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Author | Verlinden, G.; Gijbels, R.; Geuens, I. | ||||
Title | Quantitative secondary ion mass spectrometry depth profiling of surface layers of cubic silver halide microcrystals | Type | A1 Journal article | ||
Year | 1999 | Publication | Journal of the American Society for Mass Spectrometry | Abbreviated Journal | J Am Soc Mass Spectr |
Volume | 10 | Issue | Pages | 1016-1027 | |
Keywords | A1 Journal article; Plasma Lab for Applications in Sustainability and Medicine – Antwerp (PLASMANT) | ||||
Abstract | |||||
Address | |||||
Corporate Author | Thesis | ||||
Publisher | Place of Publication | New York, N.Y. | Editor | ||
Language | Wos | 000082614500013 | Publication Date | 2002-07-25 | |
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | 1044-0305;1879-1123; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
Impact Factor | 2.786 | Times cited | 4 | Open Access | |
Notes | Approved | Most recent IF: 2.786; 1999 IF: 3.460 | |||
Call Number | UA @ lucian @ c:irua:24930 | Serial | 2760 | ||
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