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Record | |||||
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Author | Van Tendeloo, G. | ||||
Title | TEM characterization of structural defects | Type | H1 Book chapter | ||
Year | 1996 | Publication | Abbreviated Journal | ||
Volume | Issue | Pages | 473-507 | ||
Keywords | H1 Book chapter; Electron microscopy for materials research (EMAT) | ||||
Abstract | |||||
Address | |||||
Corporate Author | Thesis | ||||
Publisher | Plenum Press | Place of Publication | New York | Editor | |
Language | Wos | A1996BF84E00042 | Publication Date | 0000-00-00 | |
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | ISBN | Additional Links | UA library record; WoS full record; | ||
Impact Factor | Times cited | Open Access | |||
Notes | Approved | no | |||
Call Number | UA @ lucian @ c:irua:16865 | Serial | 3477 | ||
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