Janssens, K.; Vittiglio, G.; Deraedt, I.; Aerts, A.; Vekemans, B.; Vincze, L.; Wei, F.; de Ryck, I.; Schalm, O.; Adams, F.; Rindby, A.; Knöchel, A.; Simionovici, A.S.; Snigirev, A. |
Use of microscopic XRF for non-destructive analysis in art an archaeometry |
2000 |
X-ray spectrometry |
29 |
|
UA library record; WoS full record; WoS citing articles |