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  Author Title Year Publication Volume Times cited Additional Links Links
Schryvers, D.; Van Landuyt, J. Electron microscopy study of twin sequences and branching in NissAl34 3R martensite 1992 ICOMAT pdf
van Landuyt, J.; Van Tendeloo, G.; Amelinckx, S.; Zhang, X.F.; Zhang, X.B.; Luyten, W. Crystallography of fullerites and related graphene textures 1994 Materials science forum 150/151 UA library record; WoS full record;
Ivanov, V.; Nagy, J.B.; Lambin, P.; Lucas, A.; Zhang, X.B.; Zhang, X.F.; Bernaerts, D.; Van Tendeloo, G.; Amelinckx, S.; van Landuyt, J. The study of carbon nanotubes produced by catalytic method 1994 Chemical physics letters 223 405 UA library record; WoS full record; WoS citing articles
Teodorescu, V.S.; Mihailescu, I.N.; Dinescu, M.; Chitica, N.; Nistor, L.C.; van Landuyt, J.; Barborica, A. Laser induced phase transition in iron thin films 1994 Journal de physique: 3: applied physics, materials science, fluids, plasma and instrumentation 4 2 UA library record; WoS full record; WoS citing articles doi
Zhang, X.B.; Zhang, X.F.; Bernaerts, D.; Van Tendeloo, G.; Amelinckx, S.; van Landuyt, J.; Ivanov, V.; Nagy, J.B.; Lambin, P.; Lucas, A.A. The texture of catalytically grown coil-shaped carbon nanotubes 1994 Europhysics letters 27 168 UA library record; WoS full record; WoS citing articles doi
Zhang, X.B.; Zhang, X.F.; Amelinckx, S.; Van Tendeloo, G.; van Landuyt, J. The reciprocal space of carbon tubes: a detailed interpretation of the electron diffraction effects 1994 Ultramicroscopy 54 59 UA library record; WoS full record; WoS citing articles doi
Zhang, X.F.; Zhang, X.B.; Bernaerts, D.; Van Tendeloo, G.; Amelinckx, S.; van Landuyt, J.; Werner, H. A simple preparation method for air-sensitive specimens for transmission electron microscopy demonstrated by Rb6C60 1994 Ultramicroscopy 55 2 UA library record; WoS full record; WoS citing articles pdf doi
van Landuyt, J.; Vanhellemont, J. High-resolution electron microscopy for semiconducting materials science 1994 UA library record
Van Tendeloo, G.; van Landuyt, J.; Amelinckx, S. Electron microscopy of fullerenes and fullerene related structures 1994 UA library record
Schryvers, D.; Van Tendeloo, G.; van Landuyt, J.; Tanner, L.E. HREM imaging analysis in the study of pretransition and nucleation phenomena in alloys 1994 Icem 13 UA library record
De Meulenaere, P.; Van Tendeloo, G.; van Landuyt, J. Direct observation of clusters in some FCC alloys by HREM 1994 Icem 13 UA library record; WoS full record;
Bernaerts, D.; Zhang, X.B.; Zhang, X.F.; Van Tendeloo, G.; van Landuyt, J.; Amelinckx, S. HREM study of Rb6C60 and helical carbon nanotubules 1994 Icem 13 UA library record
Goessens, C.; Schryvers, D.; van Dyck, D.; van Landuyt, J.; de Keyzer, R. Electron diffraction evidence for ordering of interstitial silver ions in silver bromide microcrystals 1994 Icem 13 UA library record; WoS full record;
Nistor, L.C.; van Landuyt, J.; Ralchenko, V.G.; Kononenko, T.V.; Obraztsova, E.D.; Strelnitsky, V.E. Formation of diamond nanocrystals in laser-irradiated amorphous carbon films 1994 International Conference on the New Diamond Science and Technology 4 UA library record
Teodorescu, V.; Nistor, L.; Bender, H.; Steegen, A.; Lauwers, A.; Maex, K.; van Landuyt, J. In situ transmission electron microscopy study of Ni silicide phases formed on (001) Si active lines 2001 Journal of applied physics 90 97 UA library record; WoS full record; WoS citing articles pdf doi
Nistor, L.; Buschmann, V.; Ralchenko, V.; Dinca, G.; Vlasov, I.; van Landuyt, J.; Fuess, H. Microstructural characterization of diamond films deposited on c-BN crystals 2000 Diamond and related materials T2 – 10th European Conference on Diamond, Diamond-Like Materials, Nitrides, and Silicon Carbide (Diamond 1999), SEP 12-17, 1999, PRAGUE, CZECH REPUBLIC 9 9 UA library record; WoS full record; WoS citing articles pdf doi
Fedina, L.; Gutakovskii, A.; Aseev, A.; van Landuyt, J.; Vanhellemont, J. Clustering of vacancies on {113} planes in Si layers close to Si-Si3N4 interfaces and further aggregation of self-interstitials inside vacancy clusters during electron irradiation 1999 Institute of physics conference series T2 – Conference on Microscopy of Semiconducting Materials, MAR 22-25, 1999, UNIV OXFORD, OXFORD, ENGLAND UA library record; WoS full record;
Krekels, T.; Milat, O.; Van Tendeloo, G.; van Landuyt, J.; Amelinckx, S.; Slater, P.R.; Greaves, C. SO4-chain formation and ordering in [YSrCa]Sr2Cu2.78(SO4)0.22O7-\delta 1993 Physica: C : superconductivity 210 18 UA library record; WoS full record; WoS citing articles pdf doi
Lioutas, C.B.; Manolikas, C.; Van Tendeloo, G.; van Landuyt, J. A 2a2a3c superstructure in hexagonal Ni1-xS : a study by means of electron-diffraction and HRTEM 1993 Journal of crystal growth 126 4 UA library record; WoS full record; WoS citing articles pdf doi
Fang, P.a.; Gu, H.; Wang, P.l.; Van Landuyt, J.; Vleugels, J.; Van der Biest, O.; Effect of powder coating on stabilizer distribution in CeO2-stabilized ZrO2 ceramics 2005 Journal of the American Ceramic Society 88 11 UA library record; WoS full record; WoS citing articles doi
Cassiers, K.; van der Voort, P.; Linssen, T.; Vansant, E.F.; Lebedev, O.; van Landuyt, J. A counterion-catalyzed (S0H+)(X-I+) pathway toward heat- and steam-stable mesostructured silica assembled from amines in acidic conditions 2003 The journal of physical chemistry : B : condensed matter, materials, surfaces, interfaces and biophysical 107 9 UA library record; WoS full record; WoS citing articles doi
Simoen, E.; Loo, R.; Claeys, C.; de Gryse, O.; Clauws, P.; van Landuyt, J.; Lebedev, O. Optical spectroscopy of oxygen precipitates in heavily doped p-type silicon 2002 Journal of physics : condensed matter T2 – Conference on Extended Defects in Semiconductors (EDS 2002), JUN 01-06, 2002, BOLOGNA, ITALY 14 3 UA library record; WoS full record; WoS citing articles pdf url doi
Nistor, L.C.; Nistor, S.V.; Dinca, G.; Georgeoni, P.; van Landuyt, J.; Manfredotti, C.; Vittone, E. Microstructure and spectroscopy studies on cubic boron nitride synthesized under high-pressure conditions 2002 Journal of physics : condensed matter 14 7 UA library record; WoS full record; WoS citing articles pdf url doi
Gryse, O.D.; Clauws, P.; van Landuyt, J.; Lebedev, O.; Claeys, C.; Simoen, E.; Vanhellemont, J. Oxide phase determination in silicon using infrared spectroscopy and transmission electron microscopy techniques 2002 Journal of applied physics 91 27 UA library record; WoS full record; WoS citing articles pdf doi
de Gryse, O.; Clauws, P.; Lebedev, O.; van Landuyt, J.; Vanhellemont, J.; Claeys, C.; Simoen, E. Chemical and structural characterization of oxygen precipitates in silicon by infrared spectroscopy and TEM 2001 Physica: B : condensed matter T2 – 21st International Conference on Defects in Semiconductors, JUL 16-20, 2001, GIESSEN, GERMANY 308 3 UA library record; WoS full record; WoS citing articles pdf doi
Stuer, C.; van Landuyt, J.; Bender, H.; de Wolf, I.; Rooyackers, R.; Badenes, G. Investigation by convergent beam electron diffraction of the stress around shallow trench isolation structures 2001 Journal of the electrochemical society 148 13 UA library record; WoS full record; WoS citing articles pdf doi
Nistor, L.; Teodorescu, V.; Ghica, C.; van Landuyt, J.; Dinca, G.; Georgeoni, P. The influence of the h-BN morphology and structure on the c-BN growth 2001 Diamond and related materials T2 – 11th European Conference on Diamond, Diamond-like Materials, Carbon, Nanotubes, Nitrides and Silicon Carbide (Diamond 2000), SEP 03-08, 2000, OPORTO, PORTUGAL 10 17 UA library record; WoS full record; WoS citing articles pdf doi
Hens, S.; Bender, H.; Donaton, R.A.; Maex, K.; Vanhaelemeersch, S.; van Landuyt, J. EFTEM study of plasma etched low-k Si-O-C dielectrics 2001 Institute of physics conference series T2 – Royal-Microscopical-Society Conference on Microscopy of Semiconducting, Materials, MAR 25-29, 2001, UNIV OXFORD, OXFORD, ENGLAND UA library record; WoS full record;
Nistor, L.; Bender, H.; Vantomme, A.; Wu, M.F.; van Landuyt, J.; O'Donnell, K.P.; Martin, R.; Jacobs, K.; Moerman, I. Direct evidence of spontaneous quantum dot formation in a thick InGaN epilayer 2000 Applied physics letters 77 44 UA library record; WoS full record; WoS citing articles pdf doi
Fedina, L.; Lebedev, O.I.; Van Tendeloo, G.; van Landuyt, J.; Mironov, O.A.; Parker, E.H.C. In situ HREM irradiation study of point-defect clustering in MBE-grown strained Si1-xGex/(001)Si structures 2000 Physical review : B : condensed matter and materials physics 61 27 UA library record; WoS full record; WoS citing articles url doi
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