |
1994 |
Journal de physique: 3: applied physics, materials science, fluids, plasma and instrumentation |
4 |
2 |
UA library record; WoS full record; WoS citing articles |
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Luyten, W.; Krekels, T.; Amelinckx, S.; Van Tendeloo, G.; van Dyck, D.; van Landuyt, J. |
Electron diffraction effects of conical, helically wound, graphite whiskers |
1993 |
Ultramicroscopy |
49 |
14 |
UA library record; WoS full record; WoS citing articles |
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Tokei, Z.; Lanckmans, F.; van den Bosch, G.; Van Hove, M.; Maex, K.; Bender, H.; Hens, S.; van Landuyt, J. |
Reliability of copper dual damascene influenced by pre-clean |
2002 |
Analysis Of Integrated Circuits |
|
5 |
UA library record; WoS full record; WoS citing articles |
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Stuer, C.; van Landuyt, J.; Bender, H.; Rooyackers, R.; Badenes, G. |
The use of convergent beam electron diffraction for stress measurements in shallow trench isolation structures |
2001 |
Materials science in semiconductor processing |
4 |
6 |
UA library record; WoS full record; WoS citing articles |
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Nistor, L.C.; van Landuyt, J.; Ralchenko, V.G.; Obratzova, E.D.; Korothushenko, K.G.; Smolin, A.A. |
Structural studies of nanocrystalline diamond thin films |
1997 |
Materials science forum |
239-241 |
|
UA library record; WoS full record; |
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Hens, S.; van Landuyt, J.; Bender, H.; Boullart, W.; Vanhaelemeersch, S. |
Chemical and structural analysis of etching residue layers in semiconductor devices with energy filtering transmission electron microscopy |
2001 |
Materials science in semiconductor processing |
4 |
|
UA library record; WoS full record |
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Frangis, N.; Van Tendeloo, G.; van Landuyt, J.; Kaltsas, G.; Travlos, A.; Nassiopoulos, A.G. |
New erbium silicide superstructures: a study by high resolution electron microscopy |
1996 |
Physica status solidi: A: applied research |
158 |
6 |
UA library record; WoS full record; WoS citing articles |
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Yasuda, K.; Hisatsune, K.; Udoh, K.; Tanaka, Y.; Van Tendeloo, G.; van Landuyt, J. |
Characteristic mosaic texture related to orderingin AuCu-9at.%Ag pseudobinary alloy |
1992 |
Dentistry in Japan |
29 |
|
UA library record |
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Goessens, C.; Schryvers, D.; van Landuyt, J. |
Transmission electron microscopy studies of (111) twinned silver halide microcrystals |
1998 |
Microscopy research and technique |
42 |
8 |
UA library record; WoS full record; WoS citing articles |
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van Renterghem, W.; Schryvers, D.; van Landuyt, J.; Bollen, D.; van Roost, C.; de Keyzer, R. |
A TEM study of non-parallel twins inducing thickness growth in silver chloride {111} tabular crystals |
2001 |
The journal of imaging science and technology |
45 |
|
UA library record; WoS full record; WoS citing articles |
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Ignatova, V.A.; Lebedev, O.I.; Wätjen, U.; van Vaeck, L.; van Landuyt, J.; Gijbels, R.; Adams, F. |
Observation of Sb203 nanocrystals in SiO2 after Sb ion implantation |
2002 |
Microchimica acta |
139 |
3 |
UA library record; WoS full record; WoS citing articles |
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Volkov, V.V.; Luyten, W.; van Landuyt, J.; Férauge, C.; Oksenoid, K.G.; Gijbels, R.; Vasilev, M.G.; Shelyakin, A.A.; Lazarev, V.B. |
Electron microscopy and mass-spectrometry study of In GaAsP/InP heterostructures (p-i-n diodes) grown by liquid phase epitaxy |
1993 |
Physica status solidi: A: applied research |
140 |
7 |
UA library record; WoS full record; WoS citing articles |
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Goessens, C.; Schryvers, D.; van Landuyt, J.; Geuens, I.; Gijbels, R.; Jacob, W.; de Keyzer, R. |
A temperature study of mixed AgBr-AgBrI tabular crystals |
1995 |
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3 |
UA library record; WoS full record; WoS citing articles |
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Fedina, L.; Gutakovskii, A.; Aseev, A.; van Landuyt, J.; Vanhellemont, J. |
Intrinsic point defect clustering in Si: a study by HVEM and HREM in situ electron irradiation |
1997 |
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UA library record |
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