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Author |
Wang, Y.; Yuan, Y.; Liao, X.; Van Tendeloo, G.; Zhao, Y.; Sun, C. |
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Title |
Chip-based in situ TEM investigation of structural thermal instability in aged layered cathode |
Type |
A1 Journal article |
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Year  |
2023 |
Publication |
Nanoscale Advances |
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Volume |
5 |
Issue |
16 |
Pages |
4182-4190 |
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Keywords |
A1 Journal article; Engineering sciences. Technology; Electron microscopy for materials research (EMAT) |
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Abstract |
Thermally induced oxygen release is an intrinsic structural instability in layered cathodes, which causes thermal runaway issues and becomes increasingly critical with the continuous improvement in energy density. Furthermore, thermal runaway events always occur in electrochemically aged cathodes, where the coupling of the thermal and electrochemical effect remains elusive. Herein, we report the anomalous segregation of cobalt metal in an aged LiCoO2 cathode, which is attributed to the local exposure of the high-energy (100) surface of LiCoO2 and weak interface Co-O dangling bonds significantly promoting the diffusion of Co. The presence of the LCO-Co interface severely aggregated the oxygen release in the form of dramatic Co growth. A unique particle-to-particle oxygen release pathway was also found, starting from the isolated high reduction areas induced by the cycling heterogeneity. This study provides atomistic insight into the robust coupling between the intrinsic structural instability and electrochemical cycling. |
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Wos |
001030149900001 |
Publication Date |
2023-07-14 |
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Edition |
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ISSN |
2516-0230 |
ISBN |
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Additional Links |
UA library record; WoS full record |
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Impact Factor |
4.7 |
Times cited |
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Open Access |
OpenAccess |
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Notes |
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Approved |
Most recent IF: 4.7; 2023 IF: NA |
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Call Number |
UA @ admin @ c:irua:198281 |
Serial |
8841 |
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| Permanent link to this record |
