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Author Title Year Publication Volume Times cited Additional Links (up)
Ignatova, V.A.; Conard, T.; Möller, W.; Vandervorst, W.; Gijbels, R. Depth profiling of ZrO2/SiO2/Si stacks : a TOF-SIMS and computer simulation study 2004 Applied surface science 231/232 4 UA library record; WoS full record; WoS citing articles