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Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Links |
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Janssens, K.; Vekemans, B.; Adams, F.; van Espen, P.; Mutsaers, P. |
Accurate evaluation of \mu-PIXE and \mu-XRF spectral data through iterative least squares fitting |
1996 |
Nuclear instruments and methods in physics research: B: beam interactions with materials and atoms
T2 – 7th International Conference on Particle Induced X-ray Emission and Its Analytical Applications, MAY 26-30, 1995, Abano Terme, Italy |
109 |
|
UA library record; WoS full record; WoS citing articles |
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Cabal Rodríguez, A.E.; Leyva Pernia, D.; Schalm, O.; van Espen, P.J.M. |
Possibilities of energy-resolved X-ray radiography for the investigation of paintings |
2012 |
Analytical and bioanalytical chemistry |
402 |
|
UA library record; WoS full record; WoS citing articles |
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Piñera, I.; Cruz, C.M.; van Espen, P.; Abreu, Y.; Leyva, A. |
Study of dpa distributions in electron irradiated YBCO slabs through MCCM algorithm |
2012 |
Nuclear instruments and methods in physics research: B: beam interactions with materials and atoms |
274 |
|
UA library record; WoS full record; WoS citing articles |
|
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Abreu, Y.; Cruz, C.M.; van Espen, P.; Pérez, C.; Piñera, I.; Leyva, A.; Cabal, A.E. |
Electric field gradient calculations in ZnO samples implanted with 111In(111Cd) |
2012 |
Solid state communications |
152 |
|
UA library record; WoS full record; WoS citing articles |
|
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Gijbels, R.; van Grieken, R.; Blommaert, W.; Van 't dack, L.; van Espen, P.; Nullens, H.; Saelens, R. |
Application of analytical methods for trace elements in geothermal waters : part 2 : Plombières, Bains-les-Bains, Bourbonne (Vosges) |
1983 |
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UA library record |
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Oleshko, V.; Kindratenko, V.; Gijbels, R.; van Espen, P.; Jacob, W. |
Study of quasi-fractal many-particle-systems and percolation networks by zero-loss spectroscopic imaging, electron energy-loss spectroscopy and digital image analysis |
1996 |
Mikrochimica acta: supplementum |
13 |
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UA library record; WoS full record; |
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Verlinden, G.; Janssens, G.; Gijbels, R.; van Espen, P.; Geuens, I. |
Three-dimensional chemical characterization of complex silver halide microcrystals by scanning ion microprobe mass analysis |
1997 |
Analytical chemistry |
69 |
6 |
UA library record; WoS full record; WoS citing articles |
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Gregory, C.L.; Nullens, H.A.; Gijbels, R.H.; van Espen, P.J.; Geuens, I.; de Keyzer, R. |
Automated particle analysis of populations of silver halide microcrystals by electron probe microanalysis under cryogenic conditions |
1998 |
Analytical chemistry |
70 |
12 |
UA library record; WoS full record; WoS citing articles |
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Janssens, G.; Geuens, I.; de Keyzer, R.; van Espen, P.; Gijbels, R.; Hubin, A.; Terryn, H.; Vereecken, J. |
Quantitative surface analysis of silver halide microcrystals using scanning ion microprobe and scanning Auger microprobe |
1996 |
|
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UA library record |
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van Vaeck, L.; van Espen, P.; Gijbels, R.; Baykut, G.; Laukien, F.H. |
A new electrostatic transfer line for improved transmission in Fourier transform laser microprobe mass spectrometry with external ion source |
2000 |
European mass spectrometry |
6 |
10 |
UA library record; WoS full record; WoS citing articles |
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Geuens, I.; Nys, B.; Naudts, J.; Gijbels, R.; Jacob, W.; van Espen, P. |
The primary energy dependence of backscattered electron images up to 100 keV |
1991 |
Scanning microscopy |
5 |
3 |
UA library record; WoS full record; WoS citing articles |
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