|
Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
|
Ke, X. |
From top-down to bottom-up : from carbon nanotubes to nanodevices |
2010 |
|
|
|
UA library record |
|
Lisiecki, I.; Turner, S.; Bals, S.; Pileni, M.P.; Van Tendeloo, G. |
Enhanced stability against oxidation due to 2D self-organisation of hcp cobalt nanocrystals |
2008 |
|
|
|
UA library record |
|
d' Hondt, H. |
Characterization of anion deficient perovskites |
2011 |
|
|
|
UA library record |
|
Verhulst, A.; Sorée, B.; Leonelli, D.; Vandenberghe, W.G.; Groeseneken, G. |
Modeling the single-gate, double-gate, and gate-all-around tunnel field-effect transistor |
2010 |
Journal Of Applied Physics |
107 |
150 |
UA library record; WoS full record; WoS citing articles |
|
Nourbakhsh, A.; Cantoro, M.; Klekachev, A.; Clemente, F.; Sorée, B.; van der Veen, M.H.; Vosch, T.; Stesmans, A.; Sels, B.; de Gendt, S. |
Tuning the Fermi level of SiO2-supported single-layer graphene by thermal annealing |
2010 |
Journal Of Physical Chemistry C |
114 |
54 |
UA library record; WoS full record; WoS citing articles |
|
O'Regan, T.P.; Hurley, P.K.; Sorée, B.; Fischetti, M.V. |
Modeling the capacitance-voltage response of In0.53Ga0.47As metal-oxide-semiconductor structures : charge quantization and nonparabolic corrections |
2010 |
Applied Physics Letters |
96 |
26 |
UA library record; WoS full record; WoS citing articles |
|
Cao, S. |
Quantitative 3D analysis of Ni4Ti3 precipitate morphology and distribution in Ni-Ti by FIB/SEM slice-and-view |
2010 |
|
|
|
UA library record |
|
Bals, S.; Casavola, M.; van Huis, M.A.; Van Aert, S.; Batenburg, K.J.; Van Tendeloo, G.; Vanmaekelbergh, D. |
Three-dimensional atomic imaging of colloidal core-shell nanocrystals |
2011 |
Nano letters |
11 |
121 |
UA library record; WoS full record; WoS citing articles |
|
Sels, D.; Sorée, B.; Groeseneken, G. |
2-D rotational invariant multi sub band Schrödinger-Poisson solver to model nanowire transistors |
2010 |
|
|
|
UA library record |
|
Wang, W.-C. |
Quantitative analysis of electron exit waves with single atom sensitivity |
2011 |
|
|
|
UA library record |
|
Wang, B. |
TEM study of plasticity mechanisms in metals : nanocrystalline Al Pd thin films and bulk bcc Nb |
2011 |
|
|
|
UA library record |
|
van Huis, M.A.; Figuerola, A.; Fang, C.; Béché, A.; Zandbergen, H.W.; Manna, L. |
Letter Chemical transformation of Au-tipped CdS nanorods into AuS/Cd core/shell particles by electron beam irradiation |
2011 |
Nano letters |
11 |
25 |
UA library record; WoS full record; WoS citing articles |
|
Van Aert, S.; Batenburg, J.; Van Tendeloo, S. |
Atomen tellen |
2011 |
Nederlands tijdschrift voor natuurkunde (1991) |
77 |
|
UA library record |
|
Batenburg, J.; Van Aert, S. |
Three-dimensional reconstruction of a nanoparticle at atomic resolution |
2011 |
ERCIM news |
86 |
|
UA library record |
|
Van Aert, S. |
Atomen in 3D : Antwerpenaren brengen atomaire structuur nanodeeltjes in beeld |
2011 |
Chemie magazine |
7 |
|
UA library record |
|
Schryvers, D.; Van Aert, S. |
High-resolution visualization techniques : structural aspects |
2012 |
|
|
|
UA library record |
|
Gao, J.; Lebedev, O.I.; Turner, S.; Li, Y.F.; Lu, Y.H.; Feng, Y.P.; Boullay, P.; Prellier, W.; Van Tendeloo, G.; Wu, T. |
Phase selection enabled formation of abrupt axial heterojunctions in branched oxide nanowires |
2012 |
Nano letters |
12 |
25 |
UA library record; WoS full record; WoS citing articles |
|
Biermans, E. |
Electron tomography : from qualitative to quantitative |
2012 |
|
|
|
UA library record |
|
Krsmanovic, R.; Bertoni, G.; Van Tendeloo, G. |
Structural characterization of erbium doped LAS glass ceramics obtained by glass melting technique |
2007 |
Materials science forum |
555 |
|
UA library record; WoS full record; WoS citing articles |
|
Schryvers, D.; Tirry, W.; Yang, Z. |
Ni4Ti3 precipitates and their influence on the surrounding NiTi matrix |
2005 |
|
|
|
UA library record; WoS full record; |
|
van Daele, B.; Van Tendeloo, G.; Ruythooren, W.; Derluyn, J.; Leys, M.R.; Germain, M. |
Transmission electron microscopy characterisation of Ti and Al/Ti contacts on GaN and AlGaN/GaN |
2005 |
Springer proceedings in physics |
107 |
|
UA library record; WoS full record; |
|
Horvath, Z.E.; Biro, L.P.; Van Tendeloo, G.; Tondeur, C.; Bister, G.; Pierard, N.; Fonseca, A.; Nagy, J.B. |
Optimization of the amount of catalyst and reaction time in single wall nanotube production |
2003 |
Diffusion and defect data : solid state data : part B : solid state phenomena |
94 |
|
UA library record; WoS full record; WoS citing articles |
|
Yandouzi, M.; Pauwels, B.; Schryvers, D.; Van Swygenhoven, H.; Van Tendeloo, G. |
Structural characterization of nanostructured Ni3Al processed by inert gas condensation |
2003 |
Diffusion and defect data : solid state data : part A : defect and diffusion forum |
213 |
|
UA library record; WoS full record; |
|
De Gryse, O.; Clauws, P.; Vanhellemont, J.; Lebedev, O.; van Landuyt, J.; Simoen, E.; Claeys, C. |
Chemical and structural characterization of oxide precipitates in heavily boron doped silicon by infrared spectroscopy and transmission electron microscopy |
2002 |
|
|
|
UA library record; WoS full record; |
|
Rosenauer, A.; Gerthsen, D.; Van Aert, S.; van Dyck, D.; den Dekker, A.J. |
Present state of the composition evaluation of ternary semiconductor nanostructures by lattice fringe analysis |
2003 |
Institute of physics conference series |
|
|
UA library record; WoS full record; |
|
Stuer, C.; Steegen, A.; van Landuyt, J.; Bender, H.; Maex, K. |
Characterisation of the local stress induced by shallow trench isolation and CoSi2 silicidation |
2001 |
Institute of physics conference series |
|
|
UA library record; WoS full record; |
|
Weill; Chevalier; Chambon; Tressaud; Darriet; Etourneau; Van Tendeloo, G. |
Electron-microscopy investigation of superconducting la2cu(o, f)4+y oxyfluoride |
1993 |
European journal of solid state and inorganic chemistry |
30 |
2 |
UA library record; WoS full record; WoS citing articles |
|
Leon, M.; Merino, J.M.; Van Tendeloo, G. |
Structural analysis of CuInSe2, CuInTe2 and CuInSeTe by electron microscopy and X-ray techniques |
2009 |
Acta Microscopica |
18 |
|
UA library record; WoS full record; WoS citing articles |
|
Nistor, L.; Bender, H.; van Landuyt, J.; Nemeth, S.; Boeve, H.; De Boeck, J.; Borghs, G. |
HREM investigation of a Fe/GaN/Fe tunnel junction |
2001 |
Institute of physics conference series
T2 – Royal-Microscopical-Society Conference on Microscopy of Semiconducting, Materials, MAR 25-29, 2001, Univ of Oxford, Oxford, England |
|
|
UA library record; WoS full record; |
|
Hens, S.; Stuer, C.; Bender, H.; Loo, R.; van Landuyt, J. |
Quantitative EFTEM study of germanium quantum dots |
2001 |
|
|
|
UA library record; WoS full record; |