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  Author Title Year Publication Volume Times cited Additional Links Links
d' Hondt, H. Characterization of anion deficient perovskites 2011 UA library record
Goessens, C.; Schryvers, D.; van Landuyt, J.; Amelinckx, S.; Geuens, I.; Gijbels, R.; Jacob, W.; Verbeeck, A.; de Keyzer, R. Characterization of crystal defects and analysis of iodide distribution in mixed tabular silver halide grains by conventional transmission electron microscopy, X-ray diffractometry and back-scattered electron imaging 1991 UA library record
Goessens, C.; Schryvers, D.; van Landuyt, J.; Amelinckx, S.; Verbeeck, A.; de Keyzer, R. Characterization of crystal defects in mixed tabular silver halide grains by conventional transmission electron microscopy and X-ray diffractometry 1991 Journal of crystal growth 110 40 UA library record; WoS full record; WoS citing articles
Kirilenko, D. Characterization of graphene by electron diffraction 2012 UA library record
Volkov, V.V.; van Landuyt, J.; Marushkin, K.M.; Gijbels, R.; Férauge, C.; Vasilyev, M.G.; Shelyakin, A.A.; Sokolovsky, A.A. Characterization of LPE grown InGaAsP/InP heterostructures: IR-LED at 1.66 μm used for the remote monitoring of methane gas 1997 Journal of crystal growth 173 4 UA library record; WoS full record; WoS citing articles
Wiktor, C. Characterization of metal-organic frameworks and other porous materials via advanced transmission electron microscopy 2014 UA library record
Ahonen, P.P.; Kauppinen, E.I.; Tapper, U.; Nenonen, P.; Joubert, J.C.; Deschanvres, J.L.; Van Tendeloo, G. Characterization of MO derived nanostructured titania powders 1998 Electron microscopy: vol. 2 UA library record; WoS full record;
Mortet, V.; Zhang, L.; Echert, M.; Soltani, A.; d' Haen, J.; Douheret, O.; Moreau, M.; Osswald, S.; Neyts, E.; Troadec, D.; Wagner, P.; Bogaerts, A.; Van Tendeloo, G.; Haenen, K. Characterization of nano-crystalline diamond films grown under continuous DC bias during plasma enhanced chemical vapor deposition 2009 Materials Research Society symposium proceedings UA library record doi
Tirumalasetty, G.K.; van Huis, M.A.; Fang, C.M.; Xu, Q.; Tichelaar, F.D.; Hanlon, D.N.; Sietsma, J.; Zandbergen, H.W. Characterization of NbC and (Nb, Ti)N nanoprecipitates in TRIP assisted multiphase steels 2011 Acta materialia 59 58 UA library record; WoS full record; WoS citing articles pdf doi
Verleysen, E.; Bender, H.; Richard, O.; Schryvers, D.; Vandervorst, W. Characterization of nickel silicides using EELS-based methods 2010 Journal of microscopy 240 11 UA library record; WoS full record; WoS citing articles doi
de Gryse, O.; Clauws, P.; Vanhellemont, J.; Lebedev, O.I.; van Landuyt, J.; Simoen, E.; Claeys, C. Characterization of oxide precipitates in heavily B-doped silicon by infrared spectroscopy 2004 Journal of the electrochemical society 151 13 UA library record; WoS full record; WoS citing articles pdf doi
Colomer, J.-F.; Benoit, J.-M.; Stephan, C.; Lefrant, S.; Van Tendeloo, G.; Nagy, J.B. Characterization of single-wall carbon nanotubes produced by CCVD method 2001 Chemical physics letters 345 45 UA library record; WoS full record; WoS citing articles doi
Leroux, F. Characterization of soft-hard matter composite materials by advanced transmission electron microscopy 2012 UA library record
van Landuyt, J.; Van Tendeloo, G. Charcaterization by high-resolution transmission electron microscopy 1998 UA library record; WoS full record;
Hervieu, M.; Martin, C.; Van Tendeloo, G.; Mercey, B.; Maignan, A.; Jirak, Z.; Raveau, B. Charge ordering and phase transitions in perovskite manganites: correlation with CMR properties 2000 UA library record
Hervieu, M.; Martin, C.; Maignan, A.; Van Tendeloo, G.; Raveau, B. Charge ordering-disordering in Th-doped CaMnO3 1999 European physical journal : B : condensed matter and complex systems 10 6 UA library record; WoS full record; WoS citing articles pdf doi
Hens, S.; van Landuyt, J.; Bender, H.; Boullart, W.; Vanhaelemeersch, S. Chemical and structural analysis of etching residue layers in semiconductor devices with energy filtering transmission electron microscopy 2001 Materials science in semiconductor processing 4 UA library record; WoS full record pdf doi
De Gryse, O.; Clauws, P.; Vanhellemont, J.; Lebedev, O.; van Landuyt, J.; Simoen, E.; Claeys, C. Chemical and structural characterization of oxide precipitates in heavily boron doped silicon by infrared spectroscopy and transmission electron microscopy 2002 UA library record; WoS full record;
de Gryse, O.; Clauws, P.; Lebedev, O.; van Landuyt, J.; Vanhellemont, J.; Claeys, C.; Simoen, E. Chemical and structural characterization of oxygen precipitates in silicon by infrared spectroscopy and TEM 2001 Physica: B : condensed matter T2 – 21st International Conference on Defects in Semiconductors, JUL 16-20, 2001, GIESSEN, GERMANY 308 3 UA library record; WoS full record; WoS citing articles pdf doi
Borgatti, F.; Park, C.; Herpers, A.; Offi, F.; Egoavil, R.; Yamashita, Y.; Yang, A.; Kobata, M.; Kobayashi, K.; Verbeeck, J.; Panaccione, G.; Dittmann, R.; Chemical insight into electroforming of resistive switching manganite heterostructures 2013 Nanoscale 5 40 UA library record; WoS full record; WoS citing articles pdf doi
Obradors, X.; Puig, T.; Pomar, A.; Sandiumenge, F.; Piñol, S.; Mestres, N.; Castaño, O.; Coll, M.; Cavallaro, A.; Palau, A.; Gázquez, J.; González, J.C.; Gutiérrez, J.; Romá, N.; Ricart, S.; Moretó, J.M.; Rossell, M.D.; Van Tendeloo, G. Chemical solution deposition: a path towards low cost coated conductors 2004 Superconductor science and technology 17 107 UA library record; WoS full record; WoS citing articles pdf doi
Vernochet, C.; Vannier, R.-N.; Huvé, M.; Pirovano, C.; Nowogrocki, G.; Mairesse, G.; Van Tendeloo, G. Chemical, structural and electrical characterizations in the BIZNVOX family 2000 Journal of materials chemistry 10 13 UA library record; WoS full record; WoS citing articles pdf doi
Stambula, S.; Gauquelin, N.; Bugnet, M.; Gorantla, S.; Turner, S.; Sun, S.; Liu, J.; Zhang, G.; Sun, X.; Botton, G.A. Chemical structure of nitrogen-doped graphene with single platinum atoms and atomic clusters as a platform for the PEMFC electrode 2014 The journal of physical chemistry: C : nanomaterials and interfaces 118 57 UA library record; WoS full record; WoS citing articles pdf doi
Tikhomirov, A.S.; Sorokina, N.E.; Shornikova, O.N.; Morozov, V.A.; Van Tendeloo, G.; Avdeev, V.V. The chemical vapor infiltration of exfoliated graphite to produce carbon/carbon composites 2011 Carbon 49 7 UA library record; WoS full record; WoS citing articles pdf doi
Abakumov, A.M.; Hadermann, J.; Van Tendeloo, G.; Antipov, E.V. Chemistry and structure of anion-deficient perovskites with translational interfaces 2008 Journal of the American Ceramic Society 91 39 UA library record; WoS full record; WoS citing articles pdf doi
Li, Y.; Yang, X.-Y.; Tian, G.; Vantomme, A.; Yu, J.; Van Tendeloo, G.; Su, B.-L. Chemistry of trimethyl aluminum: a spontaneous route to thermally stable 3D crystalline macroporous alumina foams with a hierarchy of pore sizes 2010 Chemistry of materials 22 38 UA library record; WoS full record; WoS citing articles doi
Bernaerts, D.; op de Beeck, M.; Amelinckx, S.; van Landuyt, J.; Van Tendeloo, G. The chirality of carbon nanotubules determined by dark-field electron microscopy 1996 Philosophical magazine: A: physics of condensed matter: defects and mechanical properties 74 20 UA library record; WoS full record; WoS citing articles pdf doi
Liu, Y.; Brelet, Y.; He, Z.; Yu, L.; Mitryukovskiy, S.; Houard, A.; Forestier, B.; Couairon, A.; Mysyrowicz, A. Ciliary white light : optical aspect of ultrashort laser ablation on transparent dielectrics 2013 Physical review letters 110 10 UA library record; WoS full record; WoS citing articles url doi
Schattschneider, P.; Ennen, I.; Stoger-Pollach, M.; Verbeeck, J. Circular dichroism in the electron microscope: progress and applications (invited) 2010 Journal of applied physics 107 28 UA library record; WoS full record; WoS citing articles pdf doi
Godefroo, S.; Hayne, M.; Jivanescu, M.; Stesmans, A.; Zacharias, M.; Lebedev, O.I.; Van Tendeloo, G.; Moshchalkov, V.V. Classification and control of the origin of photoluminescence from Si nanocrystals 2008 Nature nanotechnology 3 426 UA library record; WoS full record; WoS citing articles pdf doi
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