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Title
Year
Publication
Volume
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Wang, Y.
;
Yuan, Y.
;
Liao, X.
;
Van Tendeloo, G.
;
Zhao, Y.
;
Sun, C.
Chip-based in situ TEM investigation of structural thermal instability in aged layered cathode
2023
Nanoscale Advances
5
UA library record
;
WoS full record