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Author | Suvorov, A.V.; Lebedev, O.I.; Suvorova, A.A.; van Landuyt, J.; Usov, I.O. | ||||
Title | Defect characterization in high temperature implanted 6H-SiC using TEM | Type | A1 Journal article | ||
Year | 1997 | Publication | Nuclear instruments and methods in physics research: B | Abbreviated Journal | Nucl Instrum Meth B |
Volume | 127/128 | Issue | Pages | 347-349 | |
Keywords | A1 Journal article; Electron microscopy for materials research (EMAT) | ||||
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Corporate Author | Thesis | ||||
Publisher | Place of Publication | Editor | |||
Language | Wos | A1997XG60500078 | Publication Date | 2002-07-25 | |
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | 0168-583X; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
Impact Factor | 1.109 | Times cited | 17 | Open Access | |
Notes | Approved | Most recent IF: 1.109; 1997 IF: 1.016 | |||
Call Number | UA @ lucian @ c:irua:21411 | Serial | 613 | ||
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